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using means for replacing an element by another, for replacing a filter or a grating
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G01J3/0235
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/0235
using means for replacing an element by another, for replacing a filter or a grating
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Patents Grants
last 30 patents
Information
Patent Grant
Hyperspectral sensor, hyperspectral imaging system including the se...
Patent number
12,177,548
Issue date
Dec 24, 2024
Electronics and Telecommunications Research Institute
Jung-Ho Song
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Fluorescence detection system
Patent number
12,050,127
Issue date
Jul 30, 2024
CHROMA ATE INC.
Hsuan-An Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optical process sensor, measuring head, measuring system comprising...
Patent number
11,747,200
Issue date
Sep 5, 2023
Endress + Hauser Conducta GmbH + Co. KG
Hans Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Spectrum measurement system
Patent number
11,340,114
Issue date
May 24, 2022
PROTRUSTECH CO., LTD
Chun-Ta Huang
G01 - MEASURING TESTING
Information
Patent Grant
Multifocal hyperspectral Raman system and methods for imaging of ma...
Patent number
10,914,682
Issue date
Feb 9, 2021
Case Western Reserve University
Ozan Akkus
G01 - MEASURING TESTING
Information
Patent Grant
Filter assembly for providing adjustable spectral capabilities in a...
Patent number
10,871,395
Issue date
Dec 22, 2020
KLA Corporation
Jeremy Nesbitt
G01 - MEASURING TESTING
Information
Patent Grant
Device for providing variable sized aperture for a sample
Patent number
10,823,614
Issue date
Nov 3, 2020
Thermo Electron Scientific Instruments LLC
John Magie Coffin
G01 - MEASURING TESTING
Information
Patent Grant
Optical characteristics measuring method and optical characteristic...
Patent number
10,733,750
Issue date
Aug 4, 2020
Otsuka Electronics Co., Ltd.
Yoshihiko Nishida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Enclosed benchtop raman spectrometry device
Patent number
10,656,011
Issue date
May 19, 2020
MARQMETRIX, INC.
Brian James Marquardt
G01 - MEASURING TESTING
Information
Patent Grant
Colorimetric device
Patent number
10,571,333
Issue date
Feb 25, 2020
Konica Minolta, Inc.
Masayuki Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive, very high resolution imaging spectrometer
Patent number
10,495,515
Issue date
Dec 3, 2019
Irvine Sensors Corp.
James Justice
G01 - MEASURING TESTING
Information
Patent Grant
Display and a light sensor operable as an infrared emitter and infr...
Patent number
10,433,398
Issue date
Oct 1, 2019
ESSENTIAL PRODUCTS, INC.
Jason Sean Gagne-Keats
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Enclosed benchtop Raman spectrometry device
Patent number
10,408,675
Issue date
Sep 10, 2019
MARQMETRIX, INC.
Brian James Marquardt
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus for optical emission spectroscopy
Patent number
10,408,680
Issue date
Sep 10, 2019
Industry-Academic Cooperation Foundation, Yonsei University
Ilgu Yun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
ICP emission spectrophotometer
Patent number
10,309,903
Issue date
Jun 4, 2019
Hitachi High-Tech Science Corporation
Yutaka Ikku
G01 - MEASURING TESTING
Information
Patent Grant
Integrated Raman spectrum measurement system
Patent number
10,247,674
Issue date
Apr 2, 2019
PROTRUSTECH CO., LTD
Chun-Ta Huang
G01 - MEASURING TESTING
Information
Patent Grant
Data blending multiple dispersive range monochromator
Patent number
10,215,635
Issue date
Feb 26, 2019
Westco Scientific Instruments, Inc.
Jerome J. Workman
G01 - MEASURING TESTING
Information
Patent Grant
Modular imaging spectrometer assembly and method
Patent number
10,168,209
Issue date
Jan 1, 2019
Raytheon Company
Susan B. Spencer
G01 - MEASURING TESTING
Information
Patent Grant
Light detection apparatus
Patent number
10,145,795
Issue date
Dec 4, 2018
FUJIFILM Corporation
Masato Saitou
G02 - OPTICS
Information
Patent Grant
Universal multidetection system for microplates
Patent number
10,072,982
Issue date
Sep 11, 2018
BIOTEK INSTRUMENTS, INC.
Oleg Zimenkov
G01 - MEASURING TESTING
Information
Patent Grant
Optical base body for a spectrometer, method for producing an optic...
Patent number
10,048,126
Issue date
Aug 14, 2018
Bruker Axs GmbH
Armin Schmidt
G02 - OPTICS
Information
Patent Grant
Imaging apparatus and method
Patent number
9,912,882
Issue date
Mar 6, 2018
MBDA UK Limited
Christopher Greenway
G02 - OPTICS
Information
Patent Grant
Variable modulation of radiation and components
Patent number
9,891,427
Issue date
Feb 13, 2018
Halliburton Energy Services, Inc.
David L. Perkins
G02 - OPTICS
Information
Patent Grant
Spectral camera with mosaic of filters for each image pixel
Patent number
9,857,222
Issue date
Jan 2, 2018
IMEC
Bert Geelen
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry system, spectroscopic module, and positional deviation...
Patent number
9,797,774
Issue date
Oct 24, 2017
Seiko Epson Corporation
Akira Sano
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable aperture device with integral aperture holes
Patent number
9,786,400
Issue date
Oct 10, 2017
Agilent Technologies, Inc.
Armin Steinke
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Spectroscopic camera
Patent number
9,766,125
Issue date
Sep 19, 2017
Seiko Epson Corporation
Tsugio Gomi
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer with multiple Fabry-Perot filters for gas analysis
Patent number
9,752,931
Issue date
Sep 5, 2017
Sick AG
Torsten Waldmann
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optical measurement of a target
Patent number
9,581,499
Issue date
Feb 28, 2017
Teknologian tutkimeskeskus VTT
Heikki Saari
G01 - MEASURING TESTING
Information
Patent Grant
Universal multidetection system for microplates
Patent number
9,557,217
Issue date
Jan 31, 2017
BTI Holdings, Inc.
Oleg Zimenkov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL SYSTEM AND OPTICAL APPARATUS HAVING THE SAME
Publication number
20230367042
Publication date
Nov 16, 2023
Canon Kabushiki Kaisha
Tsubasa NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL SENSOR, HYPERSPECTRAL IMAGING SYSTEM INCLUDING THE SE...
Publication number
20220303440
Publication date
Sep 22, 2022
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
JUNG-HO SONG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL PROCESS SENSOR, MEASURING HEAD, MEASURING SYSTEM COMPRISING...
Publication number
20220042846
Publication date
Feb 10, 2022
Endress + Hauser Conducta GmbH + Co. KG
Hans Meyer
G01 - MEASURING TESTING
Information
Patent Application
SPECTRUM MEASUREMENT SYSTEM
Publication number
20200370962
Publication date
Nov 26, 2020
PROTRUSTECH CO., LTD
Chun-Ta Huang
G01 - MEASURING TESTING
Information
Patent Application
ENCLOSED BENCHTOP RAMAN SPECTROMETRY DEVICE
Publication number
20200003617
Publication date
Jan 2, 2020
MarqMetrix, Inc.
Brian James Marquardt
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC DETECTION DEVICE, AND ADJUSTMENT METHOD FOR DETECTION...
Publication number
20190107436
Publication date
Apr 11, 2019
OLYMPUS CORPORATION
Masahito DOHI
G01 - MEASURING TESTING
Information
Patent Application
Adaptive, Very High Resolution Imaging Spectrometer
Publication number
20190094073
Publication date
Mar 28, 2019
Irvine Sensors Corporation
James Justice
G01 - MEASURING TESTING
Information
Patent Application
MULTIFOCAL HYPERSPECTRAL RAMAN SYSTEM AND METHODS FOR IMAGING OF MA...
Publication number
20180313762
Publication date
Nov 1, 2018
Case Western Reserve University
Ozan AKKUS
G01 - MEASURING TESTING
Information
Patent Application
Filter Assembly for Providing Adjustable Spectral Capabilities in a...
Publication number
20180299324
Publication date
Oct 18, 2018
KLA-Tencor Corporation
Jeremy Nesbitt
G01 - MEASURING TESTING
Information
Patent Application
MODULAR IMAGING SPECTROMETER ASSEMBLY AND METHOD
Publication number
20180292258
Publication date
Oct 11, 2018
Raytheon Company
Susan B. Spencer
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTRUM MEASUREMENT DEVICE
Publication number
20180172512
Publication date
Jun 21, 2018
YOKOGAWA ELECTRIC CORPORATION
Ryo TAMAKI
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED RAMAN SPECTRUM MEASUREMENT SYSTEM
Publication number
20170370850
Publication date
Dec 28, 2017
PROTRUSTECH CO., LTD
Chun-Ta Huang
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE MODULATION OF RADIATION AND COMPONENTS
Publication number
20170211976
Publication date
Jul 27, 2017
Halliburton Energy Services, Inc.
David L. Perkins
G02 - OPTICS
Information
Patent Application
OPTICAL BASE BODY FOR A SPECTROMETER, METHOD FOR PRODUCING AN OPTIC...
Publication number
20160202120
Publication date
Jul 14, 2016
BRUKER ELEMENTAL GMBH
Armin Schmidt
G02 - OPTICS
Information
Patent Application
SPECTRUM DETECTOR
Publication number
20150276475
Publication date
Oct 1, 2015
Seoul Viosys Co., Ltd.
Shiro SAKAI
G01 - MEASURING TESTING
Information
Patent Application
IMAGER FOR CONSTRUCTING COLOR AND DEPTH IMAGES
Publication number
20140291520
Publication date
Oct 2, 2014
Microsoft Corporation
Scott McEldowney
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CAMERA WITH OVERLAPPING SEGMENTS OF IMAGE COPIES INTERLEAV...
Publication number
20140267878
Publication date
Sep 18, 2014
IMEC
Bert Geelen
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC CAMERA
Publication number
20140240508
Publication date
Aug 28, 2014
SEIKO EPSON CORPORATION
Tsugio GOMI
G01 - MEASURING TESTING
Information
Patent Application
STANDARDIZING FLUORESCENCE MICROSCOPY SYSTEMS
Publication number
20140226866
Publication date
Aug 14, 2014
APERIO TECHNOLOGIES, INC.
Gregory Crandall
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL MEASUREMENT OF A TARGET
Publication number
20140218736
Publication date
Aug 7, 2014
TEKNOLOGIAN TUTKIMESKESKUS VTT
Heikki Saari
G01 - MEASURING TESTING
Information
Patent Application
FLUORESCENCE OBSERVATION SYSTEM AND SET OF FILTERS
Publication number
20140211306
Publication date
Jul 31, 2014
Carl Zeiss Meditec AG
Helge Jess
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC APPARATUS AND SPECTROSCOPIC LIGHT SOURCE
Publication number
20140125981
Publication date
May 8, 2014
YOKOGAWA ELECTRIC CORPORATION
Mitsuhiro IGA
G02 - OPTICS
Information
Patent Application
MOVABLE PIXELATED FILTER ARRAY
Publication number
20140063299
Publication date
Mar 6, 2014
Raytheon Company
Eric Fest
G02 - OPTICS
Information
Patent Application
RADIOMETRIC MULTI-SPECTRAL OR HYPERSPECTRAL CAMERA ARRAY USING MATC...
Publication number
20140022381
Publication date
Jan 23, 2014
STEVE HEINOLD
G01 - MEASURING TESTING
Information
Patent Application
LASER DETECTION SYSTEM AND METHOD
Publication number
20130293882
Publication date
Nov 7, 2013
Alakai Defense Systems, Inc.
Ed Dottery
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR CHEMICAL COMPOSITION MEASUREMENT AND MONITO...
Publication number
20130293893
Publication date
Nov 7, 2013
David Bonyuet
G01 - MEASURING TESTING
Information
Patent Application
MULTISPECTRAL IMAGING COLOR MEASUREMENT SYSTEM AND METHOD FOR PROCE...
Publication number
20130293702
Publication date
Nov 7, 2013
THE HONG KONG RESEARCH INSTITUTE OF TEXTILES AND APPAREL LIMITED
Haozhong Xin
G01 - MEASURING TESTING
Information
Patent Application
Methods and Devices for Optically Determining A Characteristic of a...
Publication number
20130284896
Publication date
Oct 31, 2013
Robert Freese
G01 - MEASURING TESTING
Information
Patent Application
FILTER WHEEL SPECTROMETER
Publication number
20130270440
Publication date
Oct 17, 2013
JAMES TORRANCE RUSSELL
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE APERTURE DEVICE WITH INTEGRAL APERTURE HOLES
Publication number
20130161517
Publication date
Jun 27, 2013
AGILENT TECHNOLOGIES, INC.
Armin Steinke
G01 - MEASURING TESTING