Claims
- 1. Photometric apparatus comprising a source of light for projecting light towards a sample to be analyzed, photoelectric means positioned to receive light projected by the source emerging from the sample and having electrical characteristics dependent upon the light received by the photoelectric means, DC power source means for providing DC power at an output thereof to the photoelectric means, indicator means coupled to the photoelectric means, first adjustment means coupled between the photoelectric means and the DC power source means for adjusting the DC power provided to the photoelectric means, and second adjustment means including rectifier means coupled between a source of AC power and the indicator means for providing DC power at an adjustable level to the indicator means.
- 2. The photometric apparatus as recited in claim 1, wherein the first adjustment means comprises a resistive voltage divider coupled between the output of the source of DC power and the photoelectric means.
- 3. The photometric apparatus as recited in claim 2, wherein the photometric means comprises a photoresistor.
- 4. The photometric apparatus as recited in claim 3, wherein the second adjustment means comprises a resistive voltage divider coupled between the source of AC power and the indicator means.
- 5. The photometric apparatus as recited in claim 4, wherein the resistive voltage divider of the second adjustment means comprises a potentiometer having its fixed terminal adapted to be connected across the source of AC power and its adjustable terminal coupled to the rectifier means which in turn is coupled to the indicator means.
- 6. The photometric apparatus as recited in claim 5, wherein the rectifier means comprises a diode connected to provide a negative half-wave rectified voltage to the indicator means and wherein the DC power source means is operative to provide a positive DC voltage to the first adjustment means.
Parent Case Info
This is a division of application Ser. No. 41,475, filed May 22, 1979, which has issued as U.S. Pat. No. 4,291,983.
US Referenced Citations (11)
Non-Patent Literature Citations (1)
Entry |
Schimizu, K. and Ishimaru, A., "Scattering Pattern Analysis of Bacteria", Optical Engineering, vol. 17, No. 2, Mar.-Apr. 1978, pp. 129-134. |
Divisions (1)
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Number |
Date |
Country |
Parent |
041475 |
May 1979 |
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