Number | Name | Date | Kind |
---|---|---|---|
4441075 | McMahon | Apr 1984 | |
4503386 | Das Gupta et al. | Mar 1985 | |
4503537 | McAnney | Mar 1985 | |
4534028 | Trischler | Aug 1985 | |
4580137 | Fiedler et al. | Apr 1986 | |
4597042 | d'Angeac et al. | Jun 1986 |
Entry |
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Generalized Scan Test Technique for VLSI Circuits, IBM Technical Disclosure Bulletin, vol. 28, No. 4, Sep. 1985, pp. 1600-1604. |