Number | Date | Country | Kind |
---|---|---|---|
00 04174 | Mar 2000 | FR |
Number | Name | Date | Kind |
---|---|---|---|
3430112 | Hilbourne | Feb 1969 | A |
4282539 | Schrader | Aug 1981 | A |
5132755 | Ueno | Jul 1992 | A |
5357137 | Hayama | Oct 1994 | A |
5424571 | Liou | Jun 1995 | A |
5777370 | Omid-Zohoor et al. | Jul 1998 | A |
5950090 | Chen et al. | Sep 1999 | A |
5953621 | Gonzalez et al. | Sep 1999 | A |
5994202 | Gambino et al. | Nov 1999 | A |
6022781 | Noble et al. | Feb 2000 | A |
6077748 | Gardner et al. | Jun 2000 | A |
6235596 | Liao | May 2001 | B1 |
6261924 | Mandelman et al. | Jul 2001 | B1 |
6281562 | Segawa et al. | Aug 2001 | B1 |
Number | Date | Country |
---|---|---|
2641334 | Mar 1978 | DE |
05029310 | Feb 1993 | JP |
Entry |
---|
Tang et al., “Intrinsic MOSFET Parameter Fluctuations Due to Random Dopant Placement,” IEEE, 5(4): pp. 369-376, Dec., 1997. |