Claims
- 1. A method of fabricating a lens with an aligned aperture, comprising:
mechanically coupling a mask material to a lens; and projecting electromagnetic radiation onto the mask material with the lens; wherein the intensity of the electromagnetic radiation and the mask material are chosen so that an aperture is formed in the mask material by the electromagnetic radiation via a non-ablative process.
- 2. The method of claim 1, further comprising attaching a substrate to the mask material prior to projecting the electromagnetic radiation onto the mask material.
- 3. The method of claim 1, wherein mechanically coupling a mask material to a lens comprises:
attaching a mask material to a substrate; and forming a lens on the mask material.
- 4. The method of claim 1, wherein the mask material is opaque.
- 5. The method of claim 1, wherein the mask material comprises a metal.
- 6. The method of claim 5, wherein the mask material comprises Al, Cr, Cu, Zn, Se, Fe, Ti, Ta, Zr, and/or V.
- 7. The method of claim 1, wherein the mask material comprises a metallic carbide, nitrides, oxides, selenides, and/or tellurides.
- 8. The method of claim 7, wherein the mask material comprises TiC.
- 9. The method of claim 1, wherein the mask material comprises a metal oxide.
- 10. The method of claim 1, wherein the mask material comprises a cermet material.
- 11. The method of claim 1, wherein the mask material comprises a polymer.
- 12. The method of claim 1, wherein the mask material comprises an organic black material.
- 13. The method of claim 1, wherein the mask material has a thickness of between approximately 0.5 and 100 absorption lengths.
- 14. The method of claim 1, wherein the electromagnetic radiation comprises pulsed laser radiation.
- 15. The method of claim 14, wherein the pulsed laser radiation comprises near-infrared radiation.
- 16. The method of claim 14, wherein the pulsed laser radiation has an irradiance level between approximately 1 mJ/cm2 to approximately 5 mJ/cm2.
- 17. The method of claim 16, wherein a pulse width of the pulsed laser radiation is approximately 10 ns.
- 18. The method of claim 1, wherein the non-ablative process comprises a thermal process that results in the mask material contracting away from an area irradiated by the electromagnetic radiation.
- 19. The method of claim 1, wherein the lens comprises a lenticular lens.
- 20. The method of claim 19, wherein the aperture has a length corresponding to a length of the lens.
- 21. The method of claim 1, wherein the lens has a spherical, ellipsoidal, toroidal, aspherical, or polyhedral shape.
- 22. The method of claim 1, wherein the mask material is positioned in proximity to an image plane of the lens.
- 23. The method of claim 1, wherein the non-ablative process forms the aperture via a contraction mechanism.
- 24. The method of claim 1, wherein the non-ablative process forms the aperture via a phase change mechanism.
- 25. The method of claim 1, wherein the non-ablative process forms the aperture via a mechanical deformation mechanism.
- 26. The method of claim 1, wherein the non-ablative process forms the aperture via a chemical mechanism.
- 27. A method of fabricating a micro-lens array with an aligned aperture mask, comprising:
providing a first substrate; forming a micro-lens array on a first surface of the first substrate, wherein the micro-lens array comprises a plurality of lenslets; applying a mask material to a second surface of the first substrate; and projecting electromagnetic radiation onto the mask material with each lenslet; wherein the intensity of the electromagnetic radiation and the mask material are chosen so that apertures are formed in the mask material by the electromagnetic radiation via a non-ablative process.
- 28. The method of claim 27, further comprising attaching a second substrate to the mask material after the apertures are formed.
- 29. The method of claim 27, further comprising attaching a second substrate to the mask material before the apertures are formed.
- 30. The method of claim 27, wherein the mask material is opaque.
- 31. The method of claim 27, wherein the mask material comprises a metal.
- 32. The method of claim 31, wherein the mask material comprises Al, Cr, Cu, Zn, Se, Fe, Ti, Ta, Zr, and/or V.
- 33. The method of claim 27, wherein the mask material comprises a metallic carbide, nitrides, oxides, selenides, and/or tellurides.
- 34. The method of claim 33, wherein the mask material comprises TiC.
- 35. The method of claim 27, wherein the mask material comprises a metal oxide.
- 36. The method of claim 27, wherein the mask material comprises a cermet material.
- 37. The method of claim 27, wherein the mask material comprises a polymer.
- 38. The method of claim 27, wherein the mask material comprises an organic black material.
- 39. The method of claim 27, wherein the mask material has a thickness of between approximately 0.5 and 100 absorption lengths.
- 40. The method of claim 27, wherein the electromagnetic radiation comprises pulsed laser radiation.
- 41. The method of claim 40, wherein the pulsed laser radiation comprises near-infrared radiation.
- 42. The method of claim 40, wherein the pulsed laser radiation has an irradiance level between approximately 1 mJ/cm2 to approximately 5 mJ/cm2.
- 43. The method of claim 42, wherein a pulse width of the pulsed laser radiation is approximately 10 ns.
- 44. The method of claim 27, wherein the lenslets comprise lenticular lenslets.
- 45. The method of claim 44, comprising forming apertures with lengths corresponding to lengths of each corresponding lenticular lenslet.
- 46. The method of claim 27, wherein the lenslets have a spherical, ellipsoidal, toroidal, aspherical, or polyhedral shape.
- 47. The method of claim 27, wherein the mask material is positioned in proximity to an image plane of the lenslets.
- 48. The method of claim 27, wherein the non-ablative process forms the apertures via a contraction mechanism.
- 49. The method of claim 27, wherein the non-ablative process forms the apertures via a phase change mechanism.
- 50. The method of claim 27, wherein the non-ablative process forms the apertures via a mechanical deformation mechanism.
- 51. The method of claim 27, wherein the non-ablative process forms the apertures via a chemical mechanism.
- 52. A method of fabricating a micro-lens array with an aligned aperture mask, comprising:
applying a mask material to a first surface of a first substrate; forming a micro-lens array on the mask material, wherein the micro-lens array comprises a plurality of lenslets; and projecting electromagnetic radiation onto the mask material with each lenslet; wherein the intensity of the electromagnetic radiation and the mask material are chosen so that apertures are formed in the mask material by the electromagnetic radiation via a non-ablative process.
- 53. The method of claim 52, wherein forming a micro-lens array on the mask material comprises:
attaching a second substrate to the mask material; and forming a micro-lens array on the second substrate.
- 54. The method of claim 52, wherein the mask material is opaque.
- 55. The method of claim 52, wherein the mask material comprises a metal.
- 56. The method of claim 55, wherein the mask material comprises Al, Cr, Cu, Zn, Se, Fe, Ti, Ta, Zr, and/or V.
- 57. The method of claim 52, wherein the mask material comprises a metallic carbide, nitrides, oxides, selenides, and/or tellurides.
- 58. The method of claim 57, wherein the mask material comprises TiC.
- 59. The method of claim 52, wherein the mask material comprises a metal oxide.
- 60. The method of claim 52, wherein the mask material comprises a cermet material.
- 61. The method of claim 52, wherein the mask material comprises a polymer.
- 62. The method of claim 52, wherein the mask material comprises an organic black material.
- 63. The method of claim 52, wherein the mask material has a thickness of between approximately 0.5 and 100 absorption lengths.
- 64. The method of claim 52, wherein the electromagnetic radiation comprises pulsed laser radiation.
- 65. The method of claim 64, wherein the pulsed laser radiation comprises near-infrared radiation.
- 66. The method of claim 64, wherein the pulsed laser radiation has an irradiance level between approximately 1 mJ/cm2 to approximately 5 mJ/cm2.
- 67. The method of claim 66, wherein a pulse width of the pulsed laser radiation is approximately 10 ns.
- 68. The method of claim 52, wherein the lenslets comprise lenticular lenslets.
- 69. The method of claim 68, wherein a length of each aperture is aligned with a length of each corresponding lenslet.
- 70. The method of claim 52, wherein the lenslets have a spherical, ellipsoidal, toroidal, aspherical, or polyhedral shape.
- 71. The method of claim 52, wherein the mask material is positioned in proximity to an image plane of the lenslets.
- 72. The method of claim 52, wherein the non-ablative process forms the apertures via a contraction mechanism.
- 73. The method of claim 52, wherein the non-ablative process forms the apertures via a phase change mechanism.
- 74. The method of claim 52, wherein the non-ablative process forms the apertures via a mechanical deformation mechanism.
- 75. The method of claim 52, wherein the non-ablative process forms the apertures via a chemical mechanism.
- 76. An optical system, comprising:
a micro-lens array comprising a plurality of lenslets; and an aperture mask in optical communication with the micro-lens array, wherein the aperture mask comprises a plurality of apertures aligned with respective lenslets of the micro-lens array that are formed with a non-ablative process.
- 77. The system of claim 76, wherein the micro-lens array is formed on a first surface of a first substrate, and the aperture mask is formed on a second surface of the first substrate.
- 78. The system of claim 77, further comprising a second substrate attached to the aperture mask.
- 79. The system of claim 76, wherein the aperture mask comprises a metal.
- 80. The system of claim 76, wherein the aperture mask comprises Al, Cr, Cu, Zn, Se, Fe, Ti, Ta, Zr, and/or V.
- 81. The system of claim 76, wherein the aperture mask comprises a metallic carbide, nitrides, oxides, selenides, and/or tellurides.
- 82. The system of claim 81, wherein the aperture mask comprises TiC.
- 83. The system of claim 76, wherein the aperture mask comprises an organic compound.
- 84. The system of claim 76, wherein the aperture mask comprises a metal oxide.
- 85. The system of claim 76, wherein the aperture mask comprises a cermet.
- 86. The system of claim 76, wherein the aperture mask comprises a polymer.
- 87. The system of claim 76, wherein the aperture mask comprises carbon.
- 88. The system of claim 76, wherein the mask has a thickness ranging from approximately 0.5 to approximately 100 absorption lengths.
- 89. The system of claim 76, wherein a height of at least one of the lenslets is less than approximately 20 microns.
- 90. The system of claim 76, wherein a diameter of at least one of the lenslets is less than approximately 250 microns.
- 91. The system of claim 76, wherein a diameter of at least one of the apertures is less than approximately 100 microns.
- 92. The system of claim 76, wherein the lenslets comprise lenticular lenslets.
- 93. The system of claim 92, wherein a length of each aperture corresponds to a length of each lenticular lenslet.
- 94. The system of claim 76, wherein the lenslets have a spherical, ellipsoidal, toroidal, aspherical, or polyhedral shape.
- 95. The system of claim 76, wherein the mask material is positioned in proximity to an image plane of the lenslets.
- 96. The system of claim 76, wherein the non-ablative process forms the apertures via a contraction mechanism.
- 97. The system of claim 76, wherein the non-ablative process forms the apertures via a phase change mechanism.
- 98. The system of claim 76, wherein the non-ablative process forms the apertures via a mechanical deformation mechanism.
- 99. The system of claim 76, wherein the non-ablative process forms the apertures via a chemical mechanism.
- 100. An optical system, comprising:
a lens; and an aperture mask in optical communication with the lens, wherein the aperture mask comprises an aperture aligned with the lens that is formed with a non-ablative process.
- 101. The system of claim 100, wherein the lens is formed on a first surface of a first substrate, and the aperture mask is formed on a second surface of the first substrate.
- 102. The system of claim 101, further comprising a second substrate attached to the aperture mask.
- 103. The system of claim 100, wherein the aperture mask comprises a metal.
- 104. The system of claim 100, wherein the aperture mask comprises Al, Cr, Cu, Zn, Se, Fe, Ti, Ta, Zr, and/or V.
- 105. The system of claim 100, wherein the aperture mask comprises a metallic carbide, nitrides, oxides, selenides, and/or tellurides.
- 106. The system of claim 105, wherein the aperture mask comprises TiC.
- 107. The system of claim 100, wherein the aperture mask comprises an organic compound.
- 108. The system of claim 100, wherein the aperture mask comprises a metal oxide.
- 109. The system of claim 100, wherein the aperture mask comprises a cermet.
- 110. The system of claim 100, wherein the aperture mask comprises a polymer.
- 111. The system of claim 100, wherein the aperture mask comprises carbon.
- 112. The system of claim 100, wherein the mask has a thickness ranging from approximately 0.5 to approximately 100 absorption lengths.
- 113. The system of claim 100, wherein a height of the lens is less than approximately 20 microns.
- 114. The system of claim 100, wherein a diameter of the lens is less than approximately 250 microns.
- 115. The system of claim 100, wherein a diameter of the aperture is less than approximately 100 microns.
- 116. The system of claim 100, wherein the lens comprises a lenticular lens.
- 117. The system of claim 116, wherein a length of the aperture corresponds to a length of the lenticular lens.
- 118. The system of claim 100, wherein the lens has a spherical, ellipsoidal, toroidal, aspherical, or polyhedral shape.
- 119. The system of claim 100, wherein the mask material is positioned in proximity to an image plane of the lens.
- 120. The system of claim 100, wherein the non-ablative process forms the aperture via a contraction mechanism.
- 121. The system of claim 100, wherein the non-ablative process forms the aperture via a phase change mechanism.
- 122. The system of claim 100, wherein the non-ablative process forms the aperture via a mechanical deformation mechanism.
- 123. The system of claim 100, wherein the non-ablative process forms the apertures via a chemical mechanism.
Parent Case Info
[0001] This Application is a Continuation-in-part of application Ser. No. 10/120,785 filed Apr. 12, 2002, which is a Continuation-in-part of U.S. application Ser. No. 09/521,236, filed Apr. 5, 2000, now U.S. Pat. No. 6,483,612, which is a Continuation of U.S. application Ser. No. 08/060,906, filed Apr. 15, 1998, now abandoned. The entire disclosures of the prior applications are incorporated herein by reference.
Continuations (1)
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Number |
Date |
Country |
Parent |
09060906 |
Apr 1998 |
US |
Child |
09521236 |
Apr 2000 |
US |
Continuation in Parts (2)
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Number |
Date |
Country |
Parent |
10120785 |
Apr 2002 |
US |
Child |
10452238 |
Jun 2003 |
US |
Parent |
09521236 |
Apr 2000 |
US |
Child |
10120785 |
Apr 2002 |
US |