The present invention relates to a method for increasing the optical resolution of a stimulated emission depletion microscope, or STED microscope (Stimulated Emission Depletion) based on the modulation of the intensity of a STED beam on an arbitrary time scale during the acquisition of an image and the analysis of the induced dynamics, without increasing the intensity of the STED beam and in a simple and economic manner. Such method is based on the principle that the fluorescence at the centre of an observation volume is not modulated, while the fluorescence at the periphery of said volume is modulated. The exploitation of this difference in the modulation of the fluorescence signal entails an increase in the spatial resolution.
STED microscopy is one of the many different types of super-resolution microscopy techniques which have been recently developed to increase spatial resolution through exceeding the limit of diffraction of conventional light microscopy.
The main application of STED microscopy is directed to the study of sub-cellular architectures and dynamics and takes advantage of the non-linear response of fluorophores commonly used for marking biological samples. One sample is excited with a first radiation beam, the excitation beam, and the fluorescence is measured in a conventional manner. One donut-shaped second radiation beam, the STED beam, de-energizes by stimulated emission the fluorophores in an annular region around the axis of the first beam, allowing receiving the signal only from the central region of the first beam. The mechanism responsible for the increase in resolution is the saturation of the fluorescence reduction by stimulated emission. With STED microscopy high spatial resolutions were reached.
The spatial resolution w of a STED microscope depends on the intensity ISTED of the STED beam according to the equation:
wherein w0 is the spatial resolution of the confocal microscope used in STED microscopy and Isat is a constant representing the intensity value of the STED beam, required to increase the resolution of a factor √2 that depends on the sample. In theory, an unlimited spatial resolution could be obtained by increasing the intensity value ISTED of the STED beam. In most practical cases, the maximum resolution of a STED microscope is limited by the maximum power “tolerated” by the sample due to detrimental photo-damage effects induced by illumination with the STED beam, such as for example phototoxicity and photobleaching. For this reason strategies were developed to increase the spatial resolution without increasing the intensity of the STEAD beam. For example, document WO2015/022635 A1 discloses a method that uses a pulsed excitation beam (in the picoseconds time scale) and a continuous wave, by varying the detection time window. Since the average life of the fluorescent decay after a pulsed excitation is always in the time scale of nanoseconds, such method involves the use of an ultra fast detection electronics in the time scale of nanoseconds. In document L.V. Doronina-Amitonova et al, ‘Ultrahigh-contrast imaging by temporally modulated stimulated emission depletion’, Optics Letters 40, 725-728 (2015), STED light beams are used with a Gaussian time-modulated spatial pattern, whereby the whole fluorescence signal is modulated in order to distinguish it from a background signal, thereby increasing the contrast of fluorescence images, but without increasing the resolution thereof. Also document Chaoyang Fan et al, ‘All-optical fluorescence image recovery using modulated stimulated emission Depletion’, Chemical Science 2, 1080-1085 (2011), uses STED light beams with a Gaussian time-modulated spatial pattern, only modestly increasing the resolution. In the document by Lanzanò et al, “Encoding and decoding spatio-temporal information for super-resolution microscopy”. Nat Commun 6, 6701 (2015), a method of analysis called SPLIT (Separation of photons by Lifetime Tuning) is described, which improves the spatial resolution by recording the temporal decay of the fluorescence signal and using the additional information encoded in the fluorescence decay dynamics. This is obtained by separating one super-resolved component, characterized by a specific temporal footprint. In fact, the key idea on which the SPLIT analysis method is based is that for each pixel the fluorescence intensity decay can be described as the linear superposition of one slow decay component (due to fluorophores in the centre of the actual observation volume) and one fast decay component (due to fluorophores at the periphery of the actual observation volume). By using an algorithm based on Fourier transform of decays, the fraction associated with the slow component can be extracted effectively without using minimization algorithms, with consequent increase in the spatial resolution. Even the SPLIT analysis method requires the use of a pulsed excitation and ultra fast detection electronics, in order to record the fluorescence dynamics in the time scale of nanoseconds.
The object of the present invention is to overcome the disadvantages described heretofore, allowing to increase the optical resolution of a STED microscope in a reliable, simple and economical way, without increasing the intensity of the STED beam and without work in the time scale of nanoseconds.
It is therefore one specific object of the present invention a method for increasing the optical resolution of a microscope STED based on the modulation of an intensity of a STED beam during the acquisition of an image as defined by independent claim 1.
Further embodiments of the method according to the invention are defined in the dependent claims.
The advantages offered by the method according to the invention with respect to the solutions of the prior art are numerous and important.
First of all, the method uses one STED light beam having a donut-shaped spatial pattern (in English doughnut or donut) which has the advantage of acting only on the periphery of the observation volume of the microscope. Thanks to the “donut” shape, since only the signal at the periphery is modulated, the latter can be subtracted from the whole signal and a smaller observation volume can be obtained. In other words, the method advantageously allows increasing the spatial resolution without increasing the intensity of the STED beam, thus avoiding damaging the sample. Moreover, the method of the present invention based on the slow modulation of the intensity of the STED beam and the analysis of the dynamics induced entails a general simplification of procedure and can be integrated into any STED microscope. The fluorescence modulation at the periphery of the observation volume is performed on an arbitrary time scale, whereby it is not necessary to use a pulsed excitation beam. This entails the advantage of being able to use light sources such as for example laser, which are inexpensive compared to those required for a pulsed excitation of other techniques. Another important advantage is that it is not necessary to detect the fluorescence dynamics in the time scale of nanoseconds and therefore a simple and economical electronic detection can be used.
The present invention will be now described, for illustrative but not limiting purposes, according to its preferred embodiments, with particular reference to the Figures of the accompanying drawings, wherein:
In the Figures the same reference numerals will be used for similar elements.
With reference to
wherein dS is an infinitesimal surface element and w is the spatial resolution expressed by Eq. 1, whereby the Eq. 2 can be rewritten as:
with FSTED an image function obtained with STED microscopy. It should be noted that the Eq. 3 and 4 represent the integral of the contributions of all fluorophores to the fluorescence signal. The intensity modulation of the STED beam performed at step 200 also causes the image function of the Eq. 3 to be a function of time:
wherein the subscript “t-STED” indicates an image resolved in time, obtained through modulation of the intensity of the STED beam. The modulation of the image function F is then obtained by the modulation of ISTED(t) for each pixel.
In other words, if in a given pixel (x,y), the intensity ISTED=ISTED(x,y,t) of the STED beam is modulated over time, a modulation M(x,y) of the value of the image function in that pixel, F=F (x,y,t) will result. Modulation M(x,y) of an image is defined as the quantity:
The term m(x,y) contains sub-diffractive information on the distribution of the object ρ(x,y) in the vicinity of the position (x,y). The multiplication factor δ(ISTED(t)/Isat) is a function of the modulation of the intensity of ISTED(t) of the STED beam.
In the first preferred embodiment of the method of
wherein Nt is the total number of points in time wherein the signal Ft-STED(x,y,t) is sampled. The modulation M(x,y) is then calculated in each pixel, as:
M(x,y)=√{square root over ((g(x,y))2+(s(x,y))2)} Eq. 7
By the term M(x,y), one fraction fcenter(x,y) of intensity of the fluorescence signal, corresponding to the contribution to the fluorescence signal coming from the fluorophores at the centre of the observation volume, is calculated. In fact the modulation M(x,y) in a given pixel can be expressed as a combination of the modulation value at the centre of the observation volume Mcenter and the modulation value in the periphery of the observation volume Mperiph, according to the formula: M(x,y)=fcenter(x,y)Mcenter+(1−fcenter(x,y)) Mperiph, wherein Mcenter and Mperiph are two constant having non negative value. From this formula it is obtained:
f
center(x,y)=1−[M(x,y)−Mcenter]/└Mperiph−Mcenter┘, Eq.8
The values of the constants Mcenter, and Mperiph that allow to obtain a significant increase in resolution without the introduction of artefacts in the image, must be determined in the specific embodiment of the method, since they depend on some experimental features such as the modulation amplitude of the of the intensity of the STED beam and the signal to noise ratio of the acquired signals.
In the first preferred embodiment of the method of
M
periph
=M
center+σ2/(2|σ1−σ2|) Eq.9.
wherein σ1 and σ2 are the values of the standard deviation of the bi-dimensional gaussian distribution approximating a bi-dimensional histogram of g(x,y) and s(x,y) values.
In other embodiments, the values of constants Mcenter and Mperiph can be determined by using a known sample of fluorescent beads and evaluating the quality of the images obtained at different values of Mcenter and Mperiph.
By multiplying the fraction fcenter(x,y) for a STED image F′STED(x,y) a final image of higher resolution is obtained:
F
m-STED(x,y)=fcenter(x,y)F′STED(x,y) Eq. 10,
wherein the subscript “m-STED” indicates the STED technique with modulation of the intensity of the STED beam. The STED image F′STED(x,y) used to generate the image FM-STED(x,y) can be chosen between an image averaged in time <FT-STED(x,y,t)> and any image of the temporal series FT-STED(x,y,t).
All the above equations 2 to 9 are valid for slow modulations, i.e. for temporal variations slow with respect to r that is the fluorescence lifetime of the singlet excited state. Since τ is in the range of nanoseconds, it is in theory possible to modulate the STED intensity on any time scale T higher than nanoseconds, T>>1 ns. The speed of the actual modulation is limited by the specific hardware device used to modulate the STED beam. In general, the response of the modulation hardware device represents the lower limit at the time scale that can be used by the method. In fact, a too slow modulation could be disadvantageous in applications wherein a data acquisition high speed is required. In the first preferred embodiment of the method according to the invention, acoustic-optical modulators (AOM, acoustic-optical modulator) commonly employed in confocal microscopes are used, which are much faster than any mechanical device. The response of the AOM is approximately limited to the transit time of the sound wave through the beam, typically <50 ns. In further embodiments, opto-electronic modulators (EOM, Electro-optic modulator) are used, wherein the time limit of the response is equal to tens of nanoseconds.
In the first preferred embodiment, the modulation in step 200 has a temporal pattern corresponding to a linear ramp whereby from a minimum value Imin, optionally equal to zero at time to up to a maximum value Imax at time t1=t0+T, i.e. in a time window T, wherein T is the modulation period. For which the intensity of the STED beam, set for the sake of simplicity also t0=0, is given by:
In the first preferred embodiment of the method, the time window T coincides with the typical time of integration of intensity in a pixel of a confocal or STED microscope (pixel dwell time), whose values are equal to about 10 us up to about 100 μs.
The linear ramp temporal pattern has the advantage of making the analysis of the signal in the time domain more direct. In other embodiments of the present invention the modulation 200 of the STED beam is obtained with different temporal pattern, such as sinusoidal patterns.
Returning to the flow chart of
σI
wherein hSTED(X′,Y′) is a donut-shaped PSF of the STED microscope.
The fluorescence signal f(X′,Y′) from each single fluorophore inside the observation volume is approximated with an exponential decay:
with a time constant of depletion τdep(x′, y′) which depends accordingly on the donut-shape of the PSF, on the saturation value Isat, on the maximum intensity ISTED of the STED beam and the size of the time window T, according to the following equation:
It should be noted that, in this case, (x′,y′) corresponds to the distance from the center of a given pixel (x,y), whereby one more fluorophores can contribute to the fluorescence signal measured in a single pixel F(x,y).
The Equation 14 also shows that a spatial distribution of the depletion decay rate τdep−1(x′,y′) is provided determined by the spatial distribution of hSTED (x′,y′).
Since hSTED (X′, y′) has a donut shape, the signal from the fluorophores located at the periphery of the observation volume (maximum values of hSTED) will decay more quickly while the signal from the center of the observation volume (values close to zero of hSTED) will remain approximately constant, as schematically shown in the graph of
In a second preferred embodiment of the method of
I
STED(t)=I0−ΔISTED sin(ωt) Eq. 11′
where I0 is a value of average intensity and ΔIsted is the intensity of modulation amplitude of the STED beam. The fluorescence signal f(x′,Yy) coming from each single fluorophore inside the observation volume is also modulated according to the equation:
The fluorescence signal f (x′, y′,t) is phase shifted with respect to a signal of the STED beam and will contain the main frequency ω and the higher harmonics due to the non-linearity of the exponential factor. The modulation M of the image can be obtained by analysing the fluorescence signal at a frequency ω or at higher frequencies. This can be done via a suitable hardware setting, wherein an analysis instrument acquires in a step 300′ fluorescence signals from a sample and outputs, in a step 400′, the values of the average intensity <FT-STED (x, y, t)> and modulation Mω (x,y) of the fluorescence signal directly. A suitable hardware setting can be for example a standard lock-in detecting apparatus at frequency ω, wherein a lock-in amplifier directly provides, in addition to the average value of intensity <FT-STED (x, y, t)>, the modulation values Mω (x,y) and phase ϕω (x,y) during an acquisition 300′ of fluorescence signals. Therefore, given an image FT-STED(x,y,t) obtained by modulating the intensity of the STED beam at a frequency ω, the increase of the resolution can be obtained in a step 600′ by using the average intensity <FT-STED (x, y, t)> in pixel (x,y) and the signal modulation Mω (x,y) on the same pixel:
F
m-STED(x,y)=fcenter(x,y)(Ft-STED(x,y,t)) Eq. 10′
where the fraction fcenter is calculated at a step 500′ according to Equation 8:
f
center(x,y)=1−[Mω(x,y)−Mcenter]/└Mperiph−Mcenter┘ Eq.8′
The values of the constants m center and Mperiph can be determined as described above, taking into account that the values of g(x,y) and s(x,y) can be obtained from Mω (x,y) and ϕω (x,y) according to the following formulas:
g(x,y)=Mω(x,y)cos(ϕω(x,y))
s(x,y)=Mω(x,y)sin(ϕω(x,y)) Eq. 14
Similarly to the case of the modulation of the intensity of the STED beam in the time domain, it is in theory possible to modulate the STED intensity on any frequency scale lower to Gigahertz, ω<<2π/1 ns i.e. ω/2π<<1 GHz. The frequency of the actual modulation is limited by the specific hardware device used to modulate the STED beam.
It should be noted that, in contrast to the first preferred embodiment of the method, in the case of the second preferred embodiment of the method step 400 for calculating the modulation M(x,y) of the image to obtain the final image FM-STED(x,y) at higher resolution is not necessary.
In a further embodiment of the method wherein the modulation is sinusoidal with frequency ω, Mcenter=0 is set, for which it is
where K corresponds to a constant having a positive value Mperiph above defined between 0 and 1. Thus the final image that is obtained from Eq. 10′ becomes:
By changing the value of the constant K, it is possible to adjust the increase in resolution,
A sample is illuminated at step 100 with constant excitation intensity and is illuminated at step 200′ with a STED intensity modulated with a sine wave at a frequency ω, shown in
The authors have also performed experimental tests on fluorescent beads analysed with a STED microscopy apparatus integrated with the first preferred embodiment of the method. Some experimental results are reported in
In the foregoing the preferred embodiments were described and some modifications of this invention have been suggested, but it should be understood that those skilled in the art can make modifications and changes without departing from the relative scope of protection, as defined by the appended claims.
Number | Date | Country | Kind |
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102017000118432 | Oct 2017 | IT | national |
Filing Document | Filing Date | Country | Kind |
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PCT/IB2018/058123 | 10/19/2018 | WO | 00 |