Claims
- 1. The method of calibrating the light output of a multi-lamp lightfastness testing chamber defining a sample testing area in said chamber, which comprises:
- sequentially turning on and off each lamp by itself, while
- measuring from said sample testing area the irradiation provided by each lamp, while
- adjusting the intensity of irradiation for each lamp to a desired level, and thereafter
- sensing with individual lamp sensor means spaced from the sample testing area the light intensity of each individual lamp, and adjusting power to each lamp so that the sensed light intensity of each lamp is maintained within predetermined limits corresponding to the irradiation level measured from said sample testing area.
- 2. The method of claim 1 in which one senses with individual sensor means the light intensity of each individual lamp from a side of each lamp that is substantially opposed to portions of each lamp that directly irradiate said sample testing area.
Parent Case Info
This is a division of application Ser. No. 609,723, filed Nov. 6, 1990, now U.S. Pat. No. 5,135,886.
US Referenced Citations (11)
Foreign Referenced Citations (4)
Number |
Date |
Country |
24840 |
Feb 1983 |
JPX |
2480037 |
Oct 1989 |
JPX |
231541 |
Sep 1990 |
JPX |
2193329 |
Feb 1988 |
GBX |
Non-Patent Literature Citations (1)
Entry |
Brochure entitled SunSystem by Atlas Electric Devices Company of Chicago, Ill.; 4 pages; copyright Feb. 1988. |
Divisions (1)
|
Number |
Date |
Country |
Parent |
609723 |
Nov 1990 |
|