Patent Application
20060226000
The present invention generally relates to electrochemically treating microelectronic workpieces and specifically relates to improved workpiece holders and contact assemblies for use in electrochemically treating microelectronic workpieces.
Processors, memory devices, field-emission-displays, read/write heads and other microelectronic devices generally have integrated circuits with microelectronic components. A large number of individual microelectronic devices are generally formed on a semiconductor wafer, a glass substrate, or another type microelectronic workpiece. In a typical fabrication process, one or more layers of metal are formed on the workpieces at different stages of fabricating the microelectronic devices to provide material for constructing interconnects between various components.
The metal layers can be applied to the workpieces using several techniques, such as chemical vapor deposition (CVD), physical vapor deposition (PVD), plasma-enhanced deposition processes, electroplating, and electroless plating. The particular technique for applying a metal to a workpiece is a function of the particular type of metal, the structure that is being formed on the workpiece, and several other processing parameters. For example, CVD and PVD techniques are often used to deposit aluminum, nickel, tungsten, solder, platinum and other metals. Electroplating and electroless plating techniques can be used deposit copper, solder, permalloy, gold, silver, platinum and other metals. Electroplating and electroless plating can be used to form blanket layers and patterned layers. In recent years, processes for plating copper have become increasingly important in fabricating microelectronic devices because copper interconnects provide several advantages compared to aluminum and tungsten for high-performance microelectronic devices.
Electroplating is typically performed by forming a thin seed-layer of metal on a front surface of a microelectronic workpiece, and then using the seed-layer as a cathode to plate a metal layer onto the workpiece. The seed-layer can be formed using PVD, CVD or electroless plating processes. The seed-layer is generally formed on a topographical surface having vias, trenches, and/or other features, and the seed-layer is approximately 500-1000 angstroms thick. The metal layer is then plated onto the seed-layer using an electroplating technique to a thickness of approximately 6,000 to 15,000 angstroms. As the size of interconnects and other microelectronic components decrease, it is becoming increasingly important that the plated metal layer (a) has a uniform thickness across the workpiece, (b) completely fills the vias/trenches, and (c) has an adequate grain size.
Electroplating machines for use in manufacturing microelectronic devices often have a number of single-wafer electroplating chambers. A typical chamber includes a container for holding an electroplating solution, an anode in the container to contact the electroplating solution, and a support mechanism having a contact assembly with electrical contacts that engage the seed-layer. The electrical contacts are coupled to a power supply to apply a voltage to the seed-layer. In operation, the front surface of the workpiece is immersed in the electroplating solution so that the anode and the seed-layer establish an electrical field that causes metal in a diffusion layer at the front surface of the workpiece to plate onto the seed-layer.
The structure of the contact assembly can significantly influence the uniformity of the plated metal layer because the plating rate across the surface of the microelectronic workpiece is influenced by the distribution of the current (the “current density”) across the seed-layer. One factor that affects the current density is the distribution of the electrical contacts around the perimeter of the workpiece. In general, a large number of discrete electrical contacts should contact the seed-layer proximate to the perimeter of the workpiece to provide a uniform distribution of current around the perimeter of the workpiece. Another factor that affects the current density is the formation of oxides on the seed-layer. Oxides are generally resistive, and thus oxides reduce the efficacy of the electrical connection between the contacts and the seed-layer. Still other factors that can influence the current density are (a) galvanic etching between the contacts and the seed-layer, (b) plating on the contacts during a plating cycle, (c) gas bubbles on the seed-layer, and (d) other aspects of electroplating that affect the quality of the connection between the contacts and the seed-layer or the fluid dynamics at the surface of the workpiece. The design of the contact assembly should address these factors to consistently provide a uniform current density across the workpiece.
One type of contact assembly is a “dry-contact” assembly having a plurality of electrical contacts that are sealed from the electroplating solution. For example, U.S. Pat. No. 5,227,041 issued to Brogden et al. discloses a dry contact electroplating structure having a base member for immersion into an electroplating solution, a seal ring positioned adjacent to an aperture in the base member, a plurality of contacts arranged in a circle around the seal ring, and a lid that attaches to the base member. In operation, a workpiece is placed in the base member so that the front face of the workpiece engages the contacts and the seal ring. When the front face of the workpiece is immersed in the electroplating solution, the seal ring prevents the electroplating solution from engaging the contacts inside the base member.
Another type of contact assembly is a “wet-contact” assembly wherein the electrical contacts are permitted to contact the electroplating solution. One problem associated with such contacts is “thieving” of metal intended for the front face of the workpiece. This “thieved” metal is commonly deposited on the surface of the contact rather than the surface of the workpiece. This fouls the contact and changes its electrical conductivity over time. Particularly where thieving occurs more at one location than at another, this can adversely impact uniformity of the current density across the workpiece, leading to non-uniform plated metal layers.
Dry-contact assemblies can minimize thieving by keeping the electrical contacts outside of the plating solution. However, the seals required to isolate the electrical contacts occupy valuable real estate on the front face of the microelectronic workpiece. In addition, the presence and thickness of the seal can induce turbulence in the flow of the electroplating solution at the workpiece surface and trap bubbles at the interior perimeter of the seal during operation. Increased in turbulence and bubbles can both adversely impact plating uniformity.
The present invention is generally directed toward microelectronic workpiece holders, contact assemblies, and support plates for microelectronic workpiece holders. In one embodiment of the invention, the workpiece holder can include both a novel contact assembly in accordance with one aspect of the invention and a novel support plate in accordance with another aspect of the invention. Several embodiments of such workpiece holders facilitate uniform electrical contact with a microelectronic workpiece with reduced thieving, enhancing product uniformity. Several embodiments of the invention provide workpiece holders well-suited for wet-contact applications with enhanced service life and reduced thieving.
A workpiece holder in accordance with one embodiment of the invention is useful for supporting a microelectronic workpiece for electrochemical treatment, such as electroplating or deplating. This workpiece holder includes a contact ring and a support. The contact ring has a central opening and is adapted to deliver electrical power to the workpiece front surface. The support is adapted to urge the workpiece front surface against the contact ring while contacting the back surface of the workpiece. In particular, the support contacts an inner location on the workpiece back surface at a first height with respect to the contact ring and contacts an outer location on the workpiece back surface at a second height with respect to the contact ring. The first height is greater than the second height. When the support forces the workpiece toward the contact ring, this height differential can induce a controlled flexure of the workpiece, facilitating good electrical contact between the contact ring and the workpiece front surface. If so desired, both the contact ring and the support plate may be rigid, which can materially enhance the useful life of the workpiece holder.
Other embodiments of the invention provide composite contact rings and contact assemblies employing composite contact rings. These novel contact rings can be used in flexure-inducing workpiece holders in accordance with several embodiments of the invention. However, these contact rings can be used in a variety of other applications, including more conventional workpiece holder constructions.
In one embodiment of the invention useful in wet-contact assemblies, a composite contact ring includes a dielectric base, a conductor, and a dielectric coating. The dielectric base has a contact face and an interior opening through which an electrolyte might pass to contact a surface of a microelectronic workpiece. A conductor is carried by the contact face of the base. The conductor includes an outer busbar and a plurality of spaced-apart contacts extending inwardly from and electrically coupled to the busbar. The dielectric coating covers at least a portion of the busbar, with at least a portion of each of the contacts remaining exposed for electrically contacting the workpiece. In this embodiment, the dielectric base and dielectric coating can enhance operation of the contact ring in wet-contact applications.
A composite electrochemistry contact ring in accordance with another embodiment to the invention employs a rigid dielectric base having a peripheral member and a plurality of fingers extending inwardly from the peripheral member. A plurality of electrical contacts are provided, with each electrical contact being carried on a finger of the base. Each contact also has an exposed contact pad adapted to electrically contact a conductive surface of a microelectronic workpiece. A busbar is carried by the peripheral member of the base. The busbar is adapted to electrically couple the electrical contacts to an electroplating power source. If so desired, the electrical contacts and the busbar may be applied as a conductive metal trace on a ceramic base, providing a durable, dimensionally stable contact ring.
Various embodiments of the present invention provide contact assemblies, and methods of making contact assemblies and electroplating machines with contact assemblies for electroplating materials onto microelectronic workpieces. The following description provides specific details of certain embodiments of the invention illustrated in the drawings to provide a thorough understanding of those embodiments. It should be recognized, however, that the present invention can be reflected in additional embodiments and the invention may be practiced without some of the details in the following description.
The operation and features of the contact assemblies are best understood in light of the environment and equipment in which they can be used to electroplate workpieces. As such, several embodiments of electroplating tools and reaction chambers that can be used with the contact assemblies will be described with reference to
A. Selected Embodiments of Electrochemical Processing Machines and Reactor Chambers for Use With Workpiece Holders
The bowl 40 can include a cup 44 having an overflow weir 46. The electrode 50 is positioned in the cup 44, and the electrode 50 can be carried by an electrode support assembly 52. In one embodiment, the electrode support assembly 52 has a channel 54 through which the electrochemical solution flows and is discharged into the cup 44, but in other embodiments the electrochemical solution can flow into the cup 44 separately from the electrode support assembly 52. The electrode support assembly 52 can be electrically conductive, or it can include a conductor to electrically couple the electrode 50 to an electrical power supply (shown schematically as 58 in
The head assembly 70 can further include a motor 74 and a rotor 80 that carries the workpiece holder 100. The motor 74 is coupled to the rotor 80 to rotate the workpiece holder 100 and the workpiece 30 during a plating cycle (Arrow R). The workpiece holder 100 can include a movable support plate 200 and a seal 84. The support plate 200 can move transverse to the workpiece 30 (Arrow T) between a first position in which the support plate 200 engages the back surface of the workpiece 30 (shown in solid lines in
In operation, the head assembly 70 can be initially raised above the bowl 40 and rotated about a relatively horizontal axis so the workpiece holder 100 faces upward away from the bowl 40. The support plate 200 is moved to the second position in which it is spaced apart from the contact assembly 110 to load the workpiece 30 into the head assembly 70. The robot 24 (
The foregoing description of the electrochemical processing machine 100 and the electrochemical processing chamber 12 provides examples of the types of devices in which workpiece holders, contact assemblies, and workpiece supports in accordance with embodiments of the invention can be used to plate metal layers onto microelectronic workpieces. It will be appreciated that the workpiece holder 100, and other embodiments of workpiece holders, described in more detail below, can be used with other electrochemical processing machines and reaction chambers.
B. Selected Embodiments of Workpiece Holders for Electrochemical Processing of Microelectronic Workpieces
The guide ring 130 may include a plurality of tabs 134 extending radially outwardly to rest on a rear surface 123 of the coupling member 120. These tabs may have through-holes to facilitate attachment of the guide ring 130 to the coupling member 120. The guide ring 130 also includes an inclined guide surface 132 which slopes radially inwardly toward the contact ring 140 (see, e.g.,
The contact ring 140 is electrically coupled to and may be carried by the coupling member 120. Coupling member 120 should be formed of a conductive material, such as a solid ring of metal, and may be electrically coupled to the electrical power supply 58 (
1. Selected Embodiments of Contact Rings
The contact ring 140 shown in
As best seen in
The contact ring 140 also includes a conductor 160 carried on, and which may be bonded directly to, the contact face 146 of the base 142. The conductor 160 generally includes a busbar 162 and a plurality of contacts 166. A separate contact 166 may be carried by each finger 152, with the contact 166 being positioned adjacent a nose 154 of the finger 152. The contact 166 is electrically coupled to the busbar 162, such as by a lead 164 extending radially inwardly from the busbar 162. When the busbar 162 is operatively coupled to the electrical power source (58 in
Each of the leads 164 may have the same width as the associated contact 166, i.e., the contact 166 may simply comprise an undifferentiated length of the lead 164. In the embodiment shown in
As explained below, the conductor 160 is desirably a relatively thin layer of a conductive material bonded directly to the contact face 146 of the base 142. With the relatively thin leads 164, smaller variations in the thickness of the lead 164 during manufacture can lead to varying currents delivered to the contacts 166. To minimize these production variations, a resistor 168 may be included in each of the leads 164. The resistor 168 may comprise a length of the lead 164 having an increased resistance. The increased resistance can be provided in a variety of manners. In one embodiment, the resistor 168 comprises a length of the lead 164 formed of a material having a resistivity greater than the resistivity of the material of which the rest of the lead 164 is formed. For example, the busbar 162, the contact pads 166 and the majority of each lead 164 may comprise a highly conductive noble metal, such as gold or platinum. A predetermined length of each lead 164 can be formed of a different material having a higher resistivity. The material of the resistor 168 may be a metal alloy, a mixture of a metal and a silicide or a mixture of metal and a metal oxide.
The contact face 146 of each finger 152 may be generally flat, leaving the lead 164 and contact 166 carried by the finger with a generally linear profile. As shown in
The contact ring 140 may also include a dielectric coating 175. If the contact ring 140 is to be used in a dry contact operation wherein it is effectively sealed from the electrochemical solution in the bowl 40 during use, the dielectric coating 175 likely is unnecessary. If the contact assembly 100 is used in a wet-contact operation, the dielectric coating 175 can reduce thieving by the contact ring 140 and avoid any undue fouling of the contacts 166 due to reaction with the electrochemical solution.
The dielectric coating 175 may cover a majority of the busbar 162 and may also cover a length of each of the leads 164. This leaves the contacts 166 exposed to promote electrical contact between the contacts 166 and the microelectronic workpiece 30 in use. In one embodiment, the dielectric coating 175 covers the entire lead 164, leaving only the contact 166 exposed. This is schematically illustrated in
The dielectric coating 175 of the contact ring 140 may be provided with a plurality of openings 176, with each opening 176 being positioned concentrically about a hole 148 through the peripheral member 50 of the base for receiving a bolt 126. This permits the bosses 124 of the coupling member 120 to which the bolts 126 are connected to electrically contact the busbar 162 of the conductor 160. As a consequence, electrical power delivered to the coupling member 120 can be delivered to the contacts 166 of the contact ring 140 via the busbar 162 and leads 164.
The materials used in forming the contact ring 140 can be selected to achieve a variety of different design objectives. As noted above, however, the base 142 of the contact ring 140 is desirably formed of a dielectric material. In one embodiment, the dielectric material of the base 142 comprises a resilient material which may deform when a microelectronic workpiece 30 is forced against the fingers 152. This allows the fingers 152 to flex to accommodate any irregularities in the microelectronic workpiece 30 without unduly stressing the workpiece 30.
In an alternative embodiment of the invention, the base 142 of the contact ring 140 is formed of a rigid dielectric material, such as a dielectric ceramic. To facilitate manufacture, outlined below, and to reduce dimensional variations with any changes in temperature, the ceramic material may also be a refractory. Suitable ceramic materials include alumina and silicon carbide. Forming the base 142 of a rigid material minimizes the fatigue and wear associated with contacts which must repeatedly flex in use. This can significantly extend the useful life of the contact ring. Whereas metal contacts in use today sometimes must be replaced after electroplating 3,000-5,000 semiconductor wafers, it is anticipated that a contact ring 140 of the invention employing a rigid dielectric base 142 will have a service life in excess of 10,000 semiconductor wafers. The conductor 160 may be formed of any suitably conductive material which bonds well to the dielectric base 142. If the dielectric base 142 comprises a ceramic, the conductor 160 may comprise a metal which is bonded directly to the contact face 146 of the base 142. Metal can be bonded to a ceramic material fairly readily, yielding a structurally stable conductor with a relatively long service life. The conductor may, for example, comprise copper or gold.
The dielectric coating 175 may be formed of any suitable dielectric. In one embodiment, the dielectric coating 175 comprises a coating of a dielectric plastic which bonds well to both the dielectric base 142 and the conductor 160. In an alternative embodiment, the dielectric coating 175 instead comprises an inorganic dielectric material, such as a ceramic or glass, such as water glass. This can provide a more durable, wear-resistant dielectric coating 175. The bond of an inorganic dielectric coating 175 to a ceramic base 142 is also anticipated to be relatively strong and durable.
The contact ring 140 can be formed in any suitable fashion and the method of manufacture may vary somewhat depending on the nature of the materials selected for the base 142, conductor 160, and dielectric coating 175. If the base 142 is formed of a ceramic material, a rough blank of the base 142 may be formed using conventional ceramic forming processes, e.g., by slip casting or sol gel techniques. This rough blank may be bisque fired (if necessary to improve its raw structural strength in the green state) then initially machined to approximate the final desired shape. The blank may then be sintered at an elevated temperature then subjected to a final machining process. If the ceramic is a refractory ceramic, the machining may be performed using laser machining equipment to yield a precise shape, even with relatively complex finger profiles, without fear of overheating the base 142.
Once the base 142 is formed, a conductive material may be applied in a predetermined pattern on the base. This predetermined pattern may define a busbar 162 on the peripheral member 150 of the base 142 and a plurality of electrical contacts 166 on the fingers 152 of the base 142. The predetermined pattern of conductive material may be applied in any suitable technique. It is anticipated that precision screen printing and/or lithographic techniques commonly used to deposit conductive traces in printed circuit board manufacture may be advantageously employed here. After the conductive material is applied, the conductive material may be thermally treated to define a conductive trace bonded to the base 142. This thermal treatment may simply comprise heating the entire device in an oven or the like. In an alternative embodiment, a mask may be applied over the base 142 and the conductive material can be deposited on the base via CVD or PVD processes. If a resistor 168 is included in the leads 164, the resistors 168 can be applied in a separate step before or after the rest of the conductor 160 is applied.
If so desired, the contact ring 140 may be used in this state. As noted above, however, one embodiment of the contact ring 140 also includes a dielectric coating 175. This dielectric coating may be applied over a portion of the conductive trace, leaving at least a portion of each contact 166 exposed for electrical contact with a microelectronic workpiece. As noted above, the dielectric coating may comprise a plastic or an inorganic material, such as glass. In either circumstance, the dielectric material may be initially applied using screen painting or lithographic techniques analogous to those used to deposit the conductive material of the conductor 160. The dielectric coating could instead be applied using CVD or PVD processes, e.g., by sputtering silicon through a mask applied over the base 142. The coated device may be subjected to a second thermal treatment to better bond the dielectric coating to the dielectric base 142 and/or the conductor 160. If so desired, the thermal treatment of the conductor 160 and the dielectric coating 175 may take place in the same heating step.
FIGS. 7A-B illustrate a contact ring 180 in accordance with another embodiment of the invention. The contact ring 180 is similar to the contact ring 140 of
As noted above, workpiece holders 100 in accordance with several embodiments of the invention also include a workpiece support 200. The workpiece support 200 is adapted to hold a microelectronic workpiece 30 against the contact assembly 110 with sufficient force to ensure reliable electrical contact between the contact assembly 110 and a conductive layer on the microelectronic workpiece, such as a seed layer. In accordance with one embodiment of the invention, the workpiece support may comprise a flat plate which urges the microelectronic workpiece 30 against the contact assembly 110 such that a peripheral portion of the front face of the microelectronic workpiece 30 is urged into electrical contact with the contact assembly 110. If the contact assembly 110 includes an improved contact ring in accordance with an embodiment of the invention (e.g., contact ring 140 or 180 of
2. Selected Embodiments of Workpiece Supports for Microelectronic Workpiece Holders
In accordance with several alternative embodiments of the invention, the workpiece support 200 is adapted to induce a controlled flexure of the microelectronic workpiece 30 when the workpiece 30 is grasped between the support 200 and the contact assembly 110. As explained below, inducing a controlled degree of curvature in the microelectronic workpiece 30 can improve contact with the contact assembly 110, particularly if a rigid contact ring 140 is employed.
In one embodiment, the first and second control surfaces 212a-b of the first and second abutments 210a-b are contiguous to one another to define a more continuous control surface for the workpiece support 200. In the illustrated embodiment, the second abutment 210b is instead spaced radially outwardly from the first abutment 210a. The first abutment 210a comprises a raised annulus positioning the first control surface 212a a radius R1 from the center of the workpiece support 200. The second abutment 210b is also a raised annulus and positions the second control surface 212b a larger radius R2 from the same center of the workpiece.
The first and second control surfaces 212a-b may be formed with a high degree of precision to ensure that they contact the microelectronic workpiece at the desired relative positions. It is not necessary for the entire forward face 206 of the workpiece support 200 to be manufactured to a tight tolerance, though. Instead, the forward surface 206 may have a reduced height inside the first abutment 210a, defining a generally circular first recessed surface 214a. A generally annular second recessed surface 214b may extend between the concentric first and second abutments 210a-b. As these recessed surfaces 214 do not contact the workpiece 30, flaws or variations in these surfaces 214 will not affect precise control of the contact locations with the workpiece.
The first and second abutments 210a-b may have different heights. In the illustrated embodiment, the first control surface 212a of the first abutment 210a is spaced a height h1 from the rear face 204 of the body 202. The second control surface 212b of the second abutment 210b is spaced a second height h2 from the rear face 204. The first height h1 is greater than the second height h2. This leaves a height difference Δh between the first control surface 212a and the second control surface 212b. By appropriate selection of the radii R1 and R2 of the first and second abutments 210a-b and this height difference Δh, the degree of flexure of a microelectronic workpiece induced by the workpiece support 200 can be controlled.
The desired degree of curvature of the microelectronic workpiece will depend on a number of factors, including the material of which the microelectronic workpiece is formed and the size of the microelectronic workpiece. In one embodiment of the invention suitable for use in connection with a 200 mm silicon-based semiconductor wafer, the radius R1 of the first abutment 210a is greater than one inch (about 25 mm), e.g., about 1.5 in. (about 38 mm). The second abutment 210b may extend about the outer periphery of the support 200 and the support 200 may have a diameter which is slightly less than the diameter of the microelectronic workpiece. Hence, the second radius R2 in this embodiment may be about 3.85 in. (about 98 cm). The height difference Δh for this exemplary workpiece support 200 may range between about one mil (0.001 in., about 0.025 mm) to about 100 mils (about 2.5 mm). The height difference Δh may be selected to be as small as possible yet yield consistent, reliable electrical contact with the contact assembly 110. Accordingly, in one useful embodiment of the invention, the height difference Δh is about 8-32 mils (about 0.2-0.8 mm). In one more particular embodiment, the height difference Δh is about 8-16 mils (about 0.2-0.4 mm).
Another exemplary embodiment of the workpiece support 200 is suited for use with a 300 mm silicon-based semiconductor wafer. In one such embodiment, the radius R1 of the first abutment 210a is greater than one inch, e.g., about 1.5 in. (about 38 mm); the radius R2 of the second abutment 210b is slightly less than the size of the wafer, e.g., about 5.85 in. (about 148 mm); and the height difference Δh between the first and second control surfaces 212a-b is about 1-200 mils (about 0.03-5 mm), with a height difference of 8-50 mils (about 0.2-1.3 mm) being useful in a variety of applications and a range of 16-32 mils (about 0.4-0.8 mm) being well-suited for many applications.
FIGS. 9A-B illustrate a workpiece support 250 in accordance with an alternative embodiment of the invention. This workpiece support 250 shares many similarities with the workpiece support 200 of FIGS. 8A-B. In particular, the workpiece support 250 includes a body 252 having a rear face 254 and a forward face 256. The forward face 256 includes a plurality of abutments adapted to contact the back surface of a microelectronic workpiece at spaced-apart locations, namely, a central first abutment 260a, an annular second abutment 260b, and an annular third abutment 260c. The first abutment 260a may comprise a generally circular pedestal having a radius R1, defining a generally circular first control surface 262a. The second abutment 260b is spaced a radius R2 from the center of the workpiece support 250 and defines an annular second control surface 262b. The third abutment 260c is spaced a radius R3 from the center of the support 250 and defines an annular third control surface 262c adjacent the periphery of the workpiece support 250.
Each of the control surfaces 262a-c may have a different height. Hence, the first control surface 262a is spaced a height h1 from the rear face 254 of the support 250, the second control surface 262b is spaced a height h2 from the rear face 254, and the third control surface 262c is spaced a height h3 from the rear face 254. In one embodiment of the invention, the height decreases moving radially outwardly from the center of the workpiece support 250, i.e., h1>h2>h3. This yields a first height difference Δh1 between the first and second control surfaces 262a-b and a second height difference Δh2 between the second and third control surfaces 262b-c. The degree and shape of the flexure of the microelectronic workpiece in response to the force of the support 250 against the back surface of the workpiece can be controlled by appropriate selection of the radii R1-R3 and heights h1-h3.
The three control surfaces 262a-c of the support 250 are spaced from one another, leaving a first annular recessed surface 264a between the first and second abutments 260a-b and a second annular recessed surface 264b between the second and third abutments 260b-c. This provides three discrete, spaced-apart control surfaces 262a-c. It should be understood that four or more discrete control surfaces 262 could be used instead. In each of the embodiments, the control surfaces are shown as being continuous, such as circular or annular surfaces. If so desired, a series of appropriately spaced abutments having predetermined heights could be arranged on the surface of the support rather than using continuous annular or circular control surfaces as shown in
In one embodiment of the invention, the entire forward surface 206 or 256 of the support 200 or 250 may define a curved, continuous control surface. If the support could be made with appropriate control and manufacturing tolerances at a reasonable cost, this could yield good control over the shape of the flexed microelectronic component. Utilizing a series of spaced-apart control surfaces as shown in
FIGS. 10A-B illustrate a microelectronic workpiece support 280 in accordance with another embodiment of the invention. This workpiece support 280 includes a body 282 having a back face 284 and a forward face 286. A generally dome-shaped first abutment 290 a having a first control surface 292a may be centered on the circular forward face 286. An outer rim 290b of the forward face 286 may define a second control surface 292b spaced radially outwardly from the first control surface 292a. The first control surface 292a has a maximum height h1 from the back face 284. The second control surface 292b may have a lesser second height h2 from the back face 284, leaving a height difference Δh between the spaced-apart first and second control surfaces 292a-b to induce the desired flexure of a microelectronic workpiece in contact with the support 280. To reduce localization of stress on the periphery of the microelectronic workpiece, the rim 290b may be rounded or beveled to yield a second control surface 292b which is curved (as shown) or angled.
The support 200, 250, or 280 can be formed of any desired material. In one embodiment, the support is formed of a material capable of high precision machining or other high precision forming techniques. The material may have a high Young's modulus to reduce flexing of the support in use. The material may also be relatively hard and wear-resistant to ensure greater dimensional uniformity of the support over time. Suitable materials for forming the support 200 or 250 include ceramics (e.g., aluminum or silicon carbide), metals (e.g., aluminum coated with diamond-like carbon via CVD or PVD), or hard, rigid plastics. If the support is formed of a ceramic, the general forming process for the support may be similar to that of forming the dielectric base 142 of the contact ring 140 discussed above.
C. Exemplary Methods of Operation of Selected Embodiments of Microelectronic Workpiece Holders
The workpiece holder 100 shown in
Due to the height difference (Δh in
As noted above, the noses 154 of the contact ring fingers 152 may have an angled bottom surface, yielding an angled shape to the contact 166 carried thereon. Due to the bending of the microelectronic workpiece 30, the contact 166 is expected to contact the front face 32 of the workpiece 30 primarily along a line of contact (167 in
In the embodiment of
It should be noted that supports in accordance with various embodiments of the invention (e.g., supports 200, 250, or 280) need not be used with a composite contact ring 140 as shown in the drawings. Conventional electrical contacts having relatively flexible fingers which are brought into contact with the front surface 32 of the workpiece 30 may still provide sufficient force against the periphery of the workpiece 30 to bring it into supportive contact with each of the control surfaces 212 of the support 200. This curvature of the microelectronic workpiece can, therefore, yield beneficial improvements in the contact uniformity between the workpiece front surface 32 and the contact ring.
It is anticipated that the workpiece holder 100 of various embodiments of the invention can be used beneficially in electrochemically treating semiconductor workpieces, such as in electroplating silicon-based semiconductor wafers. Out of fear of catastrophically damaging the wafer, such wafers conventionally are deemed too valuable and too brittle to bend. Supports (e.g., support 200, 250, or 280) in accordance with embodiments of the present invention, however, supportively contact predefined locations on the back surface of the microelectronic workpiece. Forcing a peripheral region of the workpiece 30 against a contact ring (e.g., contact ring 140, though other contacts could be used instead) will controllably deform the workpiece into a predefined configuration. By appropriate selection of the location and dimensions of the control surfaces and the height differential between the control surfaces, the flexure induced in the microelectronic workpiece can be fairly precisely controlled to mitigate the likelihood of damaging the workpiece 30.
Inducing a controlled flexure of the workpiece 30, however, promotes reliable contact between the workpiece front surface 32 and each of the fingers 152 of the contact ring 140 (or other contact system). Improving uniformity of electrical coupling minimizes variations in plating of semiconductor wafers which may otherwise arise due to imperfections in the planarity of the semiconductor wafer, the positions and dimensions of the fingers of a contact ring, and other variations which could lead to inconsistent contact force between the semiconductor wafer and the contact ring from one location to the next. Not only with such uniform electrical coupling materially improve plating uniformity across the surface of a single wafer, it can also reduce variations in plating results from one wafer to the next. This can enhance product yield and reduce the likelihood that a wafer will need to be plated with an excessively thick metal layer, which is removed in later polishing operations, to ensure at least minimum coverage across the entire wafer surface.
From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the spirit and scope of the invention. Accordingly, the invention is not limited except as by the appended claims.
| Number | Date | Country | Kind |
|---|---|---|---|
| PCT/US99/15847 | Jul 1999 | WO | international |
This application claims benefit of U.S. Provisional Application No. 60/619,547, filed Oct. 14, 2004. The present application is a continuation-in-part and claims priority from U.S. patent application Ser. No. 09/717,927, filed Nov. 20, 2000; and U.S. patent application Ser. No. 09/823,948, filed Mar. 31, 2001. Both of the foregoing applications—as well as U.S. patent application Ser. No. 09/113,723 filed Jul. 10, 1998; and PCT Patent Application No. PCT/US99/15847 filed Jul. 12, 1999—are herein incorporated by reference in their entirety.
| Number | Date | Country | |
|---|---|---|---|
| 60619547 | Oct 2004 | US |
| Number | Date | Country | |
|---|---|---|---|
| Parent | 09717927 | Nov 2000 | US |
| Child | 11248667 | Oct 2005 | US |
| Parent | 09823948 | Mar 2001 | US |
| Child | 11248667 | Oct 2005 | US |
