This application claims priority to Taiwan Application Serial Number 104106853, filed Mar. 4, 2015, which is herein incorporated by reference.
1. Field of Invention
The present invention relates to a monitor technique. More particularly, the present invention relates to an optical method for monitoring plasma discharging glow.
2. Description of Related Art
Properties of plasma generated by a plasma device can be used to estimate performance of the plasma device. Currently, in analysis techniques of plasma properties, a grating spectrometer is generally used to detect and analyze types of plasma. However, when the grating spectrometer is used to perform a detecting operation, only species and relative intensities of plasma can be got, but a shape and an absolute intensity of the plasma cannot be got.
In addition, nowadays, a technique that can accurately estimate a size and a shape of the plasma has not been developed. Furthermore, there is no technique that can directly estimate intensity distribution of the plasma.
Therefore, one objective of the present invention is to provide an optical method for monitoring plasma discharging glow, which can effectively detect a shape, a size, temperature distribution, color distribution, a rotating speed, flash behavior, relative intensities, an absolute intensity and intensity distribution of the plasma discharging glow by a non-contact method, thereby achieving an effect of immediately monitoring a plasma treating region.
Another objective of the present invention is to provide an optical method for monitoring plasma discharging glow, which can rapidly estimate properties of the plasma discharging glow.
Still another objective of the present invention is to provide an optical method for monitoring plasma discharging glow, which may use a charge coupled device (CCD) as a detector for detecting the plasma discharging glow, thereby reducing monitoring cost.
According to the aforementioned objectives, the present invention provides an optical method for monitoring plasma discharging glow, which includes the following steps. Plasma discharging glow is detected to obtain various optical signals using a detector. The optical signals are captured and converted into various electric signals by using a sensing circuit. A calculation step is performed according to the electric signals to obtain various light intensities corresponding to various locations in the plasma discharging glow using an arithmetic unit. An image of the plasma discharging glow is reconstructed according to the locations in the plasma discharging glow and the corresponding light intensities using an image reconstruction unit.
According to one embodiment of the present invention, the detector includes a charge coupled device.
According to another embodiment of the present invention, the detector includes a charge coupled device and an optical emission spectrometer (OES).
According to still another embodiment of the present invention, the detector includes a charge coupled device and a power meter.
According to further another embodiment of the present invention, the optical signals include a plurality of photoelectron intensities.
These and other objectives, features, advantages and embodiments of the present invention will become better understood with reference made to the accompanying drawings as follows:
In view of there is no technique, which can accurately estimate size and shape of plasma, and there is either no technique, which can directly estimate an absolute intensity of plasma. Thus, embodiments of the present disclosure provide an optical method for monitoring plasma discharging glow, which uses an optical method to detect plasma discharging glow, so that properties of the plasma discharging glow, such as a shape, a size, temperature distribution, color distribution, a rotating speed, flash behavior, relative intensities, an absolute intensity and intensity distribution are effectively and rapidly estimated by a non-contact method. Therefore, an effect of immediately monitoring a plasma treating region is achieved. Moreover, the embodiments of the present disclosure may use a charge coupled device to detect photoelectron intensities of the plasma discharging glow, thereby reducing monitoring cost.
Referring to
In some examples, the detector 202 may include a charge coupled device. The charge coupled device can detect flash behavior of the plasma discharging glow 200, such as flash numbers and flash frequency, so that stability and quality of the plasma discharging glow 200 can be known. In some certain examples, the charge coupled device can also detect a rotating speed of the plasma discharging glow 200 when the plasma discharging glow 200 is generated by a rotating plasma device. In addition, the charge coupled device can detect a RGB value of the plasma discharging glow 200 for determining whether the color of the plasma discharging glow 200 fits a requirement or not. In some examples, the detector 202 may simultaneously include a charge coupled device and an optical emission spectrometer, in which the optical emission spectrometer can detect species and a relative intensity corresponding to each of the species. In some examples, the detector 202 may simultaneously include a charge coupled device and a power meter, in which the power meter can detect an absolute intensity of the whole plasma discharging glow 200.
As shown in
Referring to
With regard to calculation and analysis for RGB values in the optical signals of the plasma discharging glow 200 detected by the charge coupled device, the arithmetic unit 206 may individually calculate an R value, a G value and a B value, or may collectively calculate the combination of the R value, the G value and the B value.
Simultaneously referring to
According to the aforementioned embodiments, one advantage of the present invention is that an optical method for monitoring plasma discharging glow of the present invention can effectively detect a shape, a size, temperature distribution, color distribution, a rotating speed, flash behavior, relative intensities, an absolute intensity and intensity distribution of the plasma discharging glow by a non-contact method, so that an effect of immediately monitoring a plasma treating region is achieved.
According to the aforementioned embodiments, another advantage of the present invention is that an optical method for monitoring plasma discharging glow of the present invention can rapidly estimate properties of the plasma discharging glow.
According to the aforementioned embodiments, still another advantage of the present invention is that an optical method for monitoring plasma discharging glow of the present invention may use a charge coupled device as a detector for detecting the plasma discharging glow, so that monitoring cost is reduced.
Although the present invention has been described in considerable detail with reference to certain embodiments thereof, the foregoing embodiments of the present invention are illustrative of the present invention rather than limiting of the present invention. It will be apparent to those having ordinary skill in the art that various modifications and variations can be made to the present invention without departing from the scope or spirit of the invention. Therefore, the spirit and scope of the appended claims should not be limited to the description of the embodiments contained herein.
Number | Date | Country | Kind |
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104106853 | Mar 2015 | TW | national |