One of the aspects of the embodiments relates to an optical system and an optical apparatus having the same.
Japanese Patent Laid-Open No. 2019-82412 discloses a spectroscopic camera that includes a microlens array (MLA) including a lens unit with a minute diameter and disposed as a diffusing plate at an imaging position of an intermediate image formed by an objective lens.
In a case where an intermediate image is re-formed using an imaging element, an uneven structure on the MLA surface may be as small as possible so that the MLA surface is not visually recognized, but the wave effects of light cannot be ignored in a case where the structural scale is on the order of several tens of micrometers. In a case where the effective diameter of the imaging element is smaller than the pitch of the diffused light (diffracted light) from the MLA, the diffused light may not enter the imaging element. Even if the effective diameter of the imaging element is about as large as the pitch of the diffused light, the distribution of the diffused light forms a striped pattern superimposed on the re-imaged image on the imaging plane, and the image quality deteriorates.
An optical system according to one aspect of the disclosure includes a diffusion element configured to diffuse an incident light beam at a diffusion point and to emit diffused light, and an imaging element configured to form an image of the diffusion point. Peak intensities in a diffusion angle distribution characteristic of the diffused light are discrete. The following inequality is satisfied:
1.0<(θp+θN)/θd<300.0
where θd is a maximum value of intervals between the peak intensities in the diffusion angle distribution characteristic, θp is an angle range of an entrance pupil of the imaging element with respect to the diffusion point, and ON is an effective spread angle of the diffused light. An optical apparatus having the above optical system also constitutes another aspect of the disclosure.
Further features of the disclosure will become apparent from the following description of embodiments with reference to the attached drawings.
Referring now to the accompanying drawings, a detailed description will be given of embodiments according to the disclosure. Corresponding elements in respective figures will be designated by the same reference numerals, and a duplicate description thereof will be omitted.
The diffusing plate DF is disposed on a primary imaging plane (intermediate image plane) IP1, which is a condensing surface of the objective lens OL disposed on the object side of the diffusing plate DF. An incident light beam IL from the objective lens OL is condensed at an incident angle θobj with respect to the diffusing plate DF to form a light point (diffusion point) Pd on the diffusing plate DF. The light points Pd are continuously formed on the diffusing plate DF along a y1-axis to form an object image on the primary imaging plane IP1.
The diffusing plate DF diffuses the incident light beam IL from the light point Pd to the image side as diffused light with a diffusion angle distribution characteristic having discrete peak intervals mainly due to the wave optics diffraction.
Part of the diffused light rays Id is imaged on a secondary imaging plane IP2 via the relay optical system. The relay optical system is configured such that the light point Pd and an imaging point Pi on the image plane have a conjugate relationship in the geometrical optics. In other words, a group of light points Pd on the primary imaging plane IP1 (primary image) is re-imaged on the secondary imaging plane IP2.
The optical apparatus may include an image sensor configured to convert an optical image formed on an imaging plane into an electrical signal. In this case, the imaging plane of the image sensor is disposed on the secondary imaging plane IP2.
Although not illustrated in
In this embodiment, parallel light from the collimator lens CL enters the imaging lens LA1 (lens array LA). Even if the position of the imaging lens LA1 (lens array LA) shifts within the plane orthogonal to the optical axis, this configuration can reduce the influence on imaging performance.
In this embodiment, Id(m) is a representative of the diffused light beams entering an aperture of the imaging lens LA1, and the adjacent diffused light beam Id(m−1) also enters the same aperture. An angle formed by the diffused light beams Id(m) and Id(m−1) (the maximum value of the peak intervals of the diffused angle distribution of the diffused light at the light point Pd) is defined as a diffused light ray interval θd (=θd(y1)).
A description will now be supplemented of a method of defining the diffused light ray interval θd. In a case where the diffusing plate DF has a periodic structure like the MLA structure, the diffused light rays Id are emitted from the light point Pd and diffused at the diffused light ray interval θd determined by the pitch p of the periodic structure and the wavelength λ of the incident light beam IL. In
In this embodiment, the diffused light is emitted with a diffusion angle distribution having regular intervals due to diffraction, but this embodiment is not limited to this example. For example, as illustrated in
Referring now to
In order to understand the phenomenon, we first focus on two points y1(1) and y1(2) separated from each other on the primary imaging plane IP1 as representative points. For the respective representative points, incident light beams are labelled as IL(y1(1)) and IL(y1(2)), light points (light spots) are labelled as Pd(y1(1)) and Pd(y1(2)), and imaging points are labelled as Pi(y2(y1(1))) and Pi(y2(y1(2))). In the following description, obvious symbols in parentheses will be omitted. The incident light beam IL incident on the point y1(1) diffuses backward as diffused light rays Id (indicated by vertical patterns in the figure) having a diffusion angle distribution characteristic with discrete peak intervals at the light point Pd.
The diffused light rays Id generally have a spread angle (divergence angle) during diffusion. In reality, the intensity of the diffused light continuously changes and has no clear boundary, so here is defined by a half width (full width at half maximum: FWHM) of the intensity distribution as illustrated in
In a case where another optical element (collimator lens CL in this embodiment) is disposed between the diffusing plate DF and the imaging lens LA1, the spread angle θN may change due to the optical action such as refraction. At this time, the diffused light rays Id incident on the aperture are traced back, and the angle immediately after the light point Pd is used as the spread angle θN. This is similarly applied to the diffused light ray interval θd and the pupil angle θp. In order to match the conditions, each value is acquired by an observation at the same point, and in this embodiment, the light point Pd is used as a reference.
The spread angle θN is proportional to the diffusion power and the incident angle θobj of the incident light beam IL (or the F-number of the objective lens OL) at the light point Pd. However, in a case where the spread angle θN is observed from the imaging lens LA1, the past influence cannot be distinguished and thus this embodiment focuses only on the post-diffusion spread angle θN and equally treats factors that determine the spread angle θN.
The imaging lens LA1 converges the diffused light rays Id incident on the aperture to form the imaging point Pi. The position of the imaging point Pi is determined by geometrical optics (once the optical arrangement is determined, the points y1 and y2 are in the conjugate relationship, so y2=y2(y1) is established). Since the imaging intensity of the imaging point Pi is determined by the total amount of diffused light rays Id incident on the aperture, it is necessary to consider the non-uniform intensity distribution derived from diffraction. Since many diffused light rays Id from the light point Pd(y1(1)) enter the effective diameter Φp, the imaging point Pi(y2(y1(1))) is bright (has high intensity). On the other hand, the diffused light rays Id from the light point Pd(y1(2)) hardly enter the aperture, so the luminance of the imaging point Pi(y2(y1(2))) is minimal. Since the amount of light rays incident on the aperture along the primary imaging plane IP1 continuously changes in this way, a striped pattern intensity distribution appears on the secondary imaging plane IP2. Such an intensity distribution more clearly appears in a case where light of the same intensity enters the primary imaging plane IP1, that is, in a case where an all-white image is formed. This stripe that deteriorates the image quality deterioration will be referred to as “diffraction stripes (or diffraction fringes)” hereinafter. As described above, image quality deteriorates due to wave optics or the relationship among the characteristic of the incident light beam IL, the diffusion characteristic of the diffusing plate DF, and the aperture of the imaging lens LA1. One of the embodiments can suppress this image quality deterioration.
In order to suppress the image quality deterioration, this embodiment properly sets a relationship between the pupil angle θp of the imaging lens LA1 and the diffused light ray interval θd. By setting the diffused light ray interval θd to be small, this embodiment increases the number of diffused light rays Id incident on the aperture as much as possible, as illustrated in
1.0<θp/θd<300.0 (1)
In a case where the value becomes lower than the lower limit of inequality (1), diffraction stripes become more intense, and not only the image quality deteriorates, but almost no areas are left in the image where the luminance remains. Even if a lens with a bright F-number is placed in the objective lens OL to increase the spread angle θN of the diffused light rays Id, it is difficult to suppress diffraction stripes within the realistic specification of the objective lens OL. It is necessary to dispose an expensive lens with a large diameter in the lens OL. In a case where the value becomes higher than the upper limit of inequality (1), the diffusing plate DF needs to be processed to have a precise surface structure in consideration of the wave optics effect, and the manufacturing cost of the diffusing plate DF increases.
Inequality (1) may be replaced with inequality (1a) below:
1.2<θp/θd<200.0 (1a)
Inequality (1) may be replaced with inequality (1b) below:
1.4<θp/θd<100.0 (1b)
Inequality (1) may be replaced with inequality (1c) below:
1.5<θp/θd<50.0 (1c)
Inequality (1) may be replaced with inequality (1d) below:
1.6<θp/θd<30.0 (1d)
In a case where the diffusing plate DF has a diffusion surface having a structure that is periodically arranged (periodical structure), and the light point Pd and the imaging lens LA1 are disposed near the principal optical axis AX0, the diffused light ray interval θd is expressed by the following equation within at least the pupil angle θp:
θd=arcsin(λ/p)
where λ is a wavelength of light imaged by the imaging lens LA1, and p is a pitch of the structure.
The diffused light ray interval θd can be further approximated and expressed by the following equation:
θd≈λ/p
In a case where the relay optical system has a collimator lens, a ratio θp/θd between the pupil angle θp and the diffused light ray interval θd is expressed by the following equation:
θp/θd≈Φp/(4*dL*tan(θd/2))≈Φp/(4*dL*tan(λ/(2p)))
where dL is a distance on the principal optical axis AX0 between the diffusing plate DF and the relay optical system.
In a case where the diffused light ray interval θd is sufficiently small, the ratio θp/θd is expressed by the following equation. The unit of the diffused light ray interval θd is rad.
θp/θd≈Φp/(2*dL*θd)≈(p*Φp)/(2*dL*λ)
The above approximation equation can be used to estimate the overall configuration.
In
Now focus on the number of diffused light rays Id that have passed through the apertures in the right views in
In
As the value of the ratio θp/θd increases, the decrease in luminance ratio is suppressed, so a proper configuration may be selected according to the accuracy required for the imaging system.
The above configuration can suppress the influence of image quality deterioration caused by diffraction stripes due to the diffusion characteristic of the diffusing plate.
In this embodiment, the objective lens OL and the incident light beam IL are respectively a lens for forming an object image and its imaging light beam, but the present disclosure is not limited to this example. As long as a light point is generated on the diffusing plate DF, the objective lens OL and the incident light beam IL may be replaced with a projection apparatus or projected light by laser scanning. The incident light beam IL does not necessarily have to be condensed, and may be in the form of a spot. In this case, the light point Pd has a width to some extent.
In this embodiment, the diffusing plate DF includes a transmission type diffusion element, but may include a reflection type diffusion element as long as it has similar diffusion characteristics. In that case, the optical path (optical axis) is folded back on the diffusing plate surface, but as long as the subsequent optical arrangement is the same, the principle explained in this embodiment can be utilized.
In order to suppress diffraction stripes, this embodiment will discuss a method of increasing the spread angle of diffused light rays and increasing the amount of light beam incident on the aperture.
In order to increase the spread angle θN of the diffused light ray Id, this embodiment will discuss a method of using a lens with a bright F-number as the objective lens OL and increasing the incident angle θobj of the incident light beam IL. As described in the first embodiment, it is unknown by what action the spread angle θN is determined when viewed from the aperture. This embodiment assumes that the spread angle θN is determined by the relationship between the light ray characteristic from the diffusing plate DF and the effective diameter Φp.
As illustrated in
In a case where the spread angles θN of the plurality of diffused light rays Id incident on the aperture are approximately the same, the following inequality (2) may be satisfied:
1.0<(θp+θN)/θd<300.0 (2)
In a case where the value becomes higher than the upper limit of inequality (2), diffraction stripes more intensely occur and the image quality deteriorates. In addition, almost no area remains bright. In a case where the value becomes lower than the lower limit of inequality (2), the manufacturing cost of the diffusing plate DF increases.
Inequality (2) may be replaced with inequality (2a) below:
1.0<(θp+θN)/θd<200.0 (2a)
Inequality (2) may be replaced with inequality (2b) below:
1.0<(θp+θN)/θd<100.0 (2b)
Inequality (2) may be replaced with inequality (2c) below:
1.1<(θp+θN)/θd<50.0 (2c)
Inequality (2) may be replaced with inequality (2d) below:
1.2<(θp+θN)/θd<30.0 (2d)
Near the principal optical axis AX0, the spread angle θN can be expressed by the following approximation equation using the numerical aperture NA.
θN≈arcsin(NA/n)
where n represents the refractive index of a medium just after the light point Pd, and is set to 1 because it is the atmosphere in a normal design.
In a case where the specification of the objective lens OL near the principal optical axis AX0 can be selected, the spread angle θN can be expressed by the following approximate equation using the F-number Fno of the objective lens OL.
θN≈arctan(1/(2*Fno))
In a case where the minimum value of the spread angle θN is θNmin, the following inequality may be met:
0.05<θN min<20.50
In
In
As described above, a large pupil angle θp and a large spread angle θN can be treated equivalently with respect to the diffused light ray interval θd. This works effectively especially in a case where the number of diffused light rays Id incident on the aperture is small (especially in a case where θp/θd<1).
In
In a case where the number of diffused light rays Id incident on the aperture is large and the difference in spread angles θN is large, the average value of spread angles θN may be used.
The above configuration can suppress the influence of image quality deterioration due to diffraction stripes caused by the diffusion characteristic of the diffusing plate.
This embodiment will discuss a case where the diffused light rays Id two-dimensionally spread, that is, the diffused light rays Id distribute in the paper surface direction and the paper surface depth direction of
In
In comparison with the case of
As described above, the configuration that two-dimensionally spreads the diffused light rays Id can further suppress the influence of image quality deterioration due to diffraction stripes caused by the diffusion characteristic of the diffusing plate.
The diffusing plate DF and lens array LA are housed in a lens barrel LB. An image sensor SS is disposed at a position of the secondary imaging plane IP2 and housed in a camera body (image pickup apparatus) CB. The lens barrel LB is attachable to and detachable from the camera body CB. The lens barrel LB is disposed on the object side of the lens barrel LB, and is attachable to and detachable from the lens apparatus including the objective lens OL. That is, a lens apparatus with an arbitrary specification can be attached to the lens barrel LB. Since all of the plurality of imaging lenses LA1 in the lens array LA re-image the primary imaging plane IP1, duplicate images are formed on the secondary imaging plane IP2 by the number corresponding to the imaging lenses LA1. A filter array FA is disposed on the object side of the lens array LA in the lens barrel LB. The filter array FA includes a plurality of bandpass filters (optical filters) disposed on the optical paths of the plurality of imaging lenses LA1. The plurality of bandpass filters includes two filters having transmission characteristics different from each other. This configuration forms images on the primary imaging plane IP1, on the secondary imaging plane IP2 as different wavelength images (a plurality of types of optical images) for transmission wavelengths of the bandpass filters. A spectral image (multiband image) including wavelength information of four or more bands can be formed by combining them using an unillustrated image processing apparatus at a later stage. This embodiment disposes the bandpass filter that transmits the longest wavelength light among the plurality of bandpass filters at the center of the plurality of bandpass filters when viewed from the optical axis direction.
As long as the diffused light ray interval θd and the pupil angle θp of each imaging lens satisfy inequality (1) when viewed from any point on the primary imaging plane IP1, the spectroscopic camera can suppress diffraction stripes. In a case where the acquisition wavelength of the spectroscopic camera is a wavelength in the infrared region of 700 nm or longer (the light rays imaged by the imaging lens LA1 include infrared light with a wavelength of 700 nm or longer), the ratio value θp/θd easily becomes or less. In particular, as the F-number of the objective lens OL becomes darker (the incident angle θobj becomes smaller), the spread angle θN becomes smaller and the diffraction stripes strongly appear. The conditions for the other wavelengths become mitigated by previously calculating the imaging relationship for the longest wavelength, and the design becomes easier. This embodiment may satisfy the following inequality:
500<Φp/λ<15000
In general, the pupil angle θp can be considered constant near the principal optical axis AX0, but it appears to gradually become small as it moves away from the principal optical axis AX0 (appears to be collapsed in an elliptical shape). This is disadvantageous because the pupil angle θp viewed from the light point Pd becomes relatively small. Thus, a wavelength image having a longer wavelength λ, in which a condition is strict, may be set closer to the principal optical axis AX0.
In order to suppress diffraction stripes regardless of the specification (F-number) of the objective lens OL, the ratio of inequality (1) may be increased. However, as described above, as the value becomes higher than the upper limit of inequality (1), influences of other problems become remarkable such as the cost increase of the diffusing plate DF and the size increase of the imaging lens LA1. Therefore, the ratio of inequality may be increased within a certain range.
In a case where the objective lens OL with a bright F-number can be selected, any of the spread angles θN of the diffused light rays Id can be made large. Thus, even if the ratio θp/θd is a value as small as the lower limit of inequality (1), diffraction stripes can be suppressed (within a practical range). As explained in the first embodiment, in a case where the value becomes lower than the lower limit of inequality (1), the objective lens OL with an exceptionally large aperture is required, and the cost becomes very high or the production limit is reached.
The above configuration can provide a spectroscopic camera that can suppress the influence of image quality deterioration due to diffraction stripes caused by the diffusion characteristic of the diffusing plate.
This embodiment uses the bandpass filters for the filter array FA, but any element that changes the characteristic of transmitted light can similarly act and function as a broadly-defined spectroscopic camera. For example, in a case where a plurality of types of polarizing filters are used, the spectroscopic camera can perform spectroscopy according to the polarization characteristics.
Referring now to
In a case where the angle of the off-axis ray of the objective lens OL is large, or in a case where the angle of the diffused light spread from the diffusing plate DF is small, even if the pupil angle θp and the diffused light ray angle θd have proper values, light rays may not enter the effective diameter Φp of the imaging lens LA1. The effective diffusion angle θw is a spread angle of the entire region of diffused light that indicates the effective range of the spread of diffused light from the light point Pd, and is an angle range in which the necessary light amount is obtained during imaging. For simplification, this embodiment uses a half width (full width at half maximum: FWHM). As described in the first embodiment, the angular distribution may have discrete luminance peaks depending on the structure of the diffusing plate DF. In this case, as illustrated in the diffusion distribution characteristic of the light point Pd in
In considering the diffusion central axis of the effective diffusion angle θw (referred to as a diffusion axis AXw hereinafter), it is first assumed that it substantially coincides with the central axis of the incident light beam IL entering from the objective lens OL. When viewed from the light point Pd, in a case where the diffusion axis AXw and the axis toward the effective diameter Φp are greatly deviated, it is conceivable that sufficient rays for imaging may not enter the effective diameter Φp. Accordingly, an axial shift amount θax, which is an angle between the diffusion axis AXw and the central axis of the effective diameter Φp when viewed from the light point Pd (an angle between the principal ray of the incident light beam IL and a line connecting the light point Pd and the center of the entrance pupil of the imaging lens LA1) may satisfy the following inequality (3):
θp<θw−2×θax (3)
Although inequality (3) is described as an angle condition, even if there is an optical element between the diffusing plate DF and the imaging lens LA1 as described in the first embodiment, the same equation can be used since the angle viewed from the light point Pd can be defined.
A similar effect can also be obtained by placing an optical element behind the diffusion surface. This case can be similarly processed as long as the effective diffusion angle θw and the pupil angle θp viewed from the light point Pd have corresponding conditions.
The above configuration can provide more suitable conditions for re-imaging of the diffused light.
Each embodiment can provide an optical system and an optical apparatus (such as an image pickup apparatus and an lens apparatus) having same, each of which can suppress the influence of the image quality deterioration due to the diffusion characteristic.
While the disclosure has been described with reference to embodiments, it is to be understood that the disclosure is not limited to the disclosed embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
Number | Date | Country | Kind |
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2021-019615 | Feb 2021 | JP | national |
This application is a Continuation of International Patent Application No. PCT/JP2022/000357, filed on Jan. 7, 2022, which claims the benefit of Japanese Patent Application No. 2021-019615, filed on Feb. 10, 2021, both of which are hereby incorporated by reference herein in their entirety.
Number | Date | Country | |
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Parent | PCT/JP2022/000357 | Jan 2022 | US |
Child | 18357238 | US |