HANWA ELECTRONIC IND. CO., LTD.

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Wakayama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integral value measuring circuit
- Patent number 8,829,972
- Issue date Sep 9, 2014
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Grant
Impulse immunity test apparatus
- Patent number 8,410,791
- Issue date Apr 2, 2013
- NEC Corporation
- Tsuneo Tsukagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a transmission line pulse test system
- Patent number 8,339,146
- Issue date Dec 25, 2012
- IMEC
- Philippe Roussel
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristic impedance of electrostatic disch...
- Patent number 7,609,076
- Issue date Oct 27, 2009
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Grant
CDM simulator
- Patent number 5,740,007
- Issue date Apr 14, 1998
- Hanwa Electronic Ind. Co., Ltd.
- Toshiyuki Nakaie
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Integral Value Measuring Circuit
- Publication number 20130009628
- Publication date Jan 10, 2013
- HANWA ELECTRONIC IND. CO., LTD.
- Toshiyuki Nakaie
- G01 - MEASURING TESTING
Information Patent Application
Method for Calibrating a Transmission Line Pulse Test System
- Publication number 20100156447
- Publication date Jun 24, 2010
- IMEC
- Philippe Roussel
- G01 - MEASURING TESTING
Information Patent Application
IMPULSE IMMUNITY TEST APPARATUS
- Publication number 20100090710
- Publication date Apr 15, 2010
- NEC Corporation
- Tsuneo Tsukagoshi
- G01 - MEASURING TESTING
Information Patent Application
Method for Calibrating an Electrostatic Discharge Tester
- Publication number 20090027063
- Publication date Jan 29, 2009
- Interuniversitair Microelektronica Centrum (IMEC)
- Mirko Scholz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTIC IMPEDANCE OF ELECTROSTATIC DISCH...
- Publication number 20080004820
- Publication date Jan 3, 2008
- HANWA ELECTRONIC IND. CO., LTD.
- Toshiyuki NAKAIE
- G01 - MEASURING TESTING

Trademarklast 30 trademarks