Number | Name | Date | Kind |
---|---|---|---|
3781829 | Singh | Dec 1973 | |
4503537 | McAnney | Mar 1985 | |
4759021 | Kawaguchi et al. | Jul 1988 | |
4849702 | West et al. | Jul 1989 | |
4897838 | Tateishi | Jan 1990 | |
4912340 | Wilcox et al. | Mar 1990 | |
4945536 | Honcu | Jul 1990 | |
5043986 | Argawal et al. | Aug 1991 | |
5159598 | Welles, II et al. | Oct 1992 | |
5265102 | Saito | Nov 1993 |
Entry |
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"Self-Testing of Multichip Logic Modules", Paul H. Bardell and William H. McAnney, IBM Corp., 1982 IEEE Test Conference. |