Emission spectrometry

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CPC
G01J3/443

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/443Emission spectrometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inflammable spark estimation system
- Patent number 12,196,616
- Issue date Jan 14, 2025
- SUBARU CORPORATION
- Takayuki Nishi
- G01 - MEASURING TESTING
Information Patent Grant
Time-resolved OES data collection
- Patent number 12,158,374
- Issue date Dec 3, 2024
- Tokyo Electron Limited
- Sergey Voronin
- G01 - MEASURING TESTING
Information Patent Grant
Sliding door assembly for an ICP torch box
- Patent number 12,146,791
- Issue date Nov 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Tobias Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for element identification via optical emission s...
- Patent number 12,140,478
- Issue date Nov 12, 2024
- Agilent Technologies, Inc.
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis system, learned model generation method, and sample...
- Patent number 12,117,343
- Issue date Oct 15, 2024
- National Institute of Advanced Industrial Science and Technology
- Yoshiyuki Teramoto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for element analysis of materials by means of...
- Patent number 12,072,291
- Issue date Aug 27, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Volker Sturm
- G01 - MEASURING TESTING
Information Patent Grant
Liquid sample introduction system and method, for analytical plasma...
- Patent number 12,068,145
- Issue date Aug 20, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Ayrat Murtazin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical emission spectrometry
- Patent number 12,050,181
- Issue date Jul 30, 2024
- Thermo Fisher Scientific (Eucblens) SARL
- Patrick Lancuba
- G01 - MEASURING TESTING
Information Patent Grant
Plasma processing apparatus and plasma processing system
- Patent number 12,014,909
- Issue date Jun 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryoji Asakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing complex single molecule emission patterns with deep learning
- Patent number 12,002,185
- Issue date Jun 4, 2024
- Purdue Research Foundation
- Peiyi Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for characterizing laser pulses
- Patent number 12,000,878
- Issue date Jun 4, 2024
- University of Central Florida Research Foundation, Inc.
- Michael Chini
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, measuring method, and vacuum processing apparatus
- Patent number 12,002,666
- Issue date Jun 4, 2024
- Tokyo Electron Limited
- Atsushi Sawachi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Downhole optical emission spectroscopy
- Patent number 11,965,418
- Issue date Apr 23, 2024
- Halliburton Energy Services, Inc.
- Mathew Dennis Rowe
- E21 - EARTH DRILLING MINING
Information Patent Grant
Glow plasma gas measurement signal processing
- Patent number 11,948,774
- Issue date Apr 2, 2024
- Servomex Group Limited
- Bahram Alizadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed ledger for physical material
- Patent number 11,946,870
- Issue date Apr 2, 2024
- MAT International Holdings, LLC
- Catherine E. McManus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-spectral method for detection of anomalies during powder bed...
- Patent number 11,940,325
- Issue date Mar 26, 2024
- The Penn State Research Foundation
- Abdalla R. Nassar
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Apparatus for detecting or monitoring for a chemical precursor in a...
- Patent number 11,939,673
- Issue date Mar 26, 2024
- ASM IP Holding B.V.
- John Kevin Shugrue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling light exposure of light sensitive object
- Patent number 11,925,153
- Issue date Mar 12, 2024
- Sensor Electronic Technology, Inc.
- Michael Shur
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Methods for calibrating an optical emission spectrometer
- Patent number 11,927,482
- Issue date Mar 12, 2024
- Applied Materials, Inc.
- Kin Pong Lo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device including internal spectral reference
- Patent number 11,920,979
- Issue date Mar 5, 2024
- Viavi Solutions Inc.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Grant
Heat management for inductively coupled plasma systems
- Patent number 11,917,744
- Issue date Feb 27, 2024
- PerkinElmer Scientific Canada ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagnosis method using laser induced breakdown spectroscopy and dia...
- Patent number 11,892,353
- Issue date Feb 6, 2024
- SPECLIPSE, INC.
- Sung Hyun Pyun
- B63 - SHIPS OR OTHER WATERBORNE VESSELS RELATED EQUIPMENT
Information Patent Grant
Abrasive sampling system and method for representative, homogeneous...
- Patent number 11,879,850
- Issue date Jan 23, 2024
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma process monitoring device and plasma processing apparatus in...
- Patent number 11,862,442
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Il Gu Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for detecting concentration of specimen
- Patent number 11,860,107
- Issue date Jan 2, 2024
- Seoul National University R&DB Foundation
- Jai Ick Yoh
- G01 - MEASURING TESTING
Information Patent Grant
Mounting assembly for a pressure vessel in a mobile instrument
- Patent number 11,796,388
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
- André Peters
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Multispectral synchronized imaging
- Patent number 11,771,325
- Issue date Oct 3, 2023
- Synaptive Medical Inc.
- Ze Shan Yao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
In-situ optical chamber surface and process sensor
- Patent number 11,735,401
- Issue date Aug 22, 2023
- Applied Materials, Inc.
- Chuang-Chia Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical assembly for optical emission spectroscopy
- Patent number 11,725,988
- Issue date Aug 15, 2023
- Hitachi High-Tech Analytical Science Finland Oy
- Esa Räikkönen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light measurement device and light measurement method
- Patent number 11,703,389
- Issue date Jul 18, 2023
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Non-Intrusive Method for 2D/3D Mapping Plasma Parameters
- Publication number 20240377331
- Publication date Nov 14, 2024
- TOKYO ELECTRON LIMITED
- Qiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MACHINE LEARNING ADJUSTMENT OF CHEMICAL COMPO...
- Publication number 20240299761
- Publication date Sep 12, 2024
- THE GEORGE WASHINGTON UNIVERSITY
- Michael KEIDAR
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND VACUUM PROCESSING APPARATUS
- Publication number 20240290591
- Publication date Aug 29, 2024
- TOKYO ELECTRON LIMITED
- Atsushi SAWACHI
- G01 - MEASURING TESTING
Information Patent Application
A DEVICE FOR DETECTING HEALTH DISORDERS FROM BIOLOGICAL SAMPLES AND...
- Publication number 20240264146
- Publication date Aug 8, 2024
- Ricardo Daniel DE SIMONE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Time-Resolved OES Data Collection
- Publication number 20240230409
- Publication date Jul 11, 2024
- TOKYO ELECTRON LIMITED
- Sergey Voronin
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR CALIBRATING AN OPTICAL EMISSION SPECTROMETER
- Publication number 20240192055
- Publication date Jun 13, 2024
- Applied Materials, Inc.
- Kin Pong LO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE INCLUDING INTERNAL SPECTRAL REFERENCE
- Publication number 20240183710
- Publication date Jun 6, 2024
- VIAVI SOLUTIONS INC.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FLAME MEASUREMENTS OF INDUSTRIAL FLAMES
- Publication number 20240183713
- Publication date Jun 6, 2024
- Baker Hughes Holdings LLC
- Jakub Prchlik
- G01 - MEASURING TESTING
Information Patent Application
Time-Resolved OES Data Collection
- Publication number 20240133742
- Publication date Apr 25, 2024
- TOKYO ELECTRON LIMITED
- Sergey Voronin
- G01 - MEASURING TESTING
Information Patent Application
Ultra-Miniature Spatial Heterodyne Spectrometer
- Publication number 20240125649
- Publication date Apr 18, 2024
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Application
Optical Emission Spectroscopy for Advanced Process Characterization
- Publication number 20240094056
- Publication date Mar 21, 2024
- TOKYO ELECTRON LIMITED
- Sergey Voronin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analyzing Complex Single Molecule Emission Patterns with Deep Learning
- Publication number 20240062334
- Publication date Feb 22, 2024
- Purdue Research Foundation
- Peiyi ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...
- Publication number 20240053201
- Publication date Feb 15, 2024
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTROMETER
- Publication number 20240044707
- Publication date Feb 8, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Lutz Frommberger
- G01 - MEASURING TESTING
Information Patent Application
SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT
- Publication number 20240003817
- Publication date Jan 4, 2024
- Hitachi High-Tech Analytical Science GmbH
- André PETERS
- G01 - MEASURING TESTING
Information Patent Application
KINEMATICS PATH METHOD FOR LASER-INDUCED BREAKDOWN SPECTROSCOPY
- Publication number 20230358684
- Publication date Nov 9, 2023
- THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
- Fabio Demarco
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS AND METHOD
- Publication number 20230317435
- Publication date Oct 5, 2023
- SEMES CO., LTD.
- Sunjoo PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Spectral Method For Detection of Anomalies During Powder Bed...
- Publication number 20230204420
- Publication date Jun 29, 2023
- The Penn State Research Foundation
- Abdalla R. Nassar
- B22 - CASTING POWDER METALLURGY
Information Patent Application
DOWNHOLE OPTICAL EMISSION SPECTROSCOPY
- Publication number 20230184106
- Publication date Jun 15, 2023
- Halliburton Energy Services, Inc.
- Mathew Dennis Rowe
- E21 - EARTH DRILLING MINING
Information Patent Application
SAMPLE ANALYSIS SYSTEM, LEARNED MODEL GENERATION METHOD, AND SAMPLE...
- Publication number 20230070781
- Publication date Mar 9, 2023
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Yoshiyuki TERAMOTO
- G01 - MEASURING TESTING
Information Patent Application
Heat Management for Inductively Coupled Plasma Systems
- Publication number 20230028640
- Publication date Jan 26, 2023
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Tak Shun Cheung
- G01 - MEASURING TESTING
Information Patent Application
IMPROVEMENTS IN OPTICAL EMISSION SPECTROMETRY
- Publication number 20230008231
- Publication date Jan 12, 2023
- THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
- Patrick Lancuba
- G01 - MEASURING TESTING
Information Patent Application
ARTIFICIAL INTELLIGENCE METHODS FOR CORRELATING LASER-INDUCED BREAK...
- Publication number 20230003655
- Publication date Jan 5, 2023
- NUTECH VENTURES
- Yongfeng Lu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREPARING COLORANT HAVING TARGET COLOR AND COLORANT
- Publication number 20220403174
- Publication date Dec 22, 2022
- Fudan University
- Jiao Chu
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DETECTION AND LOCATION OF ANOMALOUS PLASMA EVENTS IN FABRICATION CH...
- Publication number 20220406578
- Publication date Dec 22, 2022
- LAM RESEARCH CORPORATION
- Yukinori Sakiyama
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS METHOD USING LASER INDUCED BREAKDOWN SPECTROSCOPY AND DIA...
- Publication number 20220381614
- Publication date Dec 1, 2022
- SPECLIPSE, INC.
- Sung Hyun PYUN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY
- Publication number 20220373393
- Publication date Nov 24, 2022
- Hitachi High-Tech Analytical Science Finland Oy
- Esa RÄIKKÖNEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mirror Clip
- Publication number 20220364916
- Publication date Nov 17, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Dirk Wohlers
- G01 - MEASURING TESTING
Information Patent Application
INFLAMMABLE SPARK ESTIMATION SYSTEM
- Publication number 20220364921
- Publication date Nov 17, 2022
- SUBARU CORPORATION
- Takayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE TRANSMISSION APERTURE
- Publication number 20220349750
- Publication date Nov 3, 2022
- Agilent Technologies, Inc.
- Mark Junker
- G01 - MEASURING TESTING

Emission spectrometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inflammable spark estimation system

Time-resolved OES data collection

Sliding door assembly for an ICP torch box

Method and system for element identification via optical emission s...

Sample analysis system, learned model generation method, and sample...

Apparatus and method for element analysis of materials by means of...

Liquid sample introduction system and method, for analytical plasma...

Optical emission spectrometry

Plasma processing apparatus and plasma processing system

Analyzing complex single molecule emission patterns with deep learning

Systems and methods for characterizing laser pulses

Measuring device, measuring method, and vacuum processing apparatus

Downhole optical emission spectroscopy

Glow plasma gas measurement signal processing

Distributed ledger for physical material

Multi-spectral method for detection of anomalies during powder bed...

Apparatus for detecting or monitoring for a chemical precursor in a...

Controlling light exposure of light sensitive object

Methods for calibrating an optical emission spectrometer

Optical measurement device including internal spectral reference

Heat management for inductively coupled plasma systems

Diagnosis method using laser induced breakdown spectroscopy and dia...

Abrasive sampling system and method for representative, homogeneous...

Plasma process monitoring device and plasma processing apparatus in...

Device and method for detecting concentration of specimen

Mounting assembly for a pressure vessel in a mobile instrument

Multispectral synchronized imaging

In-situ optical chamber surface and process sensor

Optical assembly for optical emission spectroscopy

Light measurement device and light measurement method

Patents Applicationslast 30 patents

Non-Intrusive Method for 2D/3D Mapping Plasma Parameters

METHOD AND SYSTEM FOR MACHINE LEARNING ADJUSTMENT OF CHEMICAL COMPO...

MEASURING DEVICE, MEASURING METHOD, AND VACUUM PROCESSING APPARATUS

A DEVICE FOR DETECTING HEALTH DISORDERS FROM BIOLOGICAL SAMPLES AND...

Time-Resolved OES Data Collection

METHODS FOR CALIBRATING AN OPTICAL EMISSION SPECTROMETER

OPTICAL MEASUREMENT DEVICE INCLUDING INTERNAL SPECTRAL REFERENCE

SPECTRAL FLAME MEASUREMENTS OF INDUSTRIAL FLAMES

Time-Resolved OES Data Collection

Ultra-Miniature Spatial Heterodyne Spectrometer

Optical Emission Spectroscopy for Advanced Process Characterization

Analyzing Complex Single Molecule Emission Patterns with Deep Learning

METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...

OPTICAL SPECTROMETER

SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT

KINEMATICS PATH METHOD FOR LASER-INDUCED BREAKDOWN SPECTROSCOPY

SUBSTRATE PROCESSING APPARATUS AND METHOD

Multi-Spectral Method For Detection of Anomalies During Powder Bed...

DOWNHOLE OPTICAL EMISSION SPECTROSCOPY

SAMPLE ANALYSIS SYSTEM, LEARNED MODEL GENERATION METHOD, AND SAMPLE...

Heat Management for Inductively Coupled Plasma Systems

IMPROVEMENTS IN OPTICAL EMISSION SPECTROMETRY

ARTIFICIAL INTELLIGENCE METHODS FOR CORRELATING LASER-INDUCED BREAK...

METHOD FOR PREPARING COLORANT HAVING TARGET COLOR AND COLORANT

DETECTION AND LOCATION OF ANOMALOUS PLASMA EVENTS IN FABRICATION CH...

DIAGNOSIS METHOD USING LASER INDUCED BREAKDOWN SPECTROSCOPY AND DIA...

OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY

Mirror Clip

INFLAMMABLE SPARK ESTIMATION SYSTEM

VARIABLE TRANSMISSION APERTURE