Patent Application
20230324665
The present invention relates to an optical microscope. In particular, but not exclusively, the invention relations to a confocal optical microscope.
Many conventional optical microscopes include a plurality of objective lenses with different magnification powers. The objective lenses are mounted in a turret, which allows them to be positioned alternately in the optical path of the microscope, allowing a sample to be viewed at different magnifications. This allows a user to identify an area of interest at a relatively low magnification and then view that area of interest at a higher magnification.
However, conventional optical microscopes of the type described above do not enable the sample to be viewed simultaneously at both magnifications, since only one objective lens can be located in the optical path at a time. Nor do they allow rapid switching between the high and low magnification images, for example to provide quasi-simultaneous viewing at both magnifications. These represent technical problems with known optical microscopes.
A similar problem arises with confocal microscopes, where an image is generated by scanning a sample using a high magnification objective, but where a low magnification objective may also be provided for orientation and to locate areas of interest in a sample. Again both objectives cannot be used at the same time, and therefore a high magnification image and a low magnification image cannot be captured simultaneously or quasi-simultaneously. This also represents a technical problem with known confocal microscopes.
In some confocal microscopes, light from a light source is focused onto a single spot on the sample, and light emanating from that spot (for example, by reflection or fluorescence) is then collected by an objective lens and focused onto a detector. By scanning the sample and detecting variations in the intensity of light from the sample, an image of the sample can be constructed. However, real time imaging is not possible owing to the requirement to scan the sample.
In an alternative confocal system, for example as described in U.S. Pat. No. 6,144,489, a mask is provided for encoding light incident on the sample and decoding light emanating from a plurality of regions of the sample. This generates a confocal image of the sample simultaneously with a non-confocal image. By subtracting the non-confocal image from the confocal image, out of focus blur can be removed providing an improved confocal image. However, this confocal system again suffers from the technical problems identified above, specifically in that it cannot capture a high magnification image and a low magnification image simultaneously.
A similar confocal microscope system is describe in U.S. Pat. No. 6,687,052.
It is an object of the present invention to provide a microscope that overcomes or mitigates one or more of the aforesaid problems, or that provides a useful alternative thereto.
According to the present invention there is provided, a microscope comprising:
The provision of such a microscope configuration enables a sample to be viewed simultaneously at both high and low magnifications and/or allows rapid switching between high and low magnification images, for example to provide quasi-simultaneous viewing at both magnifications.
The microscope may further comprise a beam splitter mounted in the first and second light paths. The beam splitter may comprise a semi-transparent mirror or a spatial light modulator comprising a plurality of transmissive and non-transmissive portions.
For example, the beam splitter may be in the form of a rotatable mask comprising a plurality of transmissive and non-transmissive portions. Such a beam splitter enables the first and second light paths to be split as they pass to the detector. This can be useful in a number of applications where a portion of the light beams is required to be selected and processed to generate a desired image.
For example, the non-transmissive portions of the spatial light modulator can be reflective and the spatial light modulator can be configured to split the first light path into a first transmitted light path and a first reflected light path, and to split the second light path into a second transmitted light path and a second reflected light path, where the first transmitted light path is congruent with the second reflected light path, and the first reflected light path is congruent with the second transmitted light path. The transmitted and reflected light paths can then be used to construct an image.
For example, the detector can include a first detector portion and a second detector portion, wherein the first detector portion is configured to receive transmitted light and to generate transmitted image data, and the second detector portion is configured to receive reflected light and to generate reflected image data, or the second detector portion is configured to receive transmitted light and to generate transmitted image data, and the first detector portion is configured to receive reflected light and to generate reflected image data.
In one configuration the first detector portion is configured to receive light from the first transmitted light path or the congruent second reflected light path, and the second detector portion is configured to receive light from the second transmitted light path or the congruent first reflected light path. The microscope may then further comprise an image processor connected to receive image data from the detector and configured to subtract the reflected image data from the transmitted image data to produce confocal image data for one or both of the first objective and the second objective. Such a configuration can enable laser-free confocal microscopy including simultaneous, or quasi-simultaneous, high and low magnification imaging.
In such arrangements, the light source may comprise an LED light for example.
Furthermore, the light source can be configured to direct light through the beam splitter towards the sample stage, for illuminating a sample mounted on the sample stage through the first objective and/or the second objective. This arrangement can provide a confocal system which has a functionality similar to that described in U56144489.
The beam splitter can function as a mask for encoding light incident on the sample and decoding light emanating from a plurality of regions of the sample. This generates a confocal image of the sample simultaneously with a non-confocal image. By subtracting the non-confocal image from the confocal image, out of focus blur can be removed providing an improved confocal image. However, in contrast to U.S. Pat. No. 6,144,489, the presently described confocal system can capture a high magnification image and a low magnification image simultaneously and/or quasi-simultaneously.
The microscope may further comprise a shutter mechanism for switching between the first objective and the second objective. A user can thus view either a low magnification image or a high magnification image, without making any other changes to the optical configuration of the microscope. This makes it very simple for the user to switch between a low magnification image for orientation, and a high magnification image of a specific area of interest within the sample. Also, by switching the shutter mechanism rapidly, a pair of high and low magnification images can be captured substantially quasi-simultaneously.
The first objective can be movable along an optical z-axis relative to the sample stage and the microscope can further comprise a z-stack controller which is configured to drive the first objective along the optical z-axis and capture a series of images as the first objective is driven along an optical z-axis. Such z-stack controllers are known. What is different here is that the z-stack controller is configured to capture the series of images while the first objective is in motion without requiring the first objective to be stopped as the images are being captured. This enables the time period to be significantly reduced for capturing a z-stack of images. For example, in one configuration, components of the sample stage itself only move in the x-y plane relative to the optical z-axis so as to move the sample in the x-y plane. A camera is driven along the z-axis, thus achieving the z stack with a continuous drive of the camera in the z direction.
The sample stage itself may comprises a transparent base on which the sample can be mounted, and a glide-push mechanism for sliding the sample around on a top-surface of the transparent base. This configuration enables the desired x-y motion of the sample while maintaining the desired z-positioning for the sample. It also enables the sample to be viewed through both objectives on either side of the sample stage.
The microscope may also comprising an integrated data storage unit for storing image data. A large quantity of image data can be generated very quickly by microscopes as described herein. As such, it has been found to be advantageous to provide an integrated data storage unit for storing the image data. This data may then be processed within the microscope and/or transmitted to an external device (e.g. a computing device such as a laptop, desktop computer, tablet, or smart phone) for image processing and/or viewing.
Embodiments of the invention will now be described, by way of example, with reference to the accompanying drawings, in which:
The mask 6 comprises a spatial modulator that modulates the light passing from the source 1 to the sample O. Typically the mask modulates the intensity of the light passing through it, however, it can alternatively modulate the phase or polarisation of the light.
In an embodiment the mask 6 comprises a pattern of transmissive regions and opaque or reflective regions, which modulate the intensity of the light passing through the mask. The mask is configured to enable these transmissive and reflective regions to be moved around to adjust the pattern of illumination falling on the sample O. This can be achieved for example by providing the pattern of transmissive and reflective regions on a spinning disc. Alternatively, a spatial light modulator comprising an array of adjustable micromirrors may be used.
Light emitted from the sample O (for example by reflection or fluorescence) is captured by the objective lens 4 and focussed back onto the mask 6. The light that passes through the transmissive portions of the mask 6 then passes through the beam splitter 3 and is focussed by a lens 8 onto a first detector 7, for example a CCD detector. The first detector 7 captures a first of the sample O.
The mask 6 is set at a small angle (for example a few degrees) to the optical axis X of the objective lens 4. As a result, light reflected from the reflective portions of the mask is focussed by a lens 9 onto a second detector 11, which captures a second image of the sample.
The images captured by the first and second detectors 7, 11 are transmitted to an image processing device 10, which is configured to generate a composite image based on the images captured by the first and second detectors 7, 11.
In use, the light emanating from the sample O is focussed back by the microscope objective 4 onto the mask 6, which transmits only the light falling on the transmissive areas of the mask. The transmitted image is captured by the first detector 7. The image captured by the first detector 7, which is referred to herein as the positive image, comprises a combination of a conventional image Iconv superimposed with a confocal image Iconf, where the confocal image Iconf is produced from light emanating from the focal plane of the microscope objective 4.
At the same time, light emanating from other parts of the sample O, i.e. from other planes of the sample, is reflected by the reflective portions of the spatial pattern on the rear surface of the mask 6 and is focused onto the second detector 11. The second detector 11 thus captures a second image, referred to herein as the negative image, comprising a conventional image Iconv minus the confocal image Iconf.
The positive and negative images captured by the first and second detectors 7, 11 are transmitted to the image analyser 10 which subtracts the negative image from the positive image, i.e.:
(Iconv+Iconf)−(Iconv−Iconf).
The resulting image is a confocal image from which the out of focus conventional image has been removed, as described in U.S. Pat. No. 6,687,052.
A confocal microscope according to an embodiment of the invention is shown in
In one embodiment, the microscope objective lenses 20, 22 have different magnification powers, the first microscope objective lens 20 comprising a high magnification objective, and the second microscope objective lens 22 comprising a low magnification objective that provides a wide field of view.
In the embodiment shown in
Similarly, a low magnification light path 25b from the low magnification objective 22 to the detector 26 is defined by a set of optical elements including in this embodiment a shutter 28b, mirrors 30, lenses 32 and the mask 34.
It should be noted that both the high magnification light path 25a and the low magnification light path 25b pass through the mask 34 between the respective objective lenses 20, 22 and the detector 26.
It should also be noted that the arrangement of mirrors 30 and lenses 32 shown in
The confocal microscope also includes a light source 36, which introduces a beam of light along either the high magnification light path 25a or the low magnification light path 25b, for example via a beam splitter 38. In this embodiment light from the light source 36 is introduced along the high magnification light path at a location between the detector 26 and the mask 34. The light source 26 may for example be a low coherence light source, such as a light emitting diode (LED), an incandescent lamp or an arc lamp, or a coherent light source such as a laser.
In use, light from the light source 36 passes through the mask 34 and is focussed by the high magnification objective 22 onto a focal plane within the sample O. As described previously in relation to the prior art microscope illustrated in
The encoded light emitted back from the sample O (for example, by reflection or fluorescence) is focussed by the high magnification objective 20 onto the mask 34, which transmits only the light that falls on the transmissive areas of the mask. The transmitted image is captured on a first portion 26a of the detector 26. This is the positive image, which comprises a conventional image Iconv superimposed with a confocal image Iconf, where the confocal image Iconf is produced from light emanating from the focal plane of the high magnification objective 20.
At the same time, light emanating from other parts of the sample O, i.e. not in the focal plane of the microscope objective 20, is reflected by the reflective portions of the spatial pattern of the mask 34 and is focussed onto a second portion 26b of the detector 26. The detector 26 thus captures a negative image comprising a conventional image Iconv minus the confocal image Iconf.
The positive and negative images captured by the detector 26 are transmitted to an image analyser 40 which subtracts the negative image from the positive image, producing a high magnification confocal image from which the out of focus conventional image has been removed.
Alternatively, a low magnification confocal image can be captured by detecting light that passes through the low magnification objective 22 and along the low magnification light path 25b. To capture a low magnification image, the first shutter 28a in the high magnification light path 25a is closed and the second shutter 28b in the low magnification light path 25b is opened.
The sample O is illuminated with light reflected from the second side 34b of the mask 34. As previously stated the spatial pattern carried by the mask 34 comprises a plurality of transmissive and reflective portions. The light reflected form the second side 34b is therefore encoded by the reflective portions in a similar manner to the way in which the light transmitted through the mask 34 is encoded by the transmissive portions. The encoded light reflected from the mask is focused onto the sample O by the low magnification objective 22, forming an image of the spatial pattern in a focal plane within the sample O. Preferably, the focal plane of the low magnification objective 22 is co-planar with the focal plane of the high magnification objective 20, so that both objectives 20, 22 image the same plane within the sample O.
The light emanating from the sample is focussed by the low magnification objective 22 onto the mask 34, which transmits only the light that falls on the transmissive areas of the mask. The light that falls on the reflective portions of the mask is decoded by the spatial pattern of the mask. This light forms a low magnification positive image on the first portion 26a of the detector 26.
The light that is transmitted through the transmissive portions of the mask 34 is focussed on the second portion 26b of the detector, forming a negative low magnification image. The positive and negative low magnification images are transmitted to the image analyser 40, which subtracts the negative image from the positive image, forming a low magnification confocal image from which the out of focus conventional image has been removed.
It will be apparent that by opening the first and second shutters 28a, 28b consecutively, a user can view either a low magnification confocal image or a high magnification confocal image, without making any other changes to the optical configuration of the microscope. This makes it very simple for the user to switch between a low magnification confocal image for orientation, and a high magnification confocal image of a specific area of interest within the sample. Also, by switching the first and second shutters 28a, 28b rapidly and alternately between the open and closed configurations, a pair of high and low magnification images can be captured substantially quasi-simultaneously.
Although the embodiment described above relates to a confocal microscope, the invention is also applicable to non-confocal microscopes, where it allows two different images of a sample, such as high and low magnification images, to be captured simultaneously or quasi-simultaneously. This can be achieved by replacing the spatial modulator that forms the mask 34 with a beam splitter, for example a semi-silvered mirror.
In such an arrangement, light from the source 36 falls on the beam splitter that comprises the mask 34. Part of this light will be transmitted through the mask 34 and part will be reflected. The transmitted light will pass along the high magnification optical path to the high magnification objective 20, which will focus the light onto the sample O. Light emanating from the sample O will then be captured by the high magnification objective lens 20 and will pass through the mask 34 to be focussed onto the first part 26a of the detector 26, forming a high magnification image of the sample O. Note that any light reflected from the mask 34 is not captured and the first image is a conventional image rather than a confocal image.
Similarly, low magnification image can be captured using the low magnification objective 22. To capture a low magnification image the first shutter 28a is closed to block light travelling along the high magnification light path 25a, and the second shutter 28b is opened, allowing light to travel along the low magnification light path 25b. The light reflected from the mask 34 will pass along the low magnification optical path 25b to the low magnification objective 22, which focuses the light onto the sample O. Light emanating from the sample O will then be captured by the low magnification objective lens 22 and will pass through the mask 34 to be focussed onto the second part 26b of the detector 26, forming a low magnification image of the sample O. Again, this image is a conventional image rather than a confocal image.
The examples described herein are to be understood as illustrative examples of embodiments of the invention. Further embodiments and examples are envisaged. Any feature described in relation to any one example or embodiment may be used alone or in combination with other features. In addition, any feature described in relation to any one example or embodiment may also be used in combination with one or more features of any other of the examples or embodiments, or any combination of any other of the examples or embodiments. Furthermore, equivalents and modifications not described herein may also be employed within the scope of the invention, which is defined in the claims.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/GB2020/052040 | 8/25/2020 | WO |
