Number | Date | Country | Kind |
---|---|---|---|
9-046305 | Feb 1997 | JP | |
9-318347 | Nov 1997 | JP |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/JP98/00732 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO98/38636 | 9/3/1998 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
5431978 | Nakamura et al. | Jul 1995 | A |
Number | Date | Country |
---|---|---|
0 642 123 | Mar 1995 | EP |
62-53886 | Mar 1987 | JP |
63-175242 | Jul 1988 | JP |
06012670 | Jan 1994 | JP |
07078354 | Mar 1995 | JP |
07105574 | Apr 1995 | JP |
08063781 | Mar 1996 | JP |
08197850 | Aug 1996 | JP |
11-149665 | Jun 1999 | JP |
Entry |
---|
Tetsuya Nishida et al., “Single-Beam Overwrite Experiment Using In-Se Based Phase-Change Optical Media”, pp. 667-669, Mar. 16, 1987, U.S.A. |
Atushi Ogura et al., “Grain Growth Observation of <100> Textured Germanium Film By Transmission Electron Microscopy”, pp. 16-18, Jan. 5, 1987, U.S.A. |
Published by OHM Co., “Foundation Of Amorphous Semiconductor”, pp. 20-25, May 25, 1982, Japan. |