Nanotechnology is a rapidly growing field of technology, including the development of so called nanotubes. Due to the inherently small size of the devices involved in this field of technology, nanotechnology would be ideal for applications within for example the field of electronics, for example within the semiconductor field. Memory devices are one example of an application which would benefit greatly from nanotechnology.
There is thus a need for a device in the nanoscale size which could serve as a multi-state logical switch or a memory element.
This need is met by the present invention in that it provides a nanotube device comprising a nanotube with a longitudinal and a lateral extension, a structure for supporting at least a first part of the nanotube, and first means for exerting a force upon the nanotube in a first direction defined by its lateral extension. At least a second part of the nanotube protrudes beyond the support of said structure, so that when said force exceeds a certain level, the second part of the nanotube will flex in the direction of its lateral extension, and thereby close a first electrical circuit.
Suitably, the first means for exerting said force upon the nanotube is an electrical means, the force being created by applying a voltage to the means.
The invention will be described in more detail below, with reference to the appended drawings, in which:
The device further includes a structure 130, made of a non-conducting material such as for example silicon, Si, which supports at least a first portion of the nanotube, with another second portion of the nanotube protruding beyond the supporting structure, and thus being unsupported. The first, supported, portion of the nanotube is connected to an electrode 110, referred to from now on as the source electrode.
The supporting structure 130 is suitably shaped as a terrace, and thus has a “step-like” structure, with an upper level 130″, and a lower level 130′, where the two levels are interconnected by a wall-like shape of the structure 110. The difference in height between the two levels 130′, 130″ of the structure as defined by the height of the wall is referred to by the letter h. It should be noted that the use of the word “level” throughout this description refers to a difference in dimensions which gives the structure a preferably step-like form either in the horizontal or in the vertical orientation of the device.
On the lower level 130′ of the structure, there are arranged two additional electrodes, one being referred to as the gate electrode 140, and the other as the drain electrode, 150. The gate electrode is located at a distance LG to the nearest point of the wall, and the corresponding distance for the drain electrode is denoted as LD, where LG suitably is smaller than LD.
The total extension of the protruding part of the nanotube is preferably within the interval of 50 to 150 nm, suitably of the order of approximately 100 nm, with the height h being approximately in the order of size of 3 nm.
When a voltage is applied to the gate electrode 140, a resulting capacitive force will act on the nanotube 120, in the direction towards the gate electrode, which is thus a direction defined by the lateral extension of the nanotube, in the picture perceived as a “downwards” direction. The force, denoted as Fc, may be described by the mathematical formula seen below:
In this formula, QG+QD is the excess charge on the nanotube, CG and CD are capacitances which will be explained in more detail below with reference to
The resistance RT can be expressed by the formula seen below:
RT=R0e((h−x)/λ)
R0 is estimated from experimental results, and can be said to be of the order of tens to hundreds of kiloohms, and the tunneling length, λ, is typically in the order of 0.5 Å. The distance x can, as will be realized, be varied by varying the voltage VG applied to the gate.
The time required to make a transition from the “on”-state to the “off”-state for the device in
The embodiment 500 comprises essentially all of the features of the device in
The second gate and drain electrodes are located at distances LG2 and LD2 respectively from the wall of the terraced structure.
Although the invention has been described with reference to examples of certain embodiments, the invention may be varied within the scope of the appended claims.
Number | Date | Country | Kind |
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0200868-8 | Mar 2002 | SE | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/SE02/00853 | 5/2/2002 | WO | 6/27/2005 |