Number | Name | Date | Kind |
---|---|---|---|
2834920 | Lennox et al. | May 1958 | |
3144770 | Sheely | Aug 1964 | |
3148349 | Rose et al. | Sep 1964 | |
3289478 | Tokunaga et al. | Dec 1966 | |
4258570 | Weiler | Mar 1981 |
Number | Date | Country |
---|---|---|
0536421 | Jan 1957 | CAX |
Entry |
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"Automated Transformer Temperature Rise Tester", A. L. Sandeen et al., IBM Technical Disclosure Bulletin, vol. 22, No. 6 (11/1979). |
"Electronics Circuits Discrete & Integrated", by Donald L. Schilling and Charles Belove, pp. 42-49, (Diode Circuit Analysis) McGraw Hill Co., 1968. |