Claims
- 1. A plasma processing method comprising the steps of:
- introducing a reactive gas comprising hydrogen gas and a carbon containing raw material gas into a reaction chamber
- introducing a microwave into said chamber;
- establishing a magnetic field in said reaction chamber;
- causing a cyclotron resonance by said microwave and said magnetic field within said reaction chamber thereby forming a plasma of carbon and hydrogen containing gas; and
- treating a substrate with said plasma,
- wherein said substrate is not intentionally heated during the treating of said substrate with said plasma and wherein a combination of crystalline and amorphous carbon is formed on a surface of said substrate while an etching step is simultaneously performed on said amorphous carbon by hydrogen plasma during the treating of said substrate with the plasma to leave only crystalline carbon on said substrate.
- 2. The method of claim 1 wherein said substrate has a surface made of an organic material.
- 3. The method of claim 2 wherein said organic material is an organic photosensitive material.
- 4. The method of claim 1 wherein a temperature of said substrate is maintained at -100.degree. to 200.degree. C.
- 5. A plasma processing method comprising the steps of:
- introducing a reactive gas comprising a carbon containing raw material gas and hydrogen gas into a reaction chamber,
- causing a cyclotron resonance by introducing a microwave and a magnetic field with said reactive chamber to form a plasma of carbon and hydrogen containing gas, and
- treating a substrate with said plasma,
- wherein said substrate is cooled during said treating and a combination of crystalline and amorphous carbon material from said raw material gas is formed on a surface of said substrate while an etching step is simultaneously performed on said amorphous carbon material by said hydrogen plasma during the treating of said substrate with the plasma to leave only crystalline carbon on said substrate.
- 6. The method of claim 5 wherein said substrate has a surface made of an organic material.
- 7. The method of claim 6 wherein said organic material is an organic photosensitive material.
- 8. The method of claim 5 wherein a temperature of said substrate is maintained at -100.degree. to 200.degree. C.
- 9. The method of claim 5 wherein a temperature of said substrate is maintained at -100.degree. to 0.degree. C.
- 10. The method of claims 5 wherein a temperature of said substrate is maintained at 100.degree. C.-200.degree. C.
- 11. A plasma processing method comprising the steps of:
- introducing a reactive gas including a carbon containing raw material gas and hydrogen gas into a reaction chamber;
- introducing a microwave into said reaction chamber;
- establishing a magnetic field in said reaction chamber;
- causing a cyclotron resonance by said microwave and said magnetic field within said reaction chamber thereby forming a plasma of said carbon and hydrogen containing gas;
- placing an object to be treated with plasma at or in the vicinity of said portion where the cyclotron resonance occurs; and
- performing a plasma treatment on said object with the plasma of said reactive gas,
- wherein a combination of crystalline and amorphous carbon material from the plasma of said raw material gas is formed on a surface of said object while an etching step is simultaneously performed on said amorphous carbon material by the plasma of said hydrogen during said plasma treatment.
- 12. The method of claim 11 wherein the strength of the magnetic field at the surface of said object is .+-.21.2% of that required for causing said cyclotron resonance.
- 13. A plasma processing method comprising the steps of:
- locating an object in a reaction chamber;
- introducing a reactive gas comprising a raw material gas and an etchant gas into said reaction chamber;
- establishing a magnetic field within said reaction chamber;
- apply microwave radiation to said raw material gas in order to cause a cyclotron resonance by the interaction of said magnetic field and said RF power to thereby form a plasma of raw material gas and etchant gas; and
- treating said object with plasma,
- wherein a deposition of material from the plasma of said raw material gas is formed on a surface of said object while an etching step is simultaneously performed on said material by said etchant gas during the treating of said object with the plasma.
- 14. A plasma processing method comprising the steps of:
- locating an object with a reaction chamber;
- introducing a reactive gas comprising a raw material gas and an etchant gas into said reaction chamber;
- introducing a magnetic field in said chamber;
- inputting a microwave into said reaction chamber in order to create a cyclotron resonance between said magnetic field and said microwave to convert said reactive gas to a raw material gas plasma and an etchant gas plasma;
- treating said object with said plasma,
- wherein a deposition of material from said material gas plasma is formed on a surface of said object while an etching step is simultaneously performed on said material by said etchant gas plasma during the treating of said object with the plasma.
- 15. The method of claim 14 wherein the reactive gas includes hydrogen and carbon, and said deposition material is a combination of crystalline and amorphous carbon and hydrogen plasma created by said microwave etches away said amorphous carbon.
Priority Claims (1)
Number |
Date |
Country |
Kind |
62-28957 |
Feb 1987 |
JPX |
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Parent Case Info
This application is a continuation of Ser. No. 08/016,674, filed Feb. 11, 1993, now abandoned; which itself is a divisional of Ser. No. 07/765,476, filed Sep. 26, 1991, now abandoned; which is a continuation of Ser. No. 07/496,180, filed Mar. 20, 1990, now abandoned; which is a continuation of Ser. No. 07/154,287, filed Feb. 10, 1988, now abandoned.
US Referenced Citations (25)
Foreign Referenced Citations (3)
Number |
Date |
Country |
60-33300 |
Feb 1985 |
JPX |
61-121859 |
Jun 1986 |
JPX |
62-123096 |
Jun 1987 |
JPX |
Non-Patent Literature Citations (2)
Entry |
Matsuo, S. and M. Kivchi, "Low Temperature Chemical Vapor Deposition Method Utliizing an Electron Cyclotron Resonance Plasma". Japanese Journal of Applied Physics vol. 22, No. 4, Apr. 1983, pp. 210-212. |
Kawarada et al, Jpn. J. Appl. Phys. vol. 26, No. 6, Jun. 1987, pp. L1032-L1034. |
Divisions (1)
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Number |
Date |
Country |
Parent |
765467 |
Sep 1991 |
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Continuations (3)
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Number |
Date |
Country |
Parent |
16674 |
Feb 1993 |
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Parent |
496180 |
Mar 1990 |
|
Parent |
154287 |
Feb 1988 |
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