As apparent from the basic configuration (1), it is a requisite of the present invention that measured values of a discharge voltage and a discharge current corresponding to each other every common time are grasped based on an input to or an output from a computer with respect to a varying state, in an applied discharge voltage and a discharge current corresponding to the applied discharge voltage, which is obtained in conformity with time as shown in
It becomes clear that as shown in
Each common time is normally set by the computer involved in the input and output as described above. However, after once the measured values of the discharge voltage and the discharge current are input to the computer, outputs of the measured values are displayed in a state in which the correspondence relationship is understood by the computer (for example, a procedure will be adopted in which the outputs of the measured values are displayed in the form of the graph as shown in
Typically embodiments in each of which such a measurement and an input to the computer are performed are as follows.
(A) A method comprising the steps of: interposing an oscilloscope 10 between a discharge pulse inputting circuit 3 and an electrostatic discharge protecting circuit 6 as shown in
(B) A method comprising the steps of: measuring a discharge voltage by using a voltmeter 410 as shown in
Here, in
As shown in
Although the embodiment of the method described in the basic constitution (1) are not intended to be limited to those described in (A) and (B), normally, the relationship between the discharge voltage and the discharge current corresponding to each other is displayed in the form of graphs as shown in
In the graphic display forms as shown in
That is to say, the basic and technical idea of the present invention lies in that the characteristic impedance of the ESD protecting circuit 6 is quickly measured based on calculation of the ratio of the variation of discharge voltage to the variation of discharge current by utilizing the near agreement of the voltage (V) vs. current (I) characteristics at a drop stage with the conductive state in the TLP measurement after the relationship between the discharge voltage and the discharge current which move together every common time for the ESD protecting circuit 6 is grasped based on the input to or the output from the computer.
The above-mentioned basic configuration (2) is common in that it includes the controller 1, the pulse generating circuit 2, and the discharge voltage generating circuit 3, and the discharge voltage is applied to the ESD protecting circuit, similarly to the case of the normal ESD breakdown voltage measurement. However, the above-mentioned basic configuration (2) is different from the ESD breakdown voltage measuring apparatus in that each of the voltage measuring circuit and the current measuring circuit (especially, the circuit constituted by the oscilloscope 10 including the voltmeter 41 and the ammeter 42 as shown in
However, the above-mentioned basic configuration (2) is different from the case of the TLP measurement in that although in the case of the TLP measurement, the TLP voltage and the TLP current are merely individually measured, with the above-mentioned basic configuration (2), the discharge voltage and the discharge current are measured one after another whenever a common time elapses, and the relationship between the discharge voltage and the discharge current is processed all at once based on the input to or the output from the computer to be grasped.
With regard to an embodiment of the above-mentioned basic configuration (2), there are suitably adopted:
a configuration adopting the oscilloscope 10 including the voltmeter 41 and the ammeter 42 as the voltage measuring circuit and the current measuring circuit, respectively, as shown in
a configuration including the voltage measuring circuit, as shown in
Normally, before and after the measurement of the discharge voltage and the discharge current, a leakage voltage is applied to the ESD protecting circuit 6, and it is then tested whether or not a leakage current varies, thereby checking to see if or not the ESD protecting circuit 6 can normally operate.
Consequently, if a variation occurs in the leakage current when the leakage measurement is performed before and after the measurement of the discharge voltage and the discharge current, it is recommended that since the ESD protecting circuit 6 has already been in an abnormal state, the measurement of the discharge voltage and the discharge current is stopped, or an electrostatic breakdown voltage is applied as the discharge voltage to the ESD protecting circuit 6 all at once to measure the breakdown characteristics.
In the case where a switch 7 is provided in the apparatus as shown in
In addition, in the case where as shown in
The present invention will be described hereinafter based on Embodiments.
The feature of Embodiment 1 is that it can judge that at a stage in which the ratio of the variation of discharge voltage to the variation of discharge current becomes unable to be maintained in a nearly constant state to come to fluctuate, the electrostatic discharge protecting circuit comes to the electrostatic breakdown.
That is to say, as shown in
The feature of Embodiment 2 is that in case where, when the discharge input voltage is made to sequentially rise, the discharge voltage and the discharge current corresponding to each other sequentially rise, so that when the discharge current comes to the peak current value, the maximum current with which the state of the electrostatic discharge protecting circuit changes from the conductive state to the electrostatic breakdown state can also be measured with the maximum value of the discharge current at the stage in which the ratio of the variation of discharge voltage changed to the variation of discharge current does not become constant.
That is to say, as shown in
The feature of Embodiment 3 is that it is possible to also measure the value of the discharge voltage at a stage in which both the discharge voltage and the discharge current attenuate, and the discharge current becomes null.
That is to say, as shown in
When a protecting element in the discharge protecting circuit is designed, the voltage value Vh in the TLP measurement corresponds to data to be considered when the minimum withstand voltage characteristics are set. However, essentially, the output impedance in the ESD measurement is different from that in the TLP measurement. Hence, for the design of the protecting element in the ESD protecting circuit, the voltage value Vh does not necessarily become the sufficient data to be considered.
On the other hand, although the voltage value Vh1 measured in Embodiment 3 shows a value slightly smaller than that of the voltage value Vh, it is very useful as showing the minimum withstand voltage characteristic which the protecting element in the ESD protecting circuit should have.
According to the present invention, the characteristic impedance of the ESD protecting circuit can be quickly calculated and measured, and the electrostatic breakdown for the ESD protecting circuit can be determined based on the basic configurations (1) and (2) as the solving means. Moreover, it becomes possible to perceive and measure the maximum current at the stage in which the state changes from the conductive state to the electrostatic breakdown state.
The present invention can be used not only in the measurement of the characteristic impedance of the ESD protecting circuit 6, but also in the electrostatic breakdown test. Thus, applications of the present invention are broad in scope.
Number | Date | Country | Kind |
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2006-182908 | Jul 2006 | JP | national |