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G02B21/0084
time-scale detection
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and methods for fluorescence imaging using radiofrequency...
Patent number
12,158,421
Issue date
Dec 3, 2024
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for fluorescence imaging using radiofrequency...
Patent number
12,158,422
Issue date
Dec 3, 2024
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Grant
Accelerating digital microscopy scans using empty/dirty area detection
Patent number
11,828,927
Issue date
Nov 28, 2023
Scopio Labs Ltd.
Ittai Madar
G02 - OPTICS
Information
Patent Grant
Analyzing and using motility kinematics of microorganisms
Patent number
11,761,023
Issue date
Sep 19, 2023
PhAST Corp.
Kwangmin Son
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
SPIM microscope with a sequential light sheet
Patent number
11,762,182
Issue date
Sep 19, 2023
Leica Microsystems CMS GmbH
Werner Knebel
G01 - MEASURING TESTING
Information
Patent Grant
High-speed laser scanning microscopy platform for high-throughput a...
Patent number
11,714,270
Issue date
Aug 1, 2023
Board of Regents, The University of Texas System
Adela Ben-Yakar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analyzing and using motility kinematics of microorganisms
Patent number
11,708,596
Issue date
Jul 25, 2023
PhAST Corp.
Kwangmin Son
G02 - OPTICS
Information
Patent Grant
Optical sources
Patent number
11,675,245
Issue date
Jun 13, 2023
NKT Photonics A/S
Anatoly Borisovich Grudinin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image processing apparatus, image processing program, and image pro...
Patent number
11,592,656
Issue date
Feb 28, 2023
KRIPTON CO., LTD.
Masahisa Hamada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SPIM microscope with a sequential light sheet
Patent number
11,520,132
Issue date
Dec 6, 2022
Leica Microsystems CMS GmbH
Werner Knebel
G01 - MEASURING TESTING
Information
Patent Grant
Accelerating digital microscopy scans using empty/dirty area detection
Patent number
11,409,095
Issue date
Aug 9, 2022
Scopio Labs Ltd.
Ittai Madar
G02 - OPTICS
Information
Patent Grant
Line-scanning, sample-scanning, multimodal confocal microscope
Patent number
11,391,936
Issue date
Jul 19, 2022
SURGIVANCE INC.
Daniel Summer Gareau
G02 - OPTICS
Information
Patent Grant
Method for deconvolving image data
Patent number
11,386,531
Issue date
Jul 12, 2022
Carl Zeiss Microscopy GmbH
Stanislav Kalinin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and methods for fluorescence imaging using radiofrequency...
Patent number
11,371,937
Issue date
Jun 28, 2022
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Grant
Method of stimulated emission depletion microscopy having high spat...
Patent number
11,372,224
Issue date
Jun 28, 2022
Fondazione Istituto Italiano di Tecnologia
Luca Lanzano'
G01 - MEASURING TESTING
Information
Patent Grant
Ptychography based system and method
Patent number
11,347,045
Issue date
May 31, 2022
TECHNION RESEARCH AND DEVELOPMEN T FOUNDATION LTD.
Oren Cohen
G02 - OPTICS
Information
Patent Grant
Apparatus and methods for fluorescence imaging using radiofrequency...
Patent number
11,327,016
Issue date
May 10, 2022
The Regents of the University of California
Eric D. Diebold
G02 - OPTICS
Information
Patent Grant
Imaging integrated circuits using a single-point single-photon dete...
Patent number
11,287,630
Issue date
Mar 29, 2022
International Business Machines Corporation
Franco Stellari
G01 - MEASURING TESTING
Information
Patent Grant
Method for imaging a sample by means of a microscope and microscope
Patent number
11,215,806
Issue date
Jan 4, 2022
Carl Zeiss Microscopy GmbH
Thorsten Heupel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image reproducing device and observation system for selecting image...
Patent number
11,194,145
Issue date
Dec 7, 2021
Olympus Corporation
Yohei Tanikawa
G02 - OPTICS
Information
Patent Grant
Scanning microscope using pulsed illumination and MSIA
Patent number
11,143,855
Issue date
Oct 12, 2021
HURON TECHNOLOGIES INTERNATIONAL INC.
A. E. Dixon
G02 - OPTICS
Information
Patent Grant
Closed-loop control of a scanner with frequency-space analysis of a...
Patent number
11,036,038
Issue date
Jun 15, 2021
Carl Zeiss Microscopy GmbH
Frank Klemm
G02 - OPTICS
Information
Patent Grant
Fast two-photon imaging by diffracted swept-laser excitation
Patent number
11,009,459
Issue date
May 18, 2021
The Regents of the University of California
Sebastian Karpf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light detecting apparatus and laser-scanning microscope
Patent number
10,983,324
Issue date
Apr 20, 2021
Olympus Corporation
Hiroyuki Yabugaki
G01 - MEASURING TESTING
Information
Patent Grant
Structured illumination microscopy system using digital micromirror...
Patent number
10,976,532
Issue date
Apr 13, 2021
Tomocube, Inc.
YongKeun Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Supercontinuum microscope for resonance and non-resonance enhanced...
Patent number
10,962,751
Issue date
Mar 30, 2021
Robert Alfano
Robert Alfano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SCAPE microscopy with phase modulating element and image reconstruc...
Patent number
10,908,088
Issue date
Feb 2, 2021
The Trustees of Columbia University In the City of New York
Venkatakaushik Voleti
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming a digital value from a clock signal and from a d...
Patent number
10,824,116
Issue date
Nov 3, 2020
Leica Microsystems CMS GmbH
Bernd Widzgowski
G02 - OPTICS
Information
Patent Grant
Method, device and laser scanning microscope for generating rasteri...
Patent number
10,795,140
Issue date
Oct 6, 2020
ABBERIOR INSTRUMENTS GMBH
Andreas Schoenle
G01 - MEASURING TESTING
Information
Patent Grant
Confocal microscope with aperture correlation
Patent number
10,754,136
Issue date
Aug 25, 2020
Carl Zeiss Microscopy GmbH
Nils Langholz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR LOCALIZING OR TRA...
Publication number
20240418974
Publication date
Dec 19, 2024
Abberior Instruments GmbH
Matthias REUSS
G02 - OPTICS
Information
Patent Application
SIMULTANEOUS MULTI-SPECIES SUPER-RESOLUTION IMAGING VIA TEMPORAL MU...
Publication number
20240295498
Publication date
Sep 5, 2024
Fondazione Istituto Italiano Di Tecnologia
Giuseppe VICIDOMINI
G02 - OPTICS
Information
Patent Application
FAST MULTIPHOTON MICROSCOPE
Publication number
20240210320
Publication date
Jun 27, 2024
APPLIKATE TECHNOLOGIES LLC
Michael Levene
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Methods for Fluorescence Imaging Using Radiofrequency...
Publication number
20240151645
Publication date
May 9, 2024
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Application
Optical Sources
Publication number
20240118585
Publication date
Apr 11, 2024
NKT PHOTONICS A/S
Anatoly Borisovich GRUDININ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACCELERATING DIGITAL MICROSCOPY SCANS USING EMPTY/DIRTY AREA DETECTION
Publication number
20240085688
Publication date
Mar 14, 2024
Scopio Labs Ltd.
Ittai MADAR
G02 - OPTICS
Information
Patent Application
ANALYZING AND USING MOTILITY KINEMATICS OF MICROORGANISMS
Publication number
20230392184
Publication date
Dec 7, 2023
PhAST Corp.
Kwangmin Son
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR ADJUSTING THE ILLUMINATION IN A FLUORESCENCE MICROSCOPE,...
Publication number
20230324662
Publication date
Oct 12, 2023
Leica Microsystems CMS GmbH
Christian SCHUMANN
G02 - OPTICS
Information
Patent Application
METHOD AND APPARATUS FOR CREATING A MICROSCOPIC SAMPLE IMAGE OF A M...
Publication number
20230266248
Publication date
Aug 24, 2023
Hanieh FATTAHI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTIMISED INTERFEROMETRIC SCATTERING MICR...
Publication number
20230185067
Publication date
Jun 15, 2023
REFEYN LTD
Josiah KANE
G02 - OPTICS
Information
Patent Application
METHOD AND APPARATUS CONFIGURED TO COUNT N-PHOTON EVENTS
Publication number
20230175886
Publication date
Jun 8, 2023
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
Techniques for High-Speed Volumetric Sampling
Publication number
20230152561
Publication date
May 18, 2023
THE ROCKEFELLER UNIVERSITY
Alipasha VAZIRI
G02 - OPTICS
Information
Patent Application
SPIM MICROSCOPE WITH A SEQUENTIAL LIGHT SHEET
Publication number
20230085581
Publication date
Mar 16, 2023
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Apparatus and Methods for Fluorescence Imaging Using Radiofrequency...
Publication number
20230052995
Publication date
Feb 16, 2023
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATING DIGITAL MICROSCOPY SCANS USING EMPTY/DIRTY AREA DETECTION
Publication number
20220350129
Publication date
Nov 3, 2022
Scopio Labs Ltd.
Ittai MADAR
G02 - OPTICS
Information
Patent Application
Optical Sources
Publication number
20210333685
Publication date
Oct 28, 2021
NKT PHOTONICS A/S
Anatoly Borisovich GRUDININ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING PROGRAM, AND IMAGE PRO...
Publication number
20210165205
Publication date
Jun 3, 2021
KRIPTON CO., LTD
Masahisa HAMADA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGING INTEGRATED CIRCUITS USING A SINGLE-POINT SINGLE-PHOTON DETE...
Publication number
20210063716
Publication date
Mar 4, 2021
International Business Machines Corporation
Franco Stellari
G01 - MEASURING TESTING
Information
Patent Application
LOW-FLUORESCENCE-PHOTOBLEACHING CONFOCAL IMAGING METHOD AND SYSTEM
Publication number
20200363337
Publication date
Nov 19, 2020
Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of...
Yuguo Tang
G01 - MEASURING TESTING
Information
Patent Application
HIGH-SPEED LASER SCANNING MICROSCOPY PLATFORM FOR HIGH-THROUGHPUT A...
Publication number
20200333574
Publication date
Oct 22, 2020
Board of Regents, The University of Texas System
Adela Ben-Yakar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF STIMULATED EMISSION DEPLETION MICROSCOPY HAVING HIGH SPAT...
Publication number
20200333573
Publication date
Oct 22, 2020
Fondazione Istituto Italiano Di Tecnologia
Luca LANZANO'
G01 - MEASURING TESTING
Information
Patent Application
Optical Sources
Publication number
20200292914
Publication date
Sep 17, 2020
NKT PHOTONICS A/S
Anatoly Borisovich GRUDININ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for deconvolving image data
Publication number
20200294204
Publication date
Sep 17, 2020
CARL ZEISS MICROSCOPY GMBH
Stanislav Kalinin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACCELERATING DIGITAL MICROSCOPY SCANS USING EMPTY/DIRTY AREA DETECTION
Publication number
20200278530
Publication date
Sep 3, 2020
Scopio Labs Ltd.
Ittai MADAR
G02 - OPTICS
Information
Patent Application
SCAPE Microscopy with Phase Modulating Element and Image Reconstruc...
Publication number
20200249168
Publication date
Aug 6, 2020
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Venkatakaushik VOLETI
G01 - MEASURING TESTING
Information
Patent Application
PTYCHOGRAPHY BASED SYSTEM AND METHOD
Publication number
20200142175
Publication date
May 7, 2020
Technion Research & Development Foundation Ltd.
Oren COHEN
G02 - OPTICS
Information
Patent Application
STRUCTURED ILLUMINATION MICROSCOPY SYSTEM USING DIGITAL MICROMIRROR...
Publication number
20200081236
Publication date
Mar 12, 2020
Tomocube, Inc.
YongKeun PARK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LINE-SCANNING, SAMPLE-SCANNING, MULTIMODAL CONFOCAL MICROSCOPE
Publication number
20200081238
Publication date
Mar 12, 2020
SURGIVANCE INC.
Daniel Summer GAREAU
G02 - OPTICS
Information
Patent Application
IMAGE REPRODUCING DEVICE AND OBSERVATION SYSTEM
Publication number
20200073104
Publication date
Mar 5, 2020
OLYMPUS CORPORATION
Yohei TANIKAWA
G02 - OPTICS
Information
Patent Application
METHOD FOR FORMING A DIGITAL VALUE FROM A CLOCK SIGNAL AND FROM A D...
Publication number
20200041961
Publication date
Feb 6, 2020
Leica Microsystems CMS GmbH
Bernd Widzgowski
G04 - HOROLOGY