This application is a continuation of application Ser. No. 07/677,028, filed Mar. 28, 1991, now abandoned.
Number | Name | Date | Kind |
---|---|---|---|
4117507 | Pacer | Sep 1978 | |
4282555 | Svedberg | Aug 1981 | |
4302875 | Satou et al. | Dec 1981 | |
4400711 | Avery | Aug 1983 | |
4484244 | Avery | Nov 1984 | |
4500845 | Ehni | Feb 1985 | |
4605872 | Rung | Aug 1986 | |
4626882 | Cottrell et al. | Dec 1986 | |
4630162 | Bell et al. | Dec 1986 | |
4692781 | Rountree et al. | Sep 1987 | |
4760433 | Young et al. | Jul 1988 | |
4808861 | Ehni | Feb 1989 | |
4821096 | Maloney | Apr 1989 | |
4855620 | Duvvury et al. | Aug 1989 | |
4896243 | Chatterjee et al. | Jan 1990 | |
4922371 | Gray et al. | May 1990 | |
4928023 | Marshall | May 1990 | |
4937639 | Yao et al. | Jun 1990 | |
4939616 | Rountree | Jul 1990 | |
5008724 | Shirai et al. | Apr 1991 | |
5012317 | Rountre | Apr 1991 | |
5019888 | Scott et al. | May 1991 | |
5036215 | Masleid et al. | Jul 1991 | |
5060037 | Rountre | Oct 1991 | |
5072273 | Avery | Dec 1991 | |
5077591 | Chen et al. | Dec 1991 |
Number | Date | Country |
---|---|---|
0273722 | Nov 1989 | DEX |
Entry |
---|
W. Pribyl et al., "CMOS Output Buffers for Megabit DRAM's", IEEE Journal of Solid-State Circuits, Vol. 23, No. 3, Jun. 1988. |
EOS/ESD Association, "Electrical Overstress/Electrostatic Discharge Symposium Proceedings", Oct. 1984, pp. 201-209. |
W. Reczck, J. Winneri, F. Bonner, B. Murphy, "Latch-up Free CMOS Using Burried Polysilicon Diodes", ESSDERC, Sep. 1989, pp. 679-682. |
W. Reczck, F. Bonner, B. Murphy, "Reliability of Latch-up Characterization Procedures", Proc. IEEE 1990 Int. Conference on Microelectronic Test Structures, Vol. 3, Mar. 1990. |
R. Rountree, et al., "A Process-Tolerant Input Protection Circuit for Advanced CMOS Processes", 1988 EOS/ESD Symposium. |
Number | Date | Country | |
---|---|---|---|
Parent | 677028 | Mar 1991 |