This is a division of application Ser. No. 07/787,071 filed on Nov. 4, 1991, now U.S. Pat. No. 5,338,361.
Number | Name | Date | Kind |
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RE33741 | Boissevain | Nov 1991 | |
3228282 | Barker, Jr. | Jan 1966 | |
3405268 | Brunton | Oct 1968 | |
3455637 | Howard | Jul 1969 | |
3476482 | Howard et al. | Nov 1969 | |
3525863 | Constantine et al. | Aug 1970 | |
3614450 | Hill et al. | Oct 1971 | |
3641349 | Dahlin | Feb 1972 | |
3662170 | Keyes, IV | May 1972 | |
3675019 | Hill et al. | Jul 1972 | |
3793524 | Howarth | Feb 1974 | |
3801349 | Wilson et al. | Apr 1974 | |
3827808 | Cho | Aug 1974 | |
3851175 | Dahlin et al. | Nov 1974 | |
3879607 | Bjorklund | Apr 1975 | |
3965356 | Howarth | Jun 1976 | |
3994602 | Howarth | Nov 1976 | |
4006358 | Howarth | Feb 1977 | |
4098641 | Casey et al. | Jul 1978 | |
4135006 | Readal et al. | Jan 1979 | |
4243882 | Yasujima et al. | Jan 1981 | |
4277177 | Larsen et al. | Jul 1981 | |
4306151 | Chase | Dec 1981 | |
4319847 | Howarth | Mar 1982 | |
4345150 | Tamura et al. | Aug 1982 | |
4577104 | Sturm | Mar 1986 | |
4674325 | Kiyobe et al. | Jun 1987 | |
4732776 | Boissevain | Mar 1988 | |
4743775 | Edgar | May 1988 | |
4766315 | Hellstrom et al. | Aug 1988 | |
4769544 | Dahlquist | Sep 1988 | |
4789820 | Parrent, Jr. et al. | Dec 1988 | |
4823008 | Sturm | Apr 1989 | |
4840706 | Campbell | Jun 1989 | |
4928013 | Howarth et al. | May 1990 | |
4957770 | Howarth | Sep 1990 | |
5124552 | Anderson | Jun 1992 |
Number | Date | Country |
---|---|---|
1196512 | Nov 1985 | CAX |
0137696 | Jul 1984 | EPX |
0279743 | Aug 1988 | EPX |
2128273 | Jun 1971 | DEX |
2318032 | Oct 1973 | DEX |
2845995 | Apr 1979 | DEX |
3014774 | Oct 1981 | DEX |
53-39194 | Oct 1978 | JPX |
59-120940 | Jul 1984 | JPX |
1102062 | Feb 1968 | GBX |
2044443 | Oct 1980 | GBX |
2127871 | Apr 1984 | GBX |
1182353 | Sep 1985 | SUX |
Entry |
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Wesley Wm. Wendlandt and Harry G. Hecht, Reflectance Spectroscopy (1966), pp. 46-90. |
K. Takami and C. Shinbo, Thickness measurement method for thin photoresist film on transparent material, Rev. Sci. Instrum. 54(6), Jun. 1983, pp. 690-694. |
Patent Abstracts of Japan, vol. 10, No. 305, (P-507)[2361], Oct. 17, 1986, (JP 61-120004). |
Patent Abstracts of Japan, vol. 10, No. 215, (P-481)[2271], Jul. 26, 1986, (JP 61-53549). |
Vakulyuk et al., Infrared Water-Content Meter for Paper, Measurement Techniques, vol. 19, No. 7, pp. 1065-1066, Jul. 1976. |
Pugh, The Infrared Measurement of Surface Moisture in Paper, Tappi, vol. 63, No. 10, pp. 131-134, Oct. 1980. |
Number | Date | Country | |
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Parent | 787071 | Nov 1991 |