Polymer layer on X-ray window

Information

  • Patent Grant
  • 8498381
  • Patent Number
    8,498,381
  • Date Filed
    Thursday, October 7, 2010
    13 years ago
  • Date Issued
    Tuesday, July 30, 2013
    10 years ago
Abstract
An x-ray window comprising a plurality of thin film layers stacked together, including a thin film layer and a polymer layer. The thin film layer can be diamond, graphene, diamond-like carbon, beryllium, and combinations thereof. The polymer layer can be a polyimide. A boron hydride layer may also be included.
Description
BACKGROUND

X-ray windows are designed to allow penetration of x-rays, even low energy x-rays. Desirable characteristics of x-ray windows include (1) minimal x-ray attenuation, (2) gas impenetrability, in order to maintain a vacuum on one side and perhaps ambient air on the other side, (3) corrosion resistance, (4) the ability to withstand high temperatures, and (5) high strength to withstand a pressure differential of at least one atmosphere.


Chemical vapor deposited poly(p-xylylene) polymers, known as parylene, has been used on top of a thin film of a beryllium x-ray window for corrosion protection. It would be beneficial to have an x-ray window that has improved corrosion resistance and improved ability to withstand higher temperatures than x-ray windows with a parylene coating on top of beryllium.


Boron hydride, known by Moxtek's trademark DuraCoat®, has been used on top of a thin film of a beryllium x-ray window for corrosion protection. It would be beneficial to have an x-ray window that has improved gas impenetrability and improved corrosion resistance than x-ray windows with a boron hydride coating on top of beryllium.


SUMMARY

It has been recognized that it would be advantageous to provide an x-ray window x-ray that has improved gas impenetrability, improved corrosion resistance, and improved ability to withstand higher temperatures. The present invention is directed to an x-ray window comprising a plurality of layers stacked together, including a thin film layer and a polymer layer. The thin film layer can be diamond, graphene, diamond-like carbon, beryllium, and combinations thereof. The polymer layer can be a polyimide. A boron hydride layer may also be one of the plurality of layers. A polymer layer and a boron hydride layer can provide improved gas impenetrability and improved corrosion resistance to the thin film layer. Depending on the polymer selected, the x-ray window may be subjected to higher temperatures without breakdown.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a schematic cross-sectional side view of an x-ray window in accordance with an embodiment of the present invention;



FIG. 2 is a schematic cross-sectional side view of an x-ray window attached to a mount in accordance with an embodiment of the present invention;



FIG. 3 is a schematic cross-sectional side view of an x-ray window attached to an x-ray tube in accordance with an embodiment of the present invention;



FIG. 4 is a schematic cross-sectional side view of an x-ray window attached to an x-ray detector in accordance with an embodiment of the present invention; and



FIG. 5 is a schematic cross-sectional side view of an x-ray window attached to a mount in accordance with an embodiment of the present invention.





DEFINITIONS





    • As used in this description and in the appended claims, the word “film” or “layer” means a continuous layer and does not mean a divided structural support such as a plurality of ribs.

    • As used in this description and in the appended claims, the word “boron hydride layer” means a layer comprising boron hydride but may also include other materials.

    • As used in this description and in the appended claims, the word “polymer layer” means a layer comprising a polymer but may also include other materials.

    • As used in this description and in the appended claims, the word “polyimide layer” means a layer comprising polyimide but may also include other materials.

    • As used in this description and in the appended claims, the word “beryllium layer” means a layer comprising beryllium but may also include other materials.





DETAILED DESCRIPTION

Reference will now be made to the exemplary embodiments illustrated in the drawings, and specific language will be used herein to describe the same. It will nevertheless be understood that no limitation of the scope of the invention is thereby intended. Alterations and further modifications of the inventive features illustrated herein, and additional applications of the principles of the inventions as illustrated herein, which would occur to one skilled in the relevant art and having possession of this disclosure, are to be considered within the scope of the invention.


As illustrated in FIG. 1, an x-ray window 10 is shown comprising a plurality of layers 11-13 stacked together, including a thin film layer, a boron hydride layer, and a polymer layer. The thin film layer can comprise a material selected from the group consisting of diamond, graphene, diamond-like carbon, beryllium, and combinations thereof. The x-ray window 10 or layers 11-13 can be substantially transmissive to x-rays having an energy in the range of 100-20,000 electronvolts. Thus, the layers may be sufficiently thin and the layers may be of a material that is substantially transmissive to x-rays. The layers may be disposed in any order such that boron hydride, the thin film layer, or the polymer layer may be disposed between the other two layers. In one aspect, the boron hydride layer 12 can be between the thin film layer 11 and the polymer layer 13. In another aspect, the thin film layer 12 can be between the boron hydride layer 11 and the polymer layer 13. In another aspect, the polymer layer 12 can be between the thin film layer 11 and the boron hydride layer 13.


Beryllium, diamond, graphene, and diamond-like carbon may be selected for x-ray window films due to low atomic numbers of these materials and due to their strength. Boron hydride may be selected for its corrosion resistance properties and its resistance to high temperatures. The use of boron hydride on x-ray windows is described in U.S. Pat. No. 5,226,067, which is incorporated herein by reference. A polymer layer may be added to an x-ray window comprising boron hydride on a thin film in order to improve the corrosion resistance and gas impenetrability of the window.


In one embodiment, the x-ray window or layers may be capable of withstanding a differential pressure of at least 1 atmosphere and capable of withstanding temperatures of greater than 350° C. Use of high temperature polymers, such as a polyimide for the polymer layer, can allow the x-ray window or layers to withstand high temperatures. Use of sufficiently thick layers of materials can allow the window or layers to withstand a differential pressure of at least 1 atmosphere.


In one embodiment, the thin film layer has a thickness of about 5 to 500 micrometers, the boron hydride layer has a thickness of about 20 to 2000 nanometers, and the polymer layer has a thickness of about 50 to 1200 nanometers. In another embodiment, the thin film layer has a thickness of about 5 to 12 micrometers, the boron hydride layer has a thickness of about 800 to 1600 nanometers, and the polymer layer has a thickness of about 20 to 300 nanometers. In another embodiment, the thin film layer has a thickness of about 50 to 1200 nanometers, the boron hydride layer has a thickness of about 20 to 2000 nanometers, and the polymer layer has a thickness of about 50 to 1200 nanometers. Thicknesses of the layers may be selected according to desired window strength, level of corrosion resistance desired, level of gas impenetrability desired, ease of manufacturing, and for minimal x-ray attenuation. The above thickness combinations are believed to provide the desired performance.


As shown in FIG. 2, an x-ray window 20 may be sealed to a mount 24. The mount can be a cylinder with a bore therethrough and an internal annular flange or lip to support the window or layers. A thin film layer 22 can be hermetically sealed to the mount 24, such as the annular flange or lip, at a perimeter of the thin film layer 22 defining a sealed joint 25. The thin film layer 22 may be sealed to the mount by an adhesive, brazing, diffusion bonding, or soldering. A boron hydride layer and a polymer layer, shown together as layer 21 in FIG. 2, can extend beyond the perimeter of the thin film layer 22, and over the sealed joint and onto the mount, thus providing corrosion protection to the sealed joint 25. The boron hydride layer may be disposed between the thin film layer 22 and the polymer layer, or the polymer layer may be disposed between the thin film layer 22 and the boron hydride layer. The boron hydride layer and polymer layer, shown together as layer 21 in FIG. 2, may be called a first boron hydride layer and a first polymer layer.


Also shown in FIG. 2, a second boron hydride layer 23 can be disposed on an opposite side of the thin film layer 22 from the first boron hydride layer and first polymer layer 21. The second boron hydride layer 23 can extend beyond the perimeter of the thin film layer 22 and onto the mount or annular flange or lip to cover the sealed joint 25, and the second boron hydride layer can provide corrosion protection to the sealed joint.


The second boron hydride layer 23 may further comprise a second polymer layer. The second polymer layer can be disposed on an opposite side of the thin film layer 22 from the first polymer layer. The second polymer layer can extend beyond the perimeter of the thin film layer to cover the sealed joint 25. The second polymer layer can provide corrosion protection to the sealed joint. The second boron hydride layer may be disposed between the thin film layer 22 and the second polymer layer, or the second polymer layer may be disposed between the thin film layer 22 and the second boron hydride layer.


As shown in FIG. 3, various embodiments, shown generally at 30, of the x-ray window 31 described herein may be mounted on an x-ray tube 32, thus forming a hermetically tight enclosure. The x-ray tube can be a cylinder closed at both ends to form a vacuum, and with a cathode element and cathode 33 at one end, and with an anode 34 and the window 31 at the opposite end.


As shown in FIG. 4, various embodiments, shown generally at 40, of the x-ray window 31 described herein may be attached to a mount 24 and an x-ray detector 42. The x-ray window (or layers) can allow x-rays, represented by 41, to impinge upon the detector 42.


As shown in FIG. 5, an x-ray window 50 can comprise a beryllium layer 52 and a polyimide layer 51 disposed over the beryllium layer. The beryllium layer can be hermetically sealed to a mount 24 or the annular flange or lip at a perimeter of the beryllium layer defining a sealed joint 25. The polyimide layer 51 can extend beyond the perimeter of the beryllium layer 52 and onto the mount, and the polyimide layer 51 can provide corrosion protection to the sealed joint 25. The beryllium and polyimide layers can be substantially transmissive to x-rays having an energy in the range of 100-20,000 electronvolts, and can be capable of withstanding a differential pressure of at least 1 atmosphere and capable of withstanding temperatures of greater than 350° C. A second layer 53 can be disposed on an opposing side of the beryllium layer 52 from the polyimide layer 51. The second layer may be a polymer layer, a polyimide layer, a boron hydride layer or combinations thereof. The second layer 53 can extend beyond the perimeter of the beryllium layer 52 and onto the mount, and can provide corrosion protection to the sealed joint 25.


In one embodiment, the beryllium layer 52 has a thickness of about 5 to 500 micrometers and the polyimide layer 51 has a thickness of about 50 to 1200 nanometers. In another embodiment, the beryllium layer 52 has a thickness of about 5 to 12 micrometers and the polyimide layer 51 has a thickness of about 20 to 300 nanometers. In another embodiment, the beryllium layer 52 has a thickness of about 50 to 1200 nanometers and the polyimide layer 51 has a thickness of about 50 to 1200 nanometers.


Layers may be made by chemical vapor deposition, spin-on, or spray on.


It is to be understood that the above-referenced arrangements are only illustrative of the application for the principles of the present invention. Numerous modifications and alternative arrangements can be devised without departing from the spirit and scope of the present invention. While the present invention has been shown in the drawings and fully described above with particularity and detail in connection with what is presently deemed to be the most practical and preferred embodiment(s) of the invention, it will be apparent to those of ordinary skill in the art that numerous modifications can be made without departing from the principles and concepts of the invention as set forth herein.

Claims
  • 1. An x-ray window comprising a plurality of layers stacked together, including: a) a thin film layer comprising a material selected from the group consisting of diamond, graphene, diamond-like carbon, beryllium, and combinations thereof;b) a boron hydride layer;c) a polymer layer; andd) wherein the boron hydride layer is disposed between the thin film layer and the polymer layer.
  • 2. The x-ray window of claim 1, wherein the plurality of layers are substantially transmissive to x-rays having an energy in the range of 100-20,000 electronvolts.
  • 3. The x-ray window of claim 1, wherein the polymer layer comprises a polyimide.
  • 4. The x-ray window of claim 1, wherein: a) the thin film layer has a thickness of about 5 to 500 micrometers;b) the boron hydride layer has a thickness of about 20 to 2000 nanometers; andc) the polymer layer has a thickness of about 50 to 1200 nanometers.
  • 5. The x-ray window of claim 1, wherein: a) the thin film layer has a thickness of about 5 to 12 micrometers;b) the boron hydride layer has a thickness of about 800 to 1600 nanometers; andc) the polymer layer has a thickness of about 20 to 300 nanometers.
  • 6. The x-ray window of claim 1, wherein: a) the thin film layer has a thickness of about 50 to 1200 nanometers;b) the boron hydride layer has a thickness of about 20 to 2000 nanometers; andc) the polymer layer has a thickness of about 50 to 1200 nanometers.
  • 7. The x-ray window of claim 1, further comprising a mount, and wherein: a) the thin film layer is hermetically sealed to the mount at a perimeter of the thin film layer defining a sealed joint;b) the boron hydride layer and the polymer layer extend beyond the perimeter of the thin film layer; andc) the boron hydride layer and the polymer layer providing corrosion protection to the sealed joint.
  • 8. The x-ray window of claim 7, wherein the boron hydride layer is a first boron hydride layer, and further comprising: a) a second boron hydride layer disposed on an opposite side of the thin film layer from the first boron hydride layer;b) the second boron hydride layer extending beyond the perimeter of the thin film layer to cover the sealed joint; andc) the second boron hydride layer providing corrosion protection to the sealed joint.
  • 9. The x-ray window of claim 7, wherein the polymer layer is a first polymer layer, and further comprising: a) a second polymer layer disposed on an opposite side of the thin film layer from the first polymer layer;b) the second polymer layer extending beyond the perimeter of the thin film layer to cover the sealed joint; andc) the second polymer layer providing corrosion protection to the sealed joint.
  • 10. The x-ray window of claim 7, wherein: a) the plurality of layers is capable of withstanding a differential pressure of at least 1 atmosphere; andb) the plurality layers is capable of withstand temperatures of greater than 350° C.
  • 11. The x-ray window of claim 7, wherein the thin film layer is hermetically sealed to the mount by diffusion bonding, brazing, or soldering.
  • 12. An x-ray window comprising a plurality of layers stacked together, including: a) a thin film layer comprising a material selected from the group consisting of diamond, graphene, diamond-like carbon, beryllium, and combinations thereof, the thin film layer having a thickness of about 50 to 1200 nanometers;b) a boron hydride layer having a thickness of about 20 to 2000 nanometers; andc) a polymer layer having a thickness of about 50 to 1200 nanometers.
  • 13. The x-ray window of claim 12 further comprising a mount with the thin film layer hermetically sealed thereto at a perimeter of the thin film layer defining a sealed joint, the polymer layer extending beyond the perimeter of the thin film layer, and the polymer layer providing corrosion protection to the sealed joint.
  • 14. The x-ray window of claim 12, wherein the thin film layer is disposed between the boron hydride layer and the polymer layer.
  • 15. An x-ray window comprising: a) a plurality of layers stacked together, including: i) a thin film layer comprising a material selected from the group consisting of diamond, graphene, diamond-like carbon, beryllium, and combinations thereof;ii) a boron hydride layer;iii) a first polymer layer and a second polymer layer;iv) the first polymer layer disposed on one side of the thin film layer and the second polymer layer disposed on an opposite side of the thin film layer;b) a mount;c) the thin film layer is hermetically sealed to the mount at a perimeter of the thin film layer defining a sealed joint;d) the boron hydride layer, the first polymer layer, and the second polymer layer extend beyond the perimeter of the thin film layer; ande) the boron hydride layer, the first polymer layer, and the second polymer layer provide corrosion protection to the sealed joint.
  • 16. The x-ray window of claim 15, wherein the thin film layer is hermetically sealed to the mount by diffusion bonding, brazing, or soldering.
  • 17. The x-ray window of claim 15, wherein the boron hydride layer is a first boron hydride layer, and further comprising: a) a second boron hydride layer disposed on an opposite side of the thin film layer from the first boron hydride layer;b) the second boron hydride layer extending beyond the perimeter of the thin film layer to cover the sealed joint; andc) the second polyimide layer providing corrosion protection to the sealed joint.
  • 18. The x-ray window of claim 15, wherein the thin film layer comprises beryllium and the polymer layer comprises polyimide.
US Referenced Citations (231)
Number Name Date Kind
1276706 Snook et al. May 1918 A
1881448 Forde et al. Oct 1932 A
1946288 Kearsley Feb 1934 A
2291948 Cassen Aug 1942 A
2316214 Atlee et al. Apr 1943 A
2329318 Atlee et al. Sep 1943 A
2340363 Atlee et al. Feb 1944 A
2502070 Atlee et al. Mar 1950 A
2683223 Hosemann Jul 1954 A
2952790 Steen Sep 1960 A
3397337 Denholm Aug 1968 A
3538368 Oess Nov 1970 A
3665236 Gaines et al. May 1972 A
3679927 Kirkendall Jul 1972 A
3691417 Gralenski Sep 1972 A
3741797 Chavasse, Jr. et al. Jun 1973 A
3751701 Gralenski et al. Aug 1973 A
3801847 Dietz Apr 1974 A
3828190 Dahlin et al. Aug 1974 A
3882339 Rate et al. May 1975 A
3962583 Holland et al. Jun 1976 A
3970884 Golden Jul 1976 A
4007375 Albert Feb 1977 A
4075526 Grubis Feb 1978 A
4160311 Ronde et al. Jul 1979 A
4178509 More et al. Dec 1979 A
4184097 Auge Jan 1980 A
4293373 Greenwood Oct 1981 A
4368538 McCorkle Jan 1983 A
4393127 Greschner et al. Jul 1983 A
4443293 Mallon et al. Apr 1984 A
4463257 Simpkins et al. Jul 1984 A
4463338 Utner et al. Jul 1984 A
4521902 Peugeot Jun 1985 A
4532150 Endo et al. Jul 1985 A
4573186 Reinhold Feb 1986 A
4576679 White Mar 1986 A
4584056 Perret et al. Apr 1986 A
4591756 Avnery May 1986 A
4608326 Neukermans et al. Aug 1986 A
4645977 Kurokawa et al. Feb 1987 A
4675525 Amingual et al. Jun 1987 A
4679219 Ozaki Jul 1987 A
4688241 Peugeot Aug 1987 A
4696994 Nakajima Sep 1987 A
4705540 Hayes Nov 1987 A
4777642 Ono Oct 1988 A
4797907 Anderton Jan 1989 A
4818806 Kunimune et al. Apr 1989 A
4819260 Haberrecker Apr 1989 A
4862490 Karnezos et al. Aug 1989 A
4870671 Hershyn Sep 1989 A
4876330 Higashi et al. Oct 1989 A
4878866 Mori et al. Nov 1989 A
4885055 Woodbury et al. Dec 1989 A
4891831 Tanaka et al. Jan 1990 A
4933557 Perkins Jun 1990 A
4939763 Pinneo et al. Jul 1990 A
4957773 Spencer et al. Sep 1990 A
4960486 Perkins et al. Oct 1990 A
4969173 Valkonet Nov 1990 A
4979198 Malcolm et al. Dec 1990 A
4979199 Cueman et al. Dec 1990 A
5010562 Hernandez et al. Apr 1991 A
5063324 Grunwald et al. Nov 1991 A
5066300 Isaacson et al. Nov 1991 A
5077771 Skillicorn et al. Dec 1991 A
5077777 Daly Dec 1991 A
5090046 Friel Feb 1992 A
5105456 Rand et al. Apr 1992 A
5117829 Miller et al. Jun 1992 A
5153900 Nomikos et al. Oct 1992 A
5161179 Suzuki et al. Nov 1992 A
5173612 Imai et al. Dec 1992 A
5217817 Verspui et al. Jun 1993 A
5226067 Allred et al. Jul 1993 A
RE34421 Parker et al. Oct 1993 E
5258091 Imai et al. Nov 1993 A
5267294 Kuroda et al. Nov 1993 A
5302523 Coffee et al. Apr 1994 A
5343112 Wegmann Aug 1994 A
5391958 Kelly Feb 1995 A
5392042 Pellon Feb 1995 A
5400385 Blake et al. Mar 1995 A
5422926 Smith et al. Jun 1995 A
5428658 Oettinger et al. Jun 1995 A
5432003 Plano et al. Jul 1995 A
5469429 Yamazaki et al. Nov 1995 A
5469490 Golden et al. Nov 1995 A
5478266 Kelly Dec 1995 A
5521851 Wei et al. May 1996 A
5524133 Neale et al. Jun 1996 A
RE35383 Miller et al. Nov 1996 E
5571616 Phillips et al. Nov 1996 A
5578360 Viitanen Nov 1996 A
5602507 Suzuki Feb 1997 A
5607723 Plano et al. Mar 1997 A
5621780 Smith et al. Apr 1997 A
5627871 Wang May 1997 A
5631943 Miles May 1997 A
5673044 Pellon Sep 1997 A
5680433 Jensen Oct 1997 A
5682412 Skillicorn et al. Oct 1997 A
5696808 Lenz Dec 1997 A
5706354 Stroehlein Jan 1998 A
5729583 Tang et al. Mar 1998 A
5740228 Schmidt et al. Apr 1998 A
5774522 Warburton Jun 1998 A
5812632 Schardt et al. Sep 1998 A
5835561 Moorman et al. Nov 1998 A
5870051 Warburton Feb 1999 A
5898754 Gorzen Apr 1999 A
5907595 Sommerer May 1999 A
6002202 Meyer et al. Dec 1999 A
6005918 Harris et al. Dec 1999 A
6044130 Inazura et al. Mar 2000 A
6062931 Chuang et al. May 2000 A
6063629 Knoblauch May 2000 A
6069278 Chuang May 2000 A
6073484 Miller et al. Jun 2000 A
6075839 Treseder Jun 2000 A
6097790 Hasegawa et al. Aug 2000 A
6129901 Moskovits et al. Oct 2000 A
6133401 Jensen Oct 2000 A
6134300 Trebes et al. Oct 2000 A
6184333 Gray Feb 2001 B1
6205200 Boyer et al. Mar 2001 B1
6277318 Bower Aug 2001 B1
6282263 Arndt et al. Aug 2001 B1
6288209 Jensen Sep 2001 B1
6307008 Lee et al. Oct 2001 B1
6320019 Lee et al. Nov 2001 B1
6351520 Inazaru Feb 2002 B1
6385294 Suzuki et al. May 2002 B2
6388359 Duelli et al. May 2002 B1
6438207 Chidester et al. Aug 2002 B1
6477235 Chornenky et al. Nov 2002 B2
6487272 Kutsuzawa Nov 2002 B1
6487273 Takenaka et al. Nov 2002 B1
6494618 Moulton Dec 2002 B1
6546077 Chornenky et al. Apr 2003 B2
6567500 Rother May 2003 B2
6645757 Okandan et al. Nov 2003 B1
6646366 Hell et al. Nov 2003 B2
6658085 Sklebitz Dec 2003 B2
6661876 Turner et al. Dec 2003 B2
6740874 Doring May 2004 B2
6778633 Loxley et al. Aug 2004 B1
6799075 Chornenky et al. Sep 2004 B1
6803570 Bryson, III et al. Oct 2004 B1
6816573 Hirano et al. Nov 2004 B2
6819741 Chidester Nov 2004 B2
6838297 Iwasaki Jan 2005 B2
6852365 Smart et al. Feb 2005 B2
6866801 Mau et al. Mar 2005 B1
6876724 Zhou Apr 2005 B2
6900580 Dai et al. May 2005 B2
6956706 Brandon Oct 2005 B2
6962782 Livache et al. Nov 2005 B1
6976953 Pelc Dec 2005 B1
6987835 Lovoi Jan 2006 B2
7035379 Turner et al. Apr 2006 B2
7046767 Okada et al. May 2006 B2
7049735 Ohkubo et al. May 2006 B2
7075699 Oldham et al. Jul 2006 B2
7085354 Kanagami Aug 2006 B2
7108841 Smally Sep 2006 B2
7130380 Lovoi et al. Oct 2006 B2
7130381 Lovoi et al. Oct 2006 B2
7189430 Ajayan et al. Mar 2007 B2
7203283 Puusaari Apr 2007 B1
7206381 Shimono et al. Apr 2007 B2
7215741 Ukita May 2007 B2
7224769 Turner May 2007 B2
7233071 Furukawa et al. Jun 2007 B2
7233647 Turner et al. Jun 2007 B2
7286642 Ishikawa et al. Oct 2007 B2
7305066 Ukita Dec 2007 B2
7358593 Smith et al. Apr 2008 B2
7382862 Bard et al. Jun 2008 B2
7428298 Bard et al. Sep 2008 B2
7448801 Oettinger et al. Nov 2008 B2
7448802 Oettinger et al. Nov 2008 B2
7486774 Cain Feb 2009 B2
7526068 Dinsmore Apr 2009 B2
7529345 Bard et al. May 2009 B2
7618906 Meilahti Nov 2009 B2
7634052 Grodzins Dec 2009 B2
7649980 Aoki et al. Jan 2010 B2
7650050 Haffner et al. Jan 2010 B2
7657002 Burke et al. Feb 2010 B2
7680652 Giesbrecht et al. Mar 2010 B2
7684545 Damento et al. Mar 2010 B2
7693265 Hauttmann et al. Apr 2010 B2
7709820 Decker et al. May 2010 B2
7737424 Xu et al. Jun 2010 B2
7756251 Davis et al. Jul 2010 B2
20020075999 Rother Jun 2002 A1
20020094064 Zhou Jul 2002 A1
20030096104 Tobita et al. May 2003 A1
20030117770 Montgomery et al. Jun 2003 A1
20030122111 Glatkowski Jul 2003 A1
20030152700 Asmussen et al. Aug 2003 A1
20030165418 Ajayan et al. Sep 2003 A1
20040076260 Charles, Jr. et al. Apr 2004 A1
20050018817 Oettinger et al. Jan 2005 A1
20050141669 Shimono et al. Jun 2005 A1
20050207537 Ukita Sep 2005 A1
20060073682 Furukawa et al. Apr 2006 A1
20060098778 Oettinger et al. May 2006 A1
20060233307 Dinsmore Oct 2006 A1
20060269048 Cain Nov 2006 A1
20070025516 Bard et al. Feb 2007 A1
20070087436 Miyawaki et al. Apr 2007 A1
20070111617 Meilahti May 2007 A1
20070133921 Haffner et al. Jun 2007 A1
20070142781 Sayre Jun 2007 A1
20070165780 Durst et al. Jul 2007 A1
20070183576 Burke et al. Aug 2007 A1
20080199399 Chen et al. Aug 2008 A1
20080296479 Anderson et al. Dec 2008 A1
20080296518 Xu et al. Dec 2008 A1
20080317982 Hecht Dec 2008 A1
20090085426 Davis et al. Apr 2009 A1
20090086923 Davis et al. Apr 2009 A1
20100126660 O'Hara May 2010 A1
20100239828 Cronaby et al. Sep 2010 A1
20100243895 Xu et al. Sep 2010 A1
20100248343 Aten et al. Sep 2010 A1
20100285271 Davis et al. Nov 2010 A1
20100323419 Aten et al. Dec 2010 A1
Foreign Referenced Citations (31)
Number Date Country
1030936 May 1958 DE
4430623 Mar 1996 DE
19818057 Nov 1999 DE
0297808 Jan 1989 EP
0330456 Aug 1989 EP
1252290 Nov 1971 GB
57082954 Aug 1982 JP
3170673 Jul 1991 JP
05066300 Mar 1993 JP
5135722 Jun 1993 JP
06119893 Jul 1994 JP
6289145 Oct 1994 JP
6343478 Dec 1994 JP
8315783 Nov 1996 JP
2003007237 Jan 2003 JP
2003088383 Mar 2003 JP
2003510236 Mar 2003 JP
20033211396 Jul 2003 JP
4171700 Jun 2006 JP
2006297549 Nov 2006 JP
10-2005-0107094 Nov 2005 KR
WO 96-19738 Jun 1996 WO
WO9965821 Dec 1999 WO
WO0009443 Feb 2000 WO
WO0017102 Mar 2000 WO
WO03076951 Sep 2003 WO
WO 2008052002 May 2008 WO
WO 2009009610 Jan 2009 WO
WO 2009045915 Apr 2009 WO
WO 2009085351 Jul 2009 WO
WO 2010107600 Sep 2010 WO
Non-Patent Literature Citations (80)
Entry
U.S. Appl. No. 12/239,281, filed Sep. 26, 2008; Robert C. Davis; office action issued Dec. 13, 2011.
U.S. Appl. No. 12/814,912, filed Jun. 14, 2010; Degao Xu; office action issued Dec. 5, 2011.
Vajtai et al; Building Carbon Nanotubes and Their Smart Architectures; Smart Mater. Struct. 2002; pp. 691-698; vol. 11.
PCT Application PCT/US2011/046371; filed Aug. 3, 2011; Steven Liddiard; International Search Report mailed Feb. 29, 2012.
Anderson et al., U.S. Appl. No. 11/756,962, filed Jun. 1, 2007.
Barkan et al., “Improved window for low-energy x-ray transmission a Hybrid design for energy-dispersive microanalysis,” Sep. 1995, 2 pages, Ectroscopy 10(7).
Blanquart et al.; “XPAD, a New Read-out Pixel Chip for X-ray Counting”; IEEE Xplore; Mar. 25, 2009.
Chen, Xiaohua et al., “Carbon-nanotube metal-matrix composites prepared by electroless plating,” Composites Science and Technology, 2000, pp. 301-306, vol. 60.
Comfort, J. H., “Plasma-enhanced chemical vapor deposition of in situ doped epitaxial silicon at low temperatures,” J. Appl. Phys. 65, 1067 (1989).
Das, D. K., and K. Kumar, “Chemical vapor deposition of boron on a beryllium surface,” Thin Solid Films, 83(1), 53-60.
Das, K., and Kumar, K., “Tribological behavior of improved chemically vapor-deposited boron on beryllium,” Thin Solid Films, 108(2), 181-188.
Flahaut, E. et al, “Carbon Nanotube-metal-oxide nanocomposites; microstructure, electrical conductivity and mechanical properties,” Acta mater., 2000, pp. 3803-3812.Vo. 48.
Gevin, et al IDe-XV1.0: Performances of a New CMOS Multi channer Analogue Readout ASIC for Cd (Zn) Te Detectors; IEEE 2005.
Grybos et al.; “DEDIX—Development of Fully Integrated Multichannel ASIC for High Count Rate Digital X-ray Imagining systems”; IEEE 2006; Nuclear Science Symposium Conference Record.
Grybos, “Pole-Zero Cancellations Circuit With Pulse Pile-Up Tracking System for Low Noise Charge-Sensitive Amplifiers”; Mar. 25, 2009; from IEEE Xplore.
Grybos, et al “Measurements of Matching and High Count Rate Performance of Multichannel ASIC for Digital X-Ray Imaging Systems”; IEEE Transactions on Nuclear Science, vol. 54, No. 4, 2007.
Hanigofsky, J. A., K. L. More, and W. J. Lackey, “Composition and microstructure of chemically vapor-deposited boron nitride, aluminum nitride, and boron nitride + aluminum nitride composites,” J. Amer. Ceramic Soc. 74, 301 (1991).
hhtp://www.orau.org/ptp/collection/xraytubescollidge/MachelettCW250.htm, 1999, 2 pgs.
http://www.orau.org/ptp/collectio/xraytubescollidge/MachlettCW250T.htm, 1999, 2 pages.
Hutchison, “Vertically aligned carbon nanotubes as a framework for microfabrication of high aspect ration mems,” 2008, pp. 1-50.
Jiang, et al; “Carbon nanotubes-metal nitride composites: a new class of nanocomposites with enhanced electrical properties”; Jun. 25, 2004 ; J. Mater. Chem, 2005.
Jiang, Linquin et al., “Carbon nanotubes-metal nitride composites; a new class of nanocomposites with enhanced electrical properties,” J. Mater. Chem., 2005, pp. 260-266, vol. 15.
Komatsu, S., and Y. Moriyoshi, “Influence of atomic hydrogen on the growth reactions of amorphous boron films in a low-pressure B.sub.2 H.sub.6 +He+H.sub.2 plasma”, J. Appl. Phys. 64, 1878 (1988).
Komatsu, S., and Y. Moriyoshi, “Transition from amorphous to crystal growth of boron films in plasma-enhanced chemical vapor deposition with B.sub.2 H.sub.6 +He,” J. Appl. Phys., 66, 466 (1989).
Komatsu, S., and Y. Moriyoshi, “Transition from thermal-to electron-impact decomposition of diborane in plasma-enhanced chemical vapor deposition of boron films from B.sub.2 H.sub.6 +He,” J. Appl. Phys. 66, 1180 (1989).
Lee, W., W. J. Lackey, and P. K. Agrawal, “Kinetic analysis of chemical vapor deposition of boron nitride,” J. Amer. Ceramic Soc. 74, 2642 (1991).
Li, Jun et al., “Bottom-up approach for carbon nanotube interconnects,” Applied Physics Letters, Apr. 14, 2003, pp. 2491-2493, vol. 82 No. 15.
Lines, U.S. Appl. No. 12/352,864, filed Jan. 13, 2009.
Lines, U.S. Appl. No. 12/726,120, filed Mar. 17, 2010.
Ma. R.Z., et al., “Processing and properties of carbon nanotubes-nano-SIC ceramic”, Journal of Materials Science 1998, pp. 5243-5246, vol. 33.
Maya, L., and L. A. Harris, “Pyrolytic deposition of carbon films containing nitrogen and/or boron,” J. Amer. Ceramic Soc. 73, 1912 (1990).
Michaelidis, M., and R. Pollard, “Analysis of chemical vapor deposition of boron,” J. Electrochem. Soc. 132, 1757 (1985).
Micro X-ray Tube Operation Manual, X-ray and Specialty Instruments Inc., 1996, 5 pages.
Micro X-Ray Tubem Operation Manual, X-ray and Speciality Instruments, Inc., 1996, 5 pgs.
Moore, A. W., S. L. Strong, and G. L. Doll, “Properties and characterization of codeposited boron nitride and carbon materials,” J. Appl. Phys. 65, 5109 (1989).
Nakamura, K., “Preparation and properties of amorphous boron nitride films by molecular flow chemical vapor deposition,” J. Electrochem. Soc. 132, 1757 (1985).
Panayiotatos, et al., “Mechanical performance and growth characteristics of boron nitride films with respect to their optical, compositional properties and density,” Surface and Coatings Technology, 151-152 (2002) 155-159.
PCT Application PCT/US08/65346; filed May 30, 2008; Keith Decker.
PCT Application PCT/US10/56011; filed Nov. 9, 2010; Krzysztof Kozaczek.
Peigney, et al., “Carbon nanotubes in novel ceramic matrix nanocomposites,” Ceramics International, 2000, pp. 677-683, vol. 26.
Perkins, F. K., R. A. Rosenberg, and L. Sunwoo, “Synchrotronradiation deposition of boron and boron carbide films from boranes and carboranes: decaborane,” J. Appl. Phys. 69,4103 (1991).
Powell et al., “Metalized polyimide filters for x-ray astronomy and other applications,” SPIE, pp. 432-440, vol. 3113.
Rankov. A. “A Novel Correlated Double Sampling Poly-Si Circuit for Readout System in Large Area X-Ray Sensors”, 2005.
Roca i Cabarrocas, P., S. Kumar, and B. Drevillon, “In situ study of the thermal decomposition of B.sub.2 H.sub.6 by combining spectroscopic ellipsometry and Kelvin probe measurements,” J. Appl. Phys. 66, 3286 (1989).
Satishkumar B.C., et al. “Synthesis of metal oxide nanorods using carbon nanotubes as templates,” Journal of Materials Chemistry, 2000, pp. 2115-2119, vol. 10.
Scholze et al., “Detection efficiency of energy-dispersive detectors with low-energy windows” X-Ray Spectrometry, X-Ray Spectrom, 2005: 34: 473-476.
Sheather Journal Physil 1973, pp. 319-322, vol. 6, No. 4.
Sheather, “The support of thin windows for x-ray proportional counters,” Journal Phys,E., Apr. 1973, pp. 319-322, vol. 6, No. 4.
Shirai, K., S.-I. Gonda, and S. Gonda, “Characterization of hydrogenated amorphous boron films prepared by electron cyclotron resonance plasma chemical vapor deposition method,” J. Appl. Phys. 67, 6286 (1990).
Tamura, et al “Developmenmt of ASICs for CdTe Pixel and Line Sensors”, IEEE Transactions on Nuclear Science, vol. 52, No. 5, Oct. 2005.
Tien-Hui Lin et al., “An investigation on the films used as teh windows of ultra-soft X-ray counters.” Acta Physica Sinica, vol. 27, No. 3, pp. 276-283, May 1978, abstract only.
U.S. Appl. No. 12/640,154, filed Dec. 17, 2009; Krzysztof Kozaczek.
U.S. Appl. No. 12/726,120, filed Mar. 17, 2010; Michael Lines.
U.S. Appl. No. 12/783,707, filed May 20, 2010; Steven D. Liddiard.
U.S. Appl. No. 13/018,667, filed Feb. 1, 2011; Lei Pei.
Vandenbulcke, L. G., “Theoretical and experimental studies on the chemical vapor deposition of boron carbide,” Indust. Eng. Chem. Prod. Res. Dev. 24, 568 (1985).
Viitanen Veli-Pekka et al., Comparison of Ultrathin X-Ray Window Designs, presented at the Soft X-rays in the 21st Century Conference held in Provo, utah Feb. 10-13, 1993, pp. 182-190.
Wagner et al, “Effects of Scatter in Dual-Energy Imaging: An Alternative Analysis”; IEEE; Sep. 1989, vol. 8. No. 3.
Winter, J., H. G. Esser, and H. Reimer, “Diborane-free boronization,” Fusion Technol. 20, 225 (1991).
www.moxtek,com, Moxtek, Sealed Proportional Counter X-Ray Windows, Oct. 2007, 3 pages.
www.moxtek.com, Moxtek, AP3 Windows, Ultra-thin Polymer X-Ray Windows, Sep. 2006, 2 pages.
www.moxtek.com, Moxtek, DuraBeryllium X-Ray Windows, May 2007, 2 pages.
www.moxtek.com, Moxtek, ProLine Series 10 Windows, Ultra-thin Polymer X-Ray Windows, Sep. 2006, 2 pages.
www.moxtek.com, X-Ray Windows, ProLINE Series 20 Windows Ultra-thin Polymer X-ray Windows, 2 pages. Applicant believes that this product was offered for sale prior to the filing date of applicant's application.
Yan, Xing-Bin, et al., Fabrications of Three-Dimensional ZnO-Carbon Nanotube (CNT) Hybrids Using Self-Assembled CNT Micropatterns as Framework, 2007. pp. 17254-17259, vol. III.
U.S. Appl. No. 12/640,154, filed Dec. 17, 2009; Krzysztof Kozaczek; office action issued Apr. 26, 20111.
U.S. Appl. No. 12/640,154, filed Dec. 17, 2009; Krzysztof Kozaczek; office action issued Jun. 9, 2011.
U.S. Appl. No. 12/407,457, filed Mar. 19, 2009; Sterling W. Cornaby; office action issued Jun. 14, 2011.
U.S. Appl. No. 12/640,154, filed Dec. 17, 2009; Krzysztof Kozaczek; notice of allowance issued May 23, 2011.
U.S. Appl. No. 12/239,302, filed Sep. 26, 2008; Robert C. Davis; office action issued May 26, 2011.
Vajtai et al.; Building Carbon Nanotubes and Their Smart Architectures; Smart Mater. Struct.; 2002; pp. 691-698; vol. 11.
U.S. Appl. No. 12/783,707, filed May 20, 2010; Steven D. Liddiard; office action issued Jun. 22, 2012.
U.S. Appl. No. 13/018,667, filed Feb. 1, 2011; Robert C. Davis; office action issued Apr. 26, 2012.
U.S. Appl. No. 12/239,281, filed Sep. 26, 2008; Robert C. Davis; office action issued May 24, 2012.
U.S. Appl. No. 13/209,862, filed Aug. 15, 2011; Sterling W. Cornaby; notice of allowance issued Oct. 9, 2012.
PCT Application PCT/US2010/056011; filed Nov. 9, 2010; Krzysztof Kozaczek; International Search Report mailed Jul. 13, 2011.
Chakrapani et al.; Capillarity-Driven Assembly of Two-Dimensional Cellular Carbon Nanotube Foams; PNAS; Mar. 23, 2004; pp. 4009-4012; vol. 101; No. 12.
Nakajima et al.; Trial Use of Carbon-Fiber-Reinforced Plastic as a Non-Bragg Window Material of X-Ray Transmission; Rev. Sci. Instrum.; Jul. 1989; pp. 2432-2435 ; vol. 60; No. 7.
U.S. Appl. No. 12/783,707, filed May 20, 2010; Steven D. Liddiard; office action dated Sep. 20, 2012.
U.S. Appl. No. 13/018,667, filed Feb. 1, 2011; Robert C. Davis; office action dated Oct. 2, 2012.
Related Publications (1)
Number Date Country
20120087476 A1 Apr 2012 US