Optical details of illumination

Industry

CPC
G02B21/0032

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

Current Industry

G02B21/0032Optical details of illumination

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Microscope and method for imaging an object using a microscope
- Patent number 12,228,716
- Issue date Feb 18, 2025
- Leica Microsystems CMS GmbH
- Christian Schumann
- G02 - OPTICS
Information Patent Grant
Illumination device for a confocal microscope
- Patent number 12,222,484
- Issue date Feb 11, 2025
- TOPTICA Photonics AG
- Christian Rausch
- G02 - OPTICS
Information Patent Grant
Scanning microscope unit
- Patent number 12,216,263
- Issue date Feb 4, 2025
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G02 - OPTICS
Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional fluorescence imaging system comprising single-obj...
- Patent number 12,210,144
- Issue date Jan 28, 2025
- WUHAN SMARTVIEW BIOTECHNOLOGY CO., LTD.
- Yuxuan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Acousto-optic deflector and telecommunication system
- Patent number 12,212,365
- Issue date Jan 28, 2025
- IntraAction Inc.
- Khanh Le
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,204,081
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G02 - OPTICS
Information Patent Grant
Light microscope with reconfigurable sensor array
- Patent number 12,204,082
- Issue date Jan 21, 2025
- Carl Zeiss Microscopy GmbH
- Tiemo Anhut
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 12,196,938
- Issue date Jan 14, 2025
- Nikon Corporation
- Yosuke Fujikake
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimised interferometric scattering micr...
- Patent number 12,189,104
- Issue date Jan 7, 2025
- Refeyn LTD
- Josiah Kane
- G02 - OPTICS
Information Patent Grant
Harmonics microscope for measuring glycated hemoglobin fraction of...
- Patent number 12,188,862
- Issue date Jan 7, 2025
- NATIONAL TAIWAN UNIVERSITY
- Chi-Kuang Sun
- G01 - MEASURING TESTING
Information Patent Grant
Microinstrument system and method for recording an image by fibre-o...
- Patent number 12,189,106
- Issue date Jan 7, 2025
- Carl Zeiss Meditec AG
- Delbert Peter Andrews
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning optical system and scanning-type confocal microscope
- Patent number 12,189,107
- Issue date Jan 7, 2025
- Nikon Corporation
- Yuki Yoshida
- G02 - OPTICS
Information Patent Grant
Sample observation device and sample observation method
- Patent number 12,189,108
- Issue date Jan 7, 2025
- Hamamatsu Photonics K.K.
- Satoshi Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometric scattering microscopy
- Patent number 12,189,105
- Issue date Jan 7, 2025
- Oxford University Innovation Limited
- Philipp Kukura
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for three-dimensional lightsheet imaging
- Patent number 12,181,650
- Issue date Dec 31, 2024
- ENUMERIX, INC.
- Janice Lai
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating an image by means of a microscope and corresp...
- Patent number 12,181,652
- Issue date Dec 31, 2024
- Leica Microsystems CMS GmbH
- Patric Pelzer
- G02 - OPTICS
Information Patent Grant
Apparatus and method for light field microscopy
- Patent number 12,174,357
- Issue date Dec 24, 2024
- Carl Zeiss Microscopy GmbH
- Daniel Schwedt
- G02 - OPTICS
Information Patent Grant
Method and system for mapping objects on unknown specimens
- Patent number 12,174,361
- Issue date Dec 24, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Minimally-invasive tools and methods for accessing the middle and i...
- Patent number 12,164,095
- Issue date Dec 10, 2024
- Spiral Therapeutics Inc.
- Eugene de Juan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for producing a brightness correction image and apparatus
- Patent number 12,165,300
- Issue date Dec 10, 2024
- Carl Zeiss Microscopy GmbH
- Markus Neumann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Observation apparatus
- Patent number 12,164,099
- Issue date Dec 10, 2024
- EVIDENT CORPORATION
- Kentaro Yamazaki
- G02 - OPTICS
Information Patent Grant
Device for analyzing large-area sample based on image, device for a...
- Patent number 12,159,473
- Issue date Dec 3, 2024
- SOL INC.
- Jong Muk Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope and method of microscopy for providing illumination ligh...
- Patent number 12,146,832
- Issue date Nov 19, 2024
- Carl Zeiss Microscopy GmbH
- Daniel Schwedt
- G01 - MEASURING TESTING
Information Patent Grant
Microscope, method of operating a microscope and method of imaging...
- Patent number 12,147,021
- Issue date Nov 19, 2024
- VIVENTIS MICROSCOPY SARL
- Petr Strnad
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apertureless confocal microscopy devices and methods
- Patent number 12,138,014
- Issue date Nov 12, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dongkyun Kang
- G02 - OPTICS
Information Patent Grant
Light irradiation device and sample observation apparatus
- Patent number 12,140,742
- Issue date Nov 12, 2024
- Hamamatsu Photonics K.K.
- Masanori Kobayashi
- G02 - OPTICS
Information Patent Grant
Systems and methods for confocal microscopy
- Patent number 12,135,411
- Issue date Nov 5, 2024
- Purdue Research Foundation
- Meng Cui
- G02 - OPTICS
Information Patent Grant
Non-linear optical scanning microscope having kinematic flexure mec...
- Patent number 12,135,412
- Issue date Nov 5, 2024
- PXYL Limited
- Craig James Hamilton
- G02 - OPTICS
Information Patent Grant
Arrayed visual inspectors for fiber connectors and adapters
- Patent number 12,135,458
- Issue date Nov 5, 2024
- Panduit Corp.
- Yu Huang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
COUPLING MIRROR OF AN OPTICAL INSPECTION SYSTEM
- Publication number 20250060573
- Publication date Feb 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G02 - OPTICS
Information Patent Application
OBSERVATION APPARATUS
- Publication number 20250060577
- Publication date Feb 20, 2025
- Evident Corporation
- Kentaro YAMAZAKI
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR QUANTITATIVE PHASE IMAGING FOR MULTI-PARAMETR...
- Publication number 20250052985
- Publication date Feb 13, 2025
- University of Utah Research Foundation
- Thomas A. Zangle
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE AND METHOD OF OPERATING A MICROSCOPE
- Publication number 20250052987
- Publication date Feb 13, 2025
- PreciPoint Innovation GmbH
- Dobryna Zalvidea
- G02 - OPTICS
Information Patent Application
OBSERVATION DEVICE
- Publication number 20250052988
- Publication date Feb 13, 2025
- MDAP CO., LTD.
- Hidekazu SATO
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR RAPID DEPTH-SCANNING IN LASER IMAGING
- Publication number 20250052986
- Publication date Feb 13, 2025
- Fluorescence Microscopy Business Unit (FMBU) of Bruker Nano Surfaces Division
- Selcuk Akturk
- G02 - OPTICS
Information Patent Application
AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD
- Publication number 20250044571
- Publication date Feb 6, 2025
- Standard BioTools Canada Inc.
- Daaf Sandkuijl
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20250044566
- Publication date Feb 6, 2025
- Nikon Corporation
- Hidetsugu TAKAGI
- G02 - OPTICS
Information Patent Application
LIGHT IRRADIATION DEVICE AND SAMPLE OBSERVATION APPARATUS
- Publication number 20250035901
- Publication date Jan 30, 2025
- HAMAMATSU PHOTONICS K. K.
- Masanori KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR LOCALIZING OR TRACKING EMITTERS
- Publication number 20250027880
- Publication date Jan 23, 2025
- Abberior Instruments GmbH
- Matthias REUSS
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL PHASE CONTRAST MICROSCOPE
- Publication number 20250020898
- Publication date Jan 16, 2025
- Andor Technology Limited
- Allister Pattison
- G02 - OPTICS
Information Patent Application
RE-SCAN OPTICAL SYSTEM FOR A CONFOCAL MICROSCOPE
- Publication number 20250020899
- Publication date Jan 16, 2025
- Katholieke Universiteit Leuven
- Peter DEDECKER
- G02 - OPTICS
Information Patent Application
MULTI-FOCAL LIGHT-SHEET STRUCTURED ILLUMINATION FLUORESCENCE MICROS...
- Publication number 20250013026
- Publication date Jan 9, 2025
- CHRYSANTHE PREZA
- G02 - OPTICS
Information Patent Application
MICROSCOPE, IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND I...
- Publication number 20240418971
- Publication date Dec 19, 2024
- Nikon Corporation
- Yuki TERUI
- G02 - OPTICS
Information Patent Application
IMAGING SYSTEM AND METHOD
- Publication number 20240402475
- Publication date Dec 5, 2024
- Leica Microsystems CMS GmbH
- Soeren ALSHEIMER
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR HIGH RESOLUTION MICROSCOPY
- Publication number 20240385421
- Publication date Nov 21, 2024
- Miltenyi Biotec B.V. & Co. KG
- Heinrich SPIECKER
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM FOR FOURIER PTYCHOGRAPHY
- Publication number 20240385422
- Publication date Nov 21, 2024
- Roche Diagnostics Operations, Inc.
- Wenzel Salzmann
- G02 - OPTICS
Information Patent Application
CONFOCAL MICROSCOPY APPARATUS AND METHOD FOR IMAGING A SAMPLE BY CH...
- Publication number 20240377625
- Publication date Nov 14, 2024
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Kanwarpal SINGH
- G02 - OPTICS
Information Patent Application
OPTICAL PULSE GENERATOR AND METHOD
- Publication number 20240369816
- Publication date Nov 7, 2024
- Cornell University
- Chris XU
- G02 - OPTICS
Information Patent Application
FAST SCANNING MICROSCOPE SYSTEMS, AND RELATED OPTICS AND METHODS
- Publication number 20240369817
- Publication date Nov 7, 2024
- Roger James Zemp
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL FLUORESCENCE IMAGING SYSTEM COMPRISING SINGLE-OBJ...
- Publication number 20240345375
- Publication date Oct 17, 2024
- Wuhan Smartview Biotechnology Co., Ltd.
- Yuxuan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM, SPECIFIC USE OF AN ILLUMINATION SYSTEM, ILLUMI...
- Publication number 20240345374
- Publication date Oct 17, 2024
- SCHOLLY FIBEROPTIC GMBH
- Cyril Autourde
- G02 - OPTICS
Information Patent Application
ACOUSTO-OPTIC DEFLECTOR AND TELECOMMUNICATION SYSTEM
- Publication number 20240340086
- Publication date Oct 10, 2024
- Khanh Le
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MICROINSTRUMENT SYSTEM AND METHOD FOR RECORDING AN IMAGE BY FIBRE-O...
- Publication number 20240329376
- Publication date Oct 3, 2024
- Carl Zeiss Meditec AG
- Delbert Peter ANDREWS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...
- Publication number 20240329377
- Publication date Oct 3, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...
- Publication number 20240319486
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Kenta TAKANASHI
- G02 - OPTICS
Information Patent Application
Low Cost Beam-Expanding Relay Lens
- Publication number 20240310612
- Publication date Sep 19, 2024
- CZ BIOHUB SF, LLC
- Hirofumi Kobayashi
- G02 - OPTICS
Information Patent Application
DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...
- Publication number 20240310613
- Publication date Sep 19, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G02 - OPTICS
Information Patent Application
KERATOSCOPE RELAY MECHANISM FOR AN OCT SCANNER ADAPTER
- Publication number 20240310615
- Publication date Sep 19, 2024
- LEICA MICROSYSTEMS NC, INC.
- Robert H. HART
- G02 - OPTICS
Information Patent Application
ARRAY OBJECTIVE LENS MODULE AND OPTICAL INTERFERENCE MICROSCOPY SYSTEM
- Publication number 20240310614
- Publication date Sep 19, 2024
- Industrial Technology Research Institute
- Chang Huang
- G02 - OPTICS

Optical details of illumination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Microscope and method for imaging an object using a microscope

Illumination device for a confocal microscope

Scanning microscope unit

Dark-field confocal microscopic measurement apparatus and method ba...

Three-dimensional fluorescence imaging system comprising single-obj...

Acousto-optic deflector and telecommunication system

Dark-field confocal microscopy measurement apparatus and method bas...

Light microscope with reconfigurable sensor array

Microscope

Methods and apparatus for optimised interferometric scattering micr...

Harmonics microscope for measuring glycated hemoglobin fraction of...

Microinstrument system and method for recording an image by fibre-o...

Scanning optical system and scanning-type confocal microscope

Sample observation device and sample observation method

Interferometric scattering microscopy

Methods and systems for three-dimensional lightsheet imaging

Method for generating an image by means of a microscope and corresp...

Apparatus and method for light field microscopy

Method and system for mapping objects on unknown specimens

Minimally-invasive tools and methods for accessing the middle and i...

Method for producing a brightness correction image and apparatus

Observation apparatus

Device for analyzing large-area sample based on image, device for a...

Microscope and method of microscopy for providing illumination ligh...

Microscope, method of operating a microscope and method of imaging...

Apertureless confocal microscopy devices and methods

Light irradiation device and sample observation apparatus

Systems and methods for confocal microscopy

Non-linear optical scanning microscope having kinematic flexure mec...

Arrayed visual inspectors for fiber connectors and adapters

Patents Applicationslast 30 patents

COUPLING MIRROR OF AN OPTICAL INSPECTION SYSTEM

OBSERVATION APPARATUS

SYSTEM AND METHOD FOR QUANTITATIVE PHASE IMAGING FOR MULTI-PARAMETR...

MICROSCOPE AND METHOD OF OPERATING A MICROSCOPE

OBSERVATION DEVICE

METHOD AND APPARATUS FOR RAPID DEPTH-SCANNING IN LASER IMAGING

AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD

SCANNING MICROSCOPE

LIGHT IRRADIATION DEVICE AND SAMPLE OBSERVATION APPARATUS

METHOD FOR LOCALIZING OR TRACKING EMITTERS

DIFFERENTIAL PHASE CONTRAST MICROSCOPE

RE-SCAN OPTICAL SYSTEM FOR A CONFOCAL MICROSCOPE

MULTI-FOCAL LIGHT-SHEET STRUCTURED ILLUMINATION FLUORESCENCE MICROS...

MICROSCOPE, IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND I...

IMAGING SYSTEM AND METHOD

METHOD AND APPARATUS FOR HIGH RESOLUTION MICROSCOPY

OPTICAL SYSTEM FOR FOURIER PTYCHOGRAPHY

CONFOCAL MICROSCOPY APPARATUS AND METHOD FOR IMAGING A SAMPLE BY CH...

OPTICAL PULSE GENERATOR AND METHOD

FAST SCANNING MICROSCOPE SYSTEMS, AND RELATED OPTICS AND METHODS

THREE-DIMENSIONAL FLUORESCENCE IMAGING SYSTEM COMPRISING SINGLE-OBJ...

ILLUMINATION SYSTEM, SPECIFIC USE OF AN ILLUMINATION SYSTEM, ILLUMI...

ACOUSTO-OPTIC DEFLECTOR AND TELECOMMUNICATION SYSTEM

MICROINSTRUMENT SYSTEM AND METHOD FOR RECORDING AN IMAGE BY FIBRE-O...

DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...

OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...

Low Cost Beam-Expanding Relay Lens

DIFFERENTIAL DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS...

KERATOSCOPE RELAY MECHANISM FOR AN OCT SCANNER ADAPTER

ARRAY OBJECTIVE LENS MODULE AND OPTICAL INTERFERENCE MICROSCOPY SYSTEM