Claims
- 1. A polishing pad comprising a carrier having major surfaces on opposite sides thereof, said major surfaces having longitudinal edges, and at least one of said major surfaces having an abrasive layer structure secured thereto,
- said abrasive layer structure comprising a plurality of elongate strips arranged to extend generally transversely to the longitudinal edges of said at least one major surface in spaced relationship to each other so as to form regions of empty interspaces therebetween, depending pin members being formed on a surface of each of said elongate strips facing said at least one major surface and being clampingly engaged in complementary apertures formed in said at least one major surface so as to constitute a unitary structure with said carrier;
- a base member of said polishing pad having a surface mounting said unitary structure comprising said abrasive layer structure and said carrier, said carrier having a plurality of elongate pin members extending into complementary holes formed in a surface of said base member facing a surface of said carrier opposite the surface of said carrier mounting said plurality of elongate strips, whereby said unitary structure of said abrasive layer of strips and barrier are conjointly detachable from said base member and replaceable by another said unitary structure.
- 2. A polishing pad according to claim 1, wherein each said elongate strip comprises a layer of a non-porous thermoplastic polymer containing a mass of discrete abrasive particles uniformly dispersed therein, the abrasive particles having a particle size of up to 500 microns and being present in the layer in a concentration of up to 30 volume percent, and the layer presenting an abrasive polishing surface.
- 3. A polishing pad according to claim 1, wherein said elongate strips are secured to said one major surface such as to extend diagonally to the longitudinal edges of said surface.
- 4. A polishing pad according to claim 1, wherein said strips are evenly spaced across the carrier surface to which they are secured.
- 5. A polishing pad according to claim 2, wherein said strips cover up to 70% of the carrier surface to which they are secured.
- 6. A polishing pad according to claim 1, wherein each of said strips possesses a convex polishing surface.
- 7. A polishing pad according to claim 2, wherein the particle size of the abrasive particles is in the range 2 to 300 microns.
- 8. A polishing pad according to claim 2, wherein the concentration of abrasive particles in the abrasive layer is in the range 1 to 12 volume percent.
- 9. A polishing pad according to claim 2, wherein the abrasive particles are selected from diamond and cubic boron nitride.
- 10. A polishing pad according to claim 2, wherein the thermoplastic polymer is selected from the group of materials consisting of polyetheretherketone, polyetherketone, polyaryl ether ketone, poly(amide-imide), polyphenylene sulphide, and liquid crystal polymer.
Priority Claims (2)
Number |
Date |
Country |
Kind |
9205664 |
Mar 1992 |
GBX |
|
9221397 |
Oct 1992 |
GBX |
|
Parent Case Info
This is a continuation of application Ser. No. 08/033,561, filed on Mar. 16, 1993, abandoned.
US Referenced Citations (17)
Foreign Referenced Citations (4)
Number |
Date |
Country |
0395162 |
Oct 1990 |
EPX |
2532875 |
Mar 1984 |
FRX |
59-93264 |
May 1984 |
JPX |
60-167770 |
Aug 1985 |
JPX |
Continuations (1)
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Number |
Date |
Country |
Parent |
33561 |
Mar 1993 |
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