Number | Name | Date | Kind |
---|---|---|---|
4468313 | Okumura et al. | Aug 1984 | |
4610774 | Sakata et al. | Sep 1986 | |
4752335 | Korb | Jun 1988 | |
4820397 | Fielder et al. | Apr 1989 | |
4826584 | dos Santos Pereiro Ribeiro | May 1989 | |
4838935 | Dunlop et al | Jun 1989 | |
4889772 | Bergmann et al. | Dec 1989 | |
4961831 | Bergmann et al. | Oct 1990 | |
4961832 | Shagun et al. | Oct 1990 | |
4963239 | Shimamura et al. | Oct 1990 | |
4963240 | Fukasawa et al. | Oct 1990 | |
4964962 | Nobutani et al. | Oct 1990 | |
4964968 | Arita | Oct 1990 | |
4964969 | Kasakabe et al. | Oct 1990 | |
4966676 | Fukasawa et al. | Oct 1990 | |
4966677 | Aichert et al. | Oct 1990 | |
4971674 | Hata | Nov 1990 | |
5066381 | Ohta et al. | Nov 1991 | |
5230459 | Mueller et al. | Jul 1993 | |
5397050 | Mueller | Mar 1995 | |
5595337 | Demaray et al. | Jan 1997 |
Number | Date | Country |
---|---|---|
63-270459 | Nov 1988 | JPX |
1-104484 | Apr 1989 | JPX |
1-283367 | Nov 1989 | JPX |
1-301855 | Dec 1989 | JPX |
2-8364 | Jan 1990 | JPX |
1523284 | Nov 1898 | SUX |
Entry |
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Dunlop et al., "Effects of Ti-W Target Processing Methods on Defect Generation During VLSI Device Fabrication," American Vacuum Society 37th Annual Symposium and Topical Conferences, Toronto, Canada, Oct. 8-12, 1990. |