Martinez-Celorio et al, Extension of the displacement measurement range for ESSPI using carrier fringes and a temporal-phase-unrapping method, SPIE, 751-757.* |
Siew-Lok Toh et al, “Using shearography to find the flaws”, Mechanical Engineering, Feb. 1999, pp. 62-63. |
S. Nakadate et al, “Fringe scanning speckle-pattern interferometry”, Applied Optics, v. 24, No. 14 (1985), pp. 2172-2180. |
Y. Y. Hung et al, “Measurement of Slopes of Structural Deflections by Speckle-shearing Interferometry”, Exp. Mech. 1974. |
J. A. Leendertz et al, “An image-shearing speckle-pattern interferometer etc.”, J. Phys. E., 1973, pp. 1107-1110. |