1. Field of the Invention
The embodiments described herein relate generally systems for detecting an object and, more particularly, to X-ray diffraction imaging systems.
2. Description of Related Art
At least some known detection systems are used at travel checkpoints to inspect containers, such as carry-on luggage and/or checked luggage, for concealed contraband, such as weapons, narcotics, and/or explosives. At least some such detection systems include X-ray imaging systems. An X-ray imaging system includes an X-ray source that transmits X-rays through a container towards a detector. An output of the detector is processed to identify a set of objects and/or materials within the container. In addition, at least some known detection systems include X-ray diffraction imaging (XDi) systems. At least some known XDi systems use inverse fan-beam geometry (a large source and a small detector) and a multi-focus X-ray source (MFXS) to detect objects and/or materials. Further, some known XDi systems provide an improved discrimination of materials, as compared to that provided by other known X-ray imaging systems, by measuring d-spacings between lattice planes of micro-crystals in materials. X-ray diffraction may also yield data from a molecular interference function that may be used to identify other materials, such as liquids, in the container.
At least some known detection systems have a Multiple Inverse Fan Beam (MIFB) XDi topology. The conventional MIFB topology directs X-ray beams from a certain focus point of an MFXS via a Multi Point Primary Collimator (MuPiC) onto a fixed array of target points at a detector plane. The MuPiC includes a single row of apertures that generate primary pencil beams directed to each target point in the detector plane. The primary beams propagate in an X-Y plane through the container, and interactions between the primary beams and the container induce coherent scattering. Scattered rays of radiation pass through a Fixed Angle Secondary Collimator (FASC), which collimates the scattered rays to make a constant dihedral scatter angle θ to the X-Y plane. Thus, the scattered rays that are incident on coherent scatter detectors satisfy the conditions for fixed angle, energy dispersive X-ray diffraction. The momentum transfer p is given by the following relationship:
where E is photon energy, h is Planck's constant, c is the speed of light, and θ is a scatter angle. The energy spectrum of the scatter rays, after appropriate processing, corresponds to an X-ray diffraction (XRD) profile of a material lying in a sensitive volume of the container; namely, intersection regions of primary beam paths and scattered ray paths. The only moving component of a known XDi detection system is a conveyor belt that transports the container in a Z-direction that is perpendicular to an X-Y plane.
There is unfortunately an inter-detector cross-talk issue in the conventional MIFB topology. Cross-talk is produced when a scattered ray from a primary beam generated, e.g., by an I-th source focus directed to a J-th target point, is received at a J±1-th transmission detector element. Conventionally, in order to minimize cross-talk, a separation between transmission detector elements can be increased. However, increasing the spacing between transmission detector elements has at least two negative consequences. First, a total number of MIFB transmission detector elements decreases, which adversely affects a scatter signal. Second, a near detector intersection point of inverse fan beams to neighboring target points is moved closer to an X-ray multisource, which ultimately leads to container regions being missed during a scan.
As such, it is desirable to increase a spacing between detector elements without decreasing a number of detector elements. Further, it is desirable to increase a spacing between detector elements without moving near detector intersection points closer to a radiation source.
In one aspect, a detection system is provided. The detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.
In another aspect, a method for detecting an object is provided. The method includes generating X-ray radiation from a radiation source, forming the X-ray radiation into first X-ray beams within a first plane and second X-ray beams within a second plane different than the first plane, and detecting the first X-ray beams at a first row of transmission detector elements of a transmission detector and the second X-ray beams at a second row of transmission detector elements of the transmission detector.
In yet another aspect, a primary collimator for use with an X-ray detection system is provided. The primary collimator defines a first row of apertures within a first plane and a second row of apertures within a second plane different than the first plane. The first row of apertures is configured to form first X-ray beams within the first plane, and the second row of apertures is configured to form second X-ray beams within the second plane.
By providing a multiple plane, such as a dual plane, multi-inverse fan beam topology, the embodiments described herein enable adjacent detector elements to be placed arbitrarily close to one another in a lengthwise (Y) dimension, while minimizing or eliminating inter-detector cross-talk.
A detection system having a multiple plane, such as a dual plane, multi-detector inverse fan beam (MIFB) 3rd Generation X-ray Diffraction Imaging (XDi) topology is described herein. The embodiments described herein allow neighboring detector elements to be placed arbitrarily close to each other in a lengthwise (Y) direction, while reducing inter-detector cross-talk that is present in conventional MIFB systems. The embodiments described herein can be considered a “Hi-Fi MIFB” detection system. The Hi-Fi MIFB detection system minimizes cross-talk whilst increasing a total detector signal, thus, improving a detection rate and/or a false alarm rate. Moreover, the embodiments described herein simplify technological realization of a secondary collimator.
Referring to
One or more transmission detectors 120 and one or more scatter detectors 122 are each in electronic communication with a number of channels 124, for example, N number of channels C1, . . . CN, wherein N is selected based on the configuration of detection system 100. Channels 124 electronically communicate data collected by transmission detector 120 and scatter detector 122 to a control system 126. In the exemplary embodiment, control system 126 combines an output from transmission detector 120 and an output from scatter detector 122 to generate information about object 114 and/or contents of object 114 positioned within examination area 110. For example, but not by way of limitation, control system 126 may generate multi-view projections and/or section images of object 114 in examination area 110 that identify a location in object 114 of specific materials detected by XDi analysis.
In the exemplary embodiment, control system 126 includes a processor 128 in electrical communication with transmission detector 120 and scatter detector 122. Processor 128 is configured to receive from scatter detector 122 output signals representative of detected X-ray quanta and to generate a distribution of momentum transfer values, x, from a spectrum of energy, E, of X-ray quanta within scattered radiation detected by scatter detector 122. As used herein, the term “processor” is not limited to integrated circuits referred to in the art as a processor, but broadly refers to a computer, a microcontroller, a microcomputer, a programmable logic controller, an application specific integrated circuit, and any other suitable programmable circuit. The computer may include a device, such as a floppy disk drive, a CD-ROM drive and/or any suitable device, for reading data from a suitable computer-readable medium, such as a floppy disk, a compact disc-read only memory (CD-ROM), a magneto-optical disk (MOD), or a digital versatile disc (DVD). In alternative embodiments, processor 128 executes instructions stored in firmware.
Referring to
In the exemplary embodiment, crossing points 133 are each located above a top edge 135 of secondary collimator 118. As such, separate secondary collimators 118 can be used for each fan beam 132, although secondary collimator 118 is illustrated as one piece with several portions 137, wherein each portion 137 collimates a respective fan beam 132. In contrast, in known XDi systems that generate inverse fan beams, crossing points are located at or just below a top edge of a secondary collimator, which dose not allow separate secondary collimators to be use because side walls of the separate secondary collimators would prevent at least some of the pencil beams in the fan from being detected at a scatter detector.
Referring to
Primary collimator 116 is configured to form primary beams 102 in at least two planes. In the exemplary embodiment, primary collimator 116 is configured to form primary beams in first plane 104 and second plane 106, as shown in
In the exemplary embodiment, apertures 140 in first row 142 are staggered from apertures 140 in second row 144. More specifically, each aperture 140 in first row 142 is offset in a lengthwise direction from adjacent apertures 140 in second row 144 to produce a staggered arrangement of apertures 140. As such, every other primary beam 102 is in the same plane, and every adjacent primary beam 102 is in a different plane. The staggered arrangement of the exemplary embodiment facilitates reducing cross-talk between primary beams 102
Transmission detector 120 includes a plurality of transmission detector elements 146 configured to receive primary beams 102. More specifically, as shown in
In the exemplary embodiment, transmission detector elements 146 in first row 148 are staggered from transmission detector elements 146 in second row 150 to substantially match a configuration of apertures 140 of primary collimator 116. More specifically, each transmission detector element 146 in first row 148 is offset in a lengthwise direction from adjacent transmission detector elements 146 in second row 150 to produce a staggered arrangement of transmission detector elements 146. The staggered arrangement of the exemplary embodiment facilitates reducing cross-talk between primary beams 102.
Referring again to
Scatter detector 122 includes at least one scatter detector module. In the exemplary embodiment, scatter detector 122 includes one scatter detector module for each plane of primary beams 102. More specifically, scatter detector 122 includes a first scatter detector module 156 configured to receive scattered radiation 152 from first X-ray beams 136 and a second scatter detector module 158 configured to receive scattered radiation 154 from second X-ray beams 138. Each scatter detector modules 156 and 158 includes a plurality of scatter detector elements 159 as described in more detail below.
First scatter detector module 156 is not positioned within first plane 104, and second scatter detector module 158 is not positioned within second plane 106. In the exemplary embodiment, first scatter detector module 156 is spaced apart in the widthwise direction along Z-axis 54 from second scatter detector module 158. Further, first scatter detector module 156 is at an angle γ to second scatter detector module 158. Angle γ is dependent of a number of planes and a value of angle α. For example, for the bi-plane geometry illustrated in
In the exemplary embodiment, first scatter detector module 156 and second scatter detector module 158 are positioned between transmission detector elements 146 in first plane 104 and transmission detector elements 146 in second plane 106, as shown in
Referring to
Referring to
For example, in a conventional MIFB topology having twenty-five (25) beams, an inter-detector spacing distance is typically 100 millimeters (mm). In detection system 100 having a dual plane high fidelity (Hi Fi) topology, distance d is approximately 200 mm. Generally, in the conventional MIFB system, near detector crossing points of a multiplicity of inverse fan beams are chosen to lie on a line somewhat below conveyor belt at or slightly below a top edge of a secondary collimator. Such an arrangement requires that all scatter detector modules 156 and 158 must share one continuous FASC in a Y-direction. In contrast, in detection system 100 having the dual plane MIFB topology, an inter-detector spacing distance d for transmission detector elements 146 belonging to a certain plane is doubled relative to that of a system having conventional MIFB. Hence, near detector crossing points 133 of a multiplicity of inverse fan beams 132 of detection system 100 lie within examination area 110 and above top edge 135 of FASC 118. This implies that each scatter detector module 156 and 158 may have a dedicated FASC 118 that is more compact and, thus, easier to manufacture than the common FASC of the conventional MIFB system.
In the exemplary embodiment, a primary collimator 204 includes first row 142 of apertures 140, second row 144 of apertures 140 and a third row 206 of apertures 140. As shown in
Similarly, as shown in
Referring to
At least one secondary collimator collimates scattered radiation before the scattered radiation is received at a scatter detector module. More specifically, in the exemplary embodiment, detection system 200 includes a first secondary collimator 218 to collimate scattered radiation 152 at scatter angle θ, a second secondary collimator 220 to collimate scattered radiation 154 at scatter angle θ, and a third secondary collimator 222 to collimate scattered radiation 216 at scatter angle θ. Although each set of a scatter detector module and a secondary collimator is shown as being positioned on a left side a respective set of X-ray beams, it should be understood that any scatter detector module/secondary collimator set may be positioned to a right side of a respective set of X-ray beams. Further, it should be understood that a scatter detector module/secondary collimator set may be positioned on each side of a respective set of X-ray beams.
In most cases detection system 100 (shown in
Referring to
The X-ray radiation is formed 304 into first X-ray beams 136 within first plane 104 and second X-ray beams 138 within second plane 106. First X-ray beams 136 and second X-ray beams 138 are considered to be sub-sets of primary beams 102. In the exemplary embodiment, first X-ray beams 136 and second X-ray beams 138 are formed 304 by collimating the X-ray radiation into first X-ray beams 136 using first row 142 of apertures 140 of primary collimator 116 and collimating the X-ray radiation into second X-ray beams 138 using second row 144 of apertures 140 of primary collimator 116. The collimation of primary beams 102 forms first X-ray beams 136 and second X-ray beams 138 such that every other beam is within a same plane and every adjacent beam is in a different plane.
Method 300 further includes detecting 306 first X-ray beams 136 at first row 148 of transmission detector elements 146 of transmission detector 120 and detecting second X-ray beams 138 at second row 150 of transmission detector elements 146 of transmission detector 120. For example, when one focus point 130 is activated, radiation passes through each aperture 140 of primary collimator 116 and is detected 306 at each transmission detector element 146 of transmission detector 120. Transmission detector 120 outputs 308 transmission data based on the detected radiation. The transmission data can be output 308 to any suitable component, including, without limitation, a display device, a reconstruction device, and/or a storage device. The transmission data can be used to reconstruct an image of object 114 and/or items within object 114.
Upon interacting with object 114, first X-ray beams 136 produce scattered radiation 152 and second X-ray beams 138 produce scattered radiation 154. Scattered radiation 152 is detected 310 at first scatter detector module 156, and scattered radiation 154 is detected 310 at second scatter detector module 158. Secondary collimator 118 prevents scattered radiation at an angle other than scatter angle θ from reaching first scatter detector module 156 and second scatter detector module 158. Scatter detector 122 outputs 312 scatter data based on the detected scattered radiation. The scatter data can be output 312 to any suitable component, including, without limitation, a display device, an analysis device, and/or a storage device. The scatter data can be used to perform an X-ray diffraction analysis of object 114 to detect at least one material within object 114.
The embodiments described herein provide a detection system that increases the spacing between detector elements of a transmission detector without decreasing the number of detector elements. More specifically, by providing more than one row of primary collimator apertures, more than one row of detector elements can be used to detect attenuated radiation. For example, by staggering the positions of the apertures and the detector elements, the length and number of detector elements remains the same as in a conventional MIFB system, while increasing the spacing between adjacent detector elements. Further, the multiple rows of apertures and detector elements increase the spacing between detector elements without moving near detector intersection points closer to a radiation source.
Moreover, the embodiments described herein enable a detection system to more easily be manufactured, as compared to convention MIFB system. For example, when an angle between X-ray beam planes is substantially twice a scatter angle, the above-described detection system can be manufactured as one unit with parallel channels for both primary beam planes. Further, the only limitation on the angle between X-ray beam planes, is that the angle should be large enough such that each scatter detector module only detects scatter from a respective primary beam.
A technical effect of the systems and method described herein includes at least one of: (a) generating X-ray radiation from an X-ray source; (b) forming X-ray radiation into first X-ray beams within a first plane and second X-ray beams within a second plane different than the first plane; (c) detecting scattered radiation from first X-ray beams at a first row of scatter detector elements of a scatter detector and scattered radiation from second X-ray beams at a second row of scatter detector elements of the scatter detector; and (d) detecting first X-ray beams at a first row of detector elements of a transmission detector and second X-ray beams at a second row of detector elements of the transmission detector.
Exemplary embodiments of a multiple plane multi-inverse fan-beam detection systems and method for using the same are described above in detail. The method and systems are not limited to the specific embodiments described herein, but rather, components of systems and/or steps of the method may be utilized independently and separately from other components and/or steps described herein. For example, the primary collimator and/or transmission detector may also be used in combination with other X-ray systems and methods, and are not limited to practice with only the X-ray diffraction systems and methods as described herein. Rather, the exemplary embodiment can be implemented and utilized in connection with many other object detection applications.
Although specific features of various embodiments of the invention may be shown in some drawings and not in others, this is for convenience only. In accordance with the principles of the invention, any feature of a drawing may be referenced and/or claimed in combination with any feature of any other drawing.
This written description uses examples to disclose the invention, including the best mode, and also to enable any person skilled in the art to practice the invention, including making and using any devices or systems and performing any incorporated methods. The patentable scope of the invention is defined by the claims, and may include other examples that occur to those skilled in the art. Such other examples are intended to be within the scope of the claims if they have structural elements that do not differ from the literal language of the claims, or if they include equivalent structural elements with insubstantial differences from the literal language of the claims.