Number | Name | Date | Kind |
---|---|---|---|
4063080 | Eichelberger et al. | Dec 1977 | |
4503537 | McAnney | Mar 1985 | |
4519078 | Komonytsky | May 1985 | |
4567593 | Bashaw | Jan 1986 | |
4602210 | Fasang et al. | Jul 1986 |
Entry |
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Generalized Scan Test Technique for VLSI Circuits, IBM Technical Disclosure Bulletin, vol. 28, No. 4, Sep. 1985, pp. 1600-1604. |