using interferometry

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CPC
G01B11/0675

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/0675using interferometry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
IR absorption and interferometry system for determining a thickness...
- Patent number 12,130,126
- Issue date Oct 29, 2024
- Cargill, Incorporated
- Amina Alaoui
- G01 - MEASURING TESTING
Information Patent Grant
Sheet producing device and sheet producing method
- Patent number 12,098,912
- Issue date Sep 24, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yasuhiro Kabetani
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,051,575
- Issue date Jul 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Tsubasa Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing tear film structure measurement
- Patent number 12,023,099
- Issue date Jul 2, 2024
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Film thickness measurement method, film thickness measurement devic...
- Patent number 12,018,928
- Issue date Jun 25, 2024
- Tokyo Electron Limited
- Kazunaga Ono
- G01 - MEASURING TESTING
Information Patent Grant
Systems for determining at least one condition proximate the system
- Patent number 11,906,282
- Issue date Feb 20, 2024
- Baker Hughes Holdings LLC
- Anusha Chilukuri
- E21 - EARTH DRILLING MINING
Information Patent Grant
Device and method for measuring thickness and refractive index of m...
- Patent number 11,906,281
- Issue date Feb 20, 2024
- Korea Research Institute of Standards and Science
- Young-Sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and non-tra...
- Patent number 11,892,281
- Issue date Feb 6, 2024
- Otsuka Electronics Co., Ltd.
- Shiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining a coating of a probe surface
- Patent number 11,859,962
- Issue date Jan 2, 2024
- BASF Coatings GmbH
- Rolf Doering
- G01 - MEASURING TESTING
Information Patent Grant
Thin films and surface topography measurement using polarization re...
- Patent number 11,761,753
- Issue date Sep 19, 2023
- Svarog LLC
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Grant
Process-induced displacement characterization during semiconductor...
- Patent number 11,682,570
- Issue date Jun 20, 2023
- KLA Corporation
- Pradeep Vukkadala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring interfaces of an optical element
- Patent number 11,662,199
- Issue date May 30, 2023
- FOGALE NANOTECH
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring tear film thickness using optica...
- Patent number 11,614,321
- Issue date Mar 28, 2023
- Topcon Corporation
- Jongsik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 11,607,750
- Issue date Mar 21, 2023
- Kioxia Corporation
- Jiahong Wu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Platform and methods for dynamic thin film measurements using hyper...
- Patent number 11,580,631
- Issue date Feb 14, 2023
- The Board of Trustees of the Leland Stanford Junior University
- Gerald G. Fuller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fountain solution thickness measurement using phase shifted light i...
- Patent number 11,565,516
- Issue date Jan 31, 2023
- Xerox Corporation
- Paul J. McConville
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting substrate and method thereof
- Patent number 11,543,238
- Issue date Jan 3, 2023
- Koh Young Technology Inc.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Grant
Fountain solution thickness measurement using an optical grating su...
- Patent number 11,493,328
- Issue date Nov 8, 2022
- Xerox Corporation
- Chu-heng Liu
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Interferometric fiber optic sensor, fiber optic probe and method of...
- Patent number 11,493,450
- Issue date Nov 8, 2022
- INPHOTECH SP. Z O.O
- Dawid Budnicki
- G01 - MEASURING TESTING
Information Patent Grant
Melt depth determination using infrared interferometric technique i...
- Patent number 11,490,466
- Issue date Nov 1, 2022
- Applied Materials, Inc.
- Jiping Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring the thickness and refractive ind...
- Patent number 11,466,978
- Issue date Oct 11, 2022
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method
- Patent number 11,454,494
- Issue date Sep 27, 2022
- SKYVERSE TECHNOLOGY CO., LTD.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic tape, magnetic tape cartridge, and magnetic tape apparatus
- Patent number 11,423,932
- Issue date Aug 23, 2022
- FUJIFILM Corporation
- Eiki Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Height detection apparatus and coating apparatus equipped with the...
- Patent number 11,402,195
- Issue date Aug 2, 2022
- NTN Corporation
- Hiroaki Ohba
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method for measuring varnish film thickness of printed article and...
- Patent number 11,358,386
- Issue date Jun 14, 2022
- Komori Corporation
- Hiromitsu Numauchi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Magnetic tape, magnetic tape cartridge, and magnetic tape apparatus
- Patent number 11,355,142
- Issue date Jun 7, 2022
- FUJIFILM Corporation
- Eiki Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for contactless and non-destructive determination...
- Patent number 11,333,488
- Issue date May 17, 2022
- Motherson Innovations Company Limited
- Simon Maier
- G01 - MEASURING TESTING
Information Patent Grant
Height detection apparatus and coating apparatus equipped with the...
- Patent number 11,326,871
- Issue date May 10, 2022
- NTN Corporation
- Hiroaki Ohba
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Spectroscopic measuring apparatus and method, and method for fabric...
- Patent number 11,320,259
- Issue date May 3, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-degree-of-freedom heterodyne grating interferometry measurement...
- Patent number 11,307,018
- Issue date Apr 19, 2022
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS
- Publication number 20240377186
- Publication date Nov 14, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
- Publication number 20240280357
- Publication date Aug 22, 2024
- DELMIC IP B.V.
- Daan Benjamin BOLTJE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
- Publication number 20240240934
- Publication date Jul 18, 2024
- Cargill, Incorporated
- Amina ALAOUI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240219170
- Publication date Jul 4, 2024
- SAMSUNG DISPLAY CO., LTD.
- Oh June KWON
- G01 - MEASURING TESTING
Information Patent Application
BUMP MEASUREMENT HEIGHT METROLOGY
- Publication number 20230228559
- Publication date Jul 20, 2023
- Camtek LTD.
- Eyal Segev
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU ETCH RATE OR DEPOSITION RATE MEASUREMENT SYSTEM
- Publication number 20230139375
- Publication date May 4, 2023
- BÜHLER ALZENAU GMBH
- Steffen GUERTLER
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRY ON COMPOSITIONS MANUFACTURED USING THE...
- Publication number 20230082936
- Publication date Mar 16, 2023
- RESEARCH CENTER PHARMACEUTICAL ENGINEERING GMBH
- Matthias WOLFGANG
- G01 - MEASURING TESTING
Information Patent Application
THIN FILMS AND SURFACE TOPOGRAPHY MEASUREMENT USING POLARIZATION RE...
- Publication number 20230035415
- Publication date Feb 2, 2023
- Svarog LLC
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Application
LUBRICANT IMAGE TREATMENT AND ANALYSIS
- Publication number 20230018497
- Publication date Jan 19, 2023
- Oluwaseyi Tope OGUNSOLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILM THICKNESS MEASUREMENT METHOD, FILM THICKNESS MEASUREMENT DEVIC...
- Publication number 20230011226
- Publication date Jan 12, 2023
- TOKYO ELECTRON LIMITED
- Kazunaga ONO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES INMANUF...
- Publication number 20230011748
- Publication date Jan 12, 2023
- Applied Materials, Inc.
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
CONVEYANCE APPARATUS, PLANARIZATION APPARATUS, AND ARTICLE MANUFACT...
- Publication number 20230001608
- Publication date Jan 5, 2023
- Canon Kabushiki Kaisha
- Takashi Hosaka
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
FOUNTAIN SOLUTION THICKNESS MEASUREMENT USING AN OPTICAL GRATING SU...
- Publication number 20220205778
- Publication date Jun 30, 2022
- Xerox Corporation
- Chu-heng LIU
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD FOR EXAMINING A COATING OF A PROBE SURFACE
- Publication number 20220196389
- Publication date Jun 23, 2022
- BASF COATINGS GMBH
- Rolf Doering
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT-TYPE APPARATUS FOR MEASURING WAFER THICKNESS
- Publication number 20220196390
- Publication date Jun 23, 2022
- Fujikoshi Machinery Corp.
- Chihiro MIYAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20220136822
- Publication date May 5, 2022
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR DETERMINING AT LEAST ONE CONDITION PROXIMATE THE SYSTEM
- Publication number 20220107170
- Publication date Apr 7, 2022
- Baker Hughes Holdings LLC
- Anusha Chilukuri
- E21 - EARTH DRILLING MINING
Information Patent Application
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- Publication number 20220102122
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsubasa Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC MEASURING APPARATUS AND METHOD, AND METHOD FOR FABRIC...
- Publication number 20220049949
- Publication date Feb 17, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT
- Publication number 20220007933
- Publication date Jan 13, 2022
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THE THICKNESS AND REFRACTIVE IND...
- Publication number 20220003539
- Publication date Jan 6, 2022
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Young-sik Ghim
- G01 - MEASURING TESTING
Information Patent Application
Process-Induced Displacement Characterization During Semiconductor...
- Publication number 20220005714
- Publication date Jan 6, 2022
- KLA Corporation
- Pradeep Vukkadala
- G05 - CONTROLLING REGULATING
Information Patent Application
SHEET PRODUCING DEVICE AND SHEET PRODUCING METHOD
- Publication number 20210372774
- Publication date Dec 2, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- YASUHIRO KABETANI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
MAGNETIC TAPE, MAGNETIC TAPE CARTRIDGE, AND MAGNETIC TAPE APPARATUS
- Publication number 20210375311
- Publication date Dec 2, 2021
- FUJIFILM CORPORATION
- Eiki Ozawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF M...
- Publication number 20210341283
- Publication date Nov 4, 2021
- Korea Research Institute of Standards and Science
- Young-Sik GHIM
- G02 - OPTICS
Information Patent Application
Platform and methods for dynamic thin film measurements using hyper...
- Publication number 20210264582
- Publication date Aug 26, 2021
- Gerald G. Fuller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20210199575
- Publication date Jul 1, 2021
- Frank Joseph Wessel
- G01 - MEASURING TESTING

using interferometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

IR absorption and interferometry system for determining a thickness...

Sheet producing device and sheet producing method

Plasma processing apparatus and plasma processing method

System and method for performing tear film structure measurement

Film thickness measurement method, film thickness measurement devic...

Systems for determining at least one condition proximate the system

Device and method for measuring thickness and refractive index of m...

Optical measurement system, optical measurement method, and non-tra...

Method for examining a coating of a probe surface

Thin films and surface topography measurement using polarization re...

Process-induced displacement characterization during semiconductor...

Method and device for measuring interfaces of an optical element

Method and apparatus for measuring tear film thickness using optica...

Analysis apparatus and analysis method

Platform and methods for dynamic thin film measurements using hyper...

Fountain solution thickness measurement using phase shifted light i...

Apparatus for inspecting substrate and method thereof

Fountain solution thickness measurement using an optical grating su...

Interferometric fiber optic sensor, fiber optic probe and method of...

Melt depth determination using infrared interferometric technique i...

Apparatus and method for measuring the thickness and refractive ind...

Testing apparatus and testing method

Magnetic tape, magnetic tape cartridge, and magnetic tape apparatus

Height detection apparatus and coating apparatus equipped with the...

Method for measuring varnish film thickness of printed article and...

Magnetic tape, magnetic tape cartridge, and magnetic tape apparatus

Method and device for contactless and non-destructive determination...

Height detection apparatus and coating apparatus equipped with the...

Spectroscopic measuring apparatus and method, and method for fabric...

Two-degree-of-freedom heterodyne grating interferometry measurement...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...

SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

BUMP MEASUREMENT HEIGHT METROLOGY

IN-SITU ETCH RATE OR DEPOSITION RATE MEASUREMENT SYSTEM

LOW COHERENCE INTERFEROMETRY ON COMPOSITIONS MANUFACTURED USING THE...

THIN FILMS AND SURFACE TOPOGRAPHY MEASUREMENT USING POLARIZATION RE...

LUBRICANT IMAGE TREATMENT AND ANALYSIS

FILM THICKNESS MEASUREMENT METHOD, FILM THICKNESS MEASUREMENT DEVIC...

SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES INMANUF...

CONVEYANCE APPARATUS, PLANARIZATION APPARATUS, AND ARTICLE MANUFACT...

FOUNTAIN SOLUTION THICKNESS MEASUREMENT USING AN OPTICAL GRATING SU...

METHOD FOR EXAMINING A COATING OF A PROBE SURFACE

NON-CONTACT-TYPE APPARATUS FOR MEASURING WAFER THICKNESS

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SYSTEMS FOR DETERMINING AT LEAST ONE CONDITION PROXIMATE THE SYSTEM

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Two-Dimensional Second Harmonic Dispersion Interferometer

SPECTROSCOPIC MEASURING APPARATUS AND METHOD, AND METHOD FOR FABRIC...

SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT

APPARATUS AND METHOD FOR MEASURING THE THICKNESS AND REFRACTIVE IND...

Process-Induced Displacement Characterization During Semiconductor...

SHEET PRODUCING DEVICE AND SHEET PRODUCING METHOD

MAGNETIC TAPE, MAGNETIC TAPE CARTRIDGE, AND MAGNETIC TAPE APPARATUS

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF M...

Platform and methods for dynamic thin film measurements using hyper...

Two-Dimensional Second Harmonic Dispersion Interferometer