Number | Date | Country |
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188943 | Aug 1986 | JPX |
Entry |
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M, Kuhn and D. J. Silversmith, "Ionic Contamination and Transport of Mobile Ions in MOS Structures", J. Electrochem. Soc.: Solid State Science, vol. 118, No. 6, Jun. 1971. |
N. J. Chou, "Application of Triangular Voltage Sweep Method to Mobile Charge Studies in MOS Structures", J. Electrochem. Soc.: Solid State Science, vol. 118, No. 4, Apr. 1971. |
S. R. Hofstein, IEEE Trans. on Electron Devices, ED-13, 222 (1986). |