Claims
- 1. A method for measuring the degree of ionization in a vapor deposition coating system which comprises an ionized vapor enclosure, an evaporator for producing coating vapor in the ionized vapor enclosure, and an ionizing source for ionizing the coating vapor to a degree of ionization, comprising the steps of:exposing a first electrically conductive element and a second electrically conductive element to the ionized coating vapor in the ionized vapor enclosure; supplying electric current to the first electrically conductive element with a first electric power supply so that the electric current flows from the first electric power supply, through the first electrically conductive element, through the ionized vapor to the second electrically conductive element, through second electrically conductive element, and back to the first electric power supply; and measuring electric current through the first electrically conductive element with an ammeter.
- 2. A method as in claim 1 wherein the first and second electrically conductive elements are wires.
- 3. A method for measuring the rate of evaporation from an evaporator in a vapor deposition coating system which comprises an ionized vapor enclosure, the evaporator for producing coating vapor in the ionized vapor enclosure at a rate of evaporation, and an ionizing source for ionizing the coating vapor to a degree of ionization, comprising the steps of:exposing an electrically conductive element to the ionized coating vapor; supplying electric current from a first power supply to the electrically conductive element and closing a first circuit including the electrically conductive element and the first power supply to heat the electrically conductive element and evaporate from the electrically conductive element particles deposited on the electrically conductive element from the coating vapor; opening the first circuit; and thereafter while supplying electric current to the electrically conductive element with a second electric power supply, measuring the rate of change of the electric current through the electrically conductive element and the ionized coating vapor to ground with an ammeter.
- 4. A method as in claim 3 wherein the second electric power supply is a DC power supply.
- 5. A method as in claim 3 wherein the electric current supplied to the electrically conductive element by the second power supply flows from the electrically conductive element to the ionized vapor enclosure and to ground.
- 6. A method as in claim 3 wherein the electrically conductive element is a wire.
- 7. A method for measuring the rate of evaporation from an evaporator in a vapor deposition coating system which comprises an ionized vapor enclosure, the evaporator for producing coating vapor in the ionized vapor enclosure at a rate of evaporation, and an ionizing source for ionizing the coating vapor to a degree of ionization, comprising the steps of:exposing a first electrically conductive element and a second electrically conductive element to the ionized coating vapor; supplying electric current to the first electrically conductive element and closing a first circuit including the first electrically conductive element to heat the first electrically conductive element and evaporate from the first electrically conductive element particles deposited on the first electrically conductive element from the coating vapor; supplying electric current to the second electrically conductive element and closing a second circuit including the second electrically conductive element to heat the second electrically conductive element and evaporate from the second electrically conductive element particles deposited on the second electrically conductive element from the coating vapor; opening the first and second circuits; and thereafter while supplying electric current to the first and second electrically conductive elements, measuring the rate of change of the electric current passing through the first electrically conductive element, the ionized vapor, and the second electrically conductive element with an ammeter.
CROSS-REFERENCE TO RELATED APPLICATIONS
This application is a divisional of U.S. patent application Ser. No. 09/128,456 filed on Aug. 3, 1998, now U.S. Pat. No. 6,251,233, the subject matter of which parent application is expressly incorporated herein by reference.
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