BRIEF DESCRIPTION OF THE DRAWINGS
The above and other objects, features and advantages of the present invention will become more apparent from the following detailed description of the preferred embodiments thereof made with reference to the accompanying drawings, in which:
FIG. 1 is cross-sectional view of a conventional polishing pad and platen of a CMP apparatus;
FIG. 2A is a schematic diagram of an apparatus for use in manufacturing conventional polishing pads;
FIG. 2B is a perspective view of a product made using the apparatus of FIG. 2A and from which product conventional polishing pads are made;
FIG. 2C is a perspective view of conventional polishing pads produced form the product shown in FIG. 2B;
FIG. 3 is a graph illustrating ideal rates at which various regions of an object should be polished using the polishing pad shown in FIG. 1;
FIG. 4 is a graph illustrating actual rates at which various regions of a metal layer on a substrate are polished using the polishing pad shown in FIG. 1;
FIG. 5 is a graph illustrating actual rates at which various regions of an oxide layer on a substrate are polished using the polishing pad shown in FIG. 1;
FIG. 6 is a plan view of an embodiment of a polishing pad for use in a CMP apparatus according to the present invention;
FIG. 7 is a plan view of a second embodiment of a polishing pad for use in a CMP apparatus according to the present invention;
FIG. 8 is a cross-sectional view of the second embodiment of a polishing pad according to the present invention, illustrating the distribution of slurry on the polishing pad during a CMP process; and
FIG. 9 is an explanatory diagram illustrating a method of manufacturing a polishing pad according to the present invention.