| Number | Name | Date | Kind |
|---|---|---|---|
| 2834920 | Lennox et al. | May 1958 | |
| 3144770 | Sheely | Aug 1964 | |
| 3148349 | Rose et al. | Sep 1964 | |
| 3289478 | Tokunaga et al. | Dec 1966 | |
| 4258570 | Weiler | Mar 1981 |
| Number | Date | Country |
|---|---|---|
| 0536421 | Jan 1957 | CAX |
| Entry |
|---|
| "Automated Transformer Temperature Rise Tester", A. L. Sandeen et al., IBM Technical Disclosure Bulletin, vol. 22, No. 6 (11/1979). |
| "Electronics Circuits Discrete & Integrated", by Donald L. Schilling and Charles Belove, pp. 42-49, (Diode Circuit Analysis) McGraw Hill Co., 1968. |