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| 4966676 | Fukasawa et al. | Oct 1990 | |
| 4966677 | Aichert et al. | Oct 1990 | |
| 4971674 | Hata | Nov 1990 | |
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| 5397050 | Mueller | Mar 1995 | |
| 5595337 | Demaray et al. | Jan 1997 |
| Number | Date | Country |
|---|---|---|
| 63-270459 | Nov 1988 | JPX |
| 1-104484 | Apr 1989 | JPX |
| 1-283367 | Nov 1989 | JPX |
| 1-301855 | Dec 1989 | JPX |
| 2-8364 | Jan 1990 | JPX |
| 1523284 | Nov 1898 | SUX |
| Entry |
|---|
| Dunlop et al., "Effects of Ti-W Target Processing Methods on Defect Generation During VLSI Device Fabrication," American Vacuum Society 37th Annual Symposium and Topical Conferences, Toronto, Canada, Oct. 8-12, 1990. |