Claims
- 1. A method of making a signal charge transfer device on a substrate of a first conductivity type, comprising the steps of:
- forming a well of a second conductivity type opposite to the first conductivity type on the substrate;
- forming a channel region of the first conductivity type in the well;
- forming a first insulating layer on the well;
- forming a plurality of first electrodes on the first insulating layer;
- forming a second insulating layer on each of the plurality of first electrodes;
- forming a plurality of stepped impurity regions of the first conductivity type in the channel region, each of the plurality of stepped impurity regions being disposed between adjacent ones of the plurality of first electrodes and the each of the plurality of stepped impurity regions having an impurity concentration lower than an impurity concentration of the channel region; and
- forming a plurality of second electrodes on the first insulating layer, each of the plurality of second electrodes being disposed between adjacent ones of the first electrodes above a respective one of the plurality of stepped impurity regions.
- 2. The method of claim 1, wherein the step of forming the plurality of stepped impurity regions includes the steps of:
- vertically implanting impurity ions of the second conductivity type into the channel region using the plurality of first electrodes as a first mask; and
- slantly implanting the impurity ions of the second conductivity type into the channel region using the first electrodes as second mask.
- 3. The method of claim 1, wherein the first conductivity type is n-type and the second conductivity type is p- type.
- 4. The method of claim 3, wherein the impurity ions are boron ions.
- 5. The method of claim 2, wherein the impurity ions are slantly implanted at an angle of 30.degree.-60.degree. with respect to a surface of the substrate.
- 6. The method of claim 2, wherein the step of slantly implanting the impurity ions is carried out repeatedly and wherein an angle of implantation with respect to a surface of the substrate is decreased.
- 7. The method of claim 1, wherein the each of the plurality of stepped impurity regions is a two-stepped impurity region.
- 8. The method of claim 1, wherein the each of the plurality of stepped impurity regions is multi-stepped impurity region.
- 9. The method of claim wherein the first and second insulating films electrically isolate the plurality of first and second electrodes from each other.
- 10. The method of claim 1, wherein the plurality of first and second electrodes are formed using a chemical vapor deposition technique.
Priority Claims (1)
Number |
Date |
Country |
Kind |
23862/1991 |
Dec 1991 |
KRX |
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Parent Case Info
This application is a continuation, of application Ser. No. 08/218,411, filed Mar. 25, 1994, now abandoned, which is a divisional of application 07/995,981 filed on Dec. 23, 1992, now abandoned.
US Referenced Citations (11)
Foreign Referenced Citations (6)
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0192142A |
Aug 1986 |
EPX |
55-82631 |
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JPX |
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Divisions (1)
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Number |
Date |
Country |
Parent |
995981 |
Dec 1992 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
218411 |
Mar 1994 |
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