Claims
- 1. An electrophotographic device comprising:
- (1) an electrically conductive substrate,
- (2) a barrier-charge transport layer comprising aluminum oxide, wherein said layer comprises a non-porous barrier zone adjacent said substrate and a porous charge transport zone, and
- (3) a photoconductive insulator layer of less than two micrometers adjacent the porous charge transport zone of said barrier-charge transport layer.
- 2. The device of claim 1 wherein the barrier-charge transport layer is at least 0.15 micrometers thick, the pore diameters of the porous zone are between 0.007 and 0.040 micrometers, the center-to-center spacing of the pores is from 0.010 to 0.400 micrometers, and the photoconductive insulator layer is less than 1.0 micrometers thick.
- 3. The device of claim 2 wherein said non-porous zone is between 0.003 and 0.05 micrometers thick.
- 4. The device of claim 1 wherein said photoconductive insulator layer is selected from the class consisting of inorganic crystalline photoconductors, inorganic photoconductive glasses, and organic photoconductors and the pore diameters of the porous zone are between 0.007 and 0.040 micrometers, and the average center-to-center spacing of the pores is from 0.010 to 0.080 micrometers.
- 5. The device of claim 3 wherein said photoconductive insulator layer is selected from the class consisting of inorganic crystalline photoconductors, inorganic photoconductive glasses, and organic photoconductors.
- 6. The device of claim 5 wherein said photoconductive insulator layer is at least 0.05 micrometers and less than 1.0 micrometers in thickness.
- 7. The device of claim 1 wherein said photoconductive insulator layer is at least 0.10 micrometers and less than 1.0 micrometers in thickness.
- 8. The device of claim 6 wherein said photoconductive insulator layer comprises cadmium sulfide, cadmium sulfoselenide, cadmium selenide or mixtures thereof.
- 9. The device of claim 7 wherein said photoconductive insulator layer comprises cadmium sulfide, cadmium sulfoselenide, cadmium selenide, or mixtures thereof.
- 10. The device of claim 6 wherein said substrate is selected from the group consisting of metal, metal coated polymeric resin, conductive polymeric resin, conductive polymeric resin coated onto a polymeric resin, conductive particle filled polymeric resin, and mixtures thereof.
- 11. The device of claim 1 wherein said photoconductive insulator layer is between 0.10 and 1.0 micrometers in thickness and comprises a photoconductor selected from the class consisting of inorganic crystalline photoconductors, inorganic photoconductive glasses and organic photoconductors, and wherein said barrier-charge transport layer is between 0.15 and 25 micrometers, the barrier zone of said barrier-charge transport layer is between 0.006 and 0.03 micrometers, the pore diameters of said porous zone are between 0.008 and 0.030 micrometers and the center-to-center spacing of said pores is between 0.020 and 0.060 micrometers.
- 12. An electrophotographic device comprising:
- (1) an electrically conductive substrate,
- (2) a barrier-charge transport layer comprising aluminum oxide, wherein said layer comprises a non-porous barrier zone adjacent said substrate and a porous charge transport zone, and
- (3) a photoconductive insulator layer of less than two micrometers adjacent the porous charge transport zone of said barrier-charge transport layer
- wherein the barrier-charge transport layer is at least 0.15 micrometers thick, the pore diameters of the porous zone are between 0.007 and 0.040 micrometers, the center-to-center spacing of the pores is from 0.010 to 0.400 micrometer, and the photoconductive insulator layer is less than 2.0 micrometers thick.
- 13. The device of claim 12 wherein said photoconductive insulator layer is between 0.10 and 1.0 micrometers in thickness and comprises a photoconductor selected from the class consisting of inorganic crystalline photoconductors, inorganic photoconductive glasses and organic photoconductors, and wherein said barrier-charge transport layer is between 0.15 and 25 micrometers, the barrier zone of said barrier-charge transport layer is between 0.006 and 0.03 micrometers, the pore diameters of said porous zone are between 0.008 and 0.030 micrometers, and the center-to-center spacing of said pores is between 0.020 and 0.060 micrometers.
PRIORITY INFORMATION
This application is a continuation-in-part of U.S. Ser. No. 190,423 filed on Sept. 25, 1980, abandoned.
US Referenced Citations (5)
Foreign Referenced Citations (1)
Number |
Date |
Country |
1334671 |
Jul 1963 |
FRX |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
190423 |
Sep 1980 |
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