Number | Date | Country | Kind |
---|---|---|---|
63-328253 | Dec 1988 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4680635 | Knurana | Jul 1987 | |
4755874 | Esrig et al. | Jul 1988 |
Entry |
---|
N. Khurane, et al., Analysis of Product Hot Electron Problems by Gated Emission Microscopy, IEEE/IRPS 189 (1986). |
Takada et al., "An Empirical Model for Device Degradation due to Hot Courier Injection", IEEE Electron Device Letters, vol. EDL/4, No. 4, pp. 111-113, Apr. 1983. |
Toriumi et al., "A Study of Photon Emission from N-channel MOSFET's", IEEE, Trans. on Electron Devices, vol. ED-34, No. 7, Jul. 1987. |