Number | Name | Date | Kind |
---|---|---|---|
3737237 | Zurasky | Jun 1973 | |
4047805 | Sekimura | Sep 1977 |
Entry |
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Franz; I., and W. Langheinrich, "A Simple Non-Destructive Method of Measuring the Thickness of Transparent Thin Films Between 10 and 600 nm, " Solid State Electronics, Pergamon Press, 1968, vol. 11, pp. 59-64. |
Edwards; R. B., "Three Color Laser Interferometer," IBM Technical Disclosure Bulletin, vol. 16, No. 2, Jul. 1973. |