Claims
- 1. A positive resist composition comprising a hydroxypolyamide represented by the following formula (I) and a photoactive component: wherein R1 and R3 may be the same or different and are each a tetravalent aromatic group; R2 is a bivalent aromatic group; n is an integer of 2 to 150; and Z is a monovalent organic group and at least 40% of Z is a group represented by the following structural formula (II):—X—R4—(COOH)m (II) wherein X is a carbonyl group or a sulfonyl group; m is an integer of 0 to 3 with a proviso that m is not 0 when X is a carbonyl group; R4 is an aliphatic group not including alkenyl group or alkynyl group, an alicyclic group or an aromatic group; and, when X is a carbonyl group and R4 is an alicyclic group or an aromatic group, at least one of the carboxylic groups is at the ortho position.
- 2. A positive resist composition according to claim 1, wherein the photoactive component is a photosensitive diazoquinone compound.
- 3. A positive resist composition according to claim 1 or 2, wherein the X is a sulfonyl group.
- 4. A positive resist composition according to claim 1, wherein the R1 and R3 in the formula (I) are the following group:
- 5. A hydroxypolyamide represented by the following formula (III), for use in a positive resist: wherein R1 and R3 may be the same or different and are each a tetravalent aromatic group; R2 is a bivalent aromatic group; n is an integer of 2 to 150; and Z is a monovalent organic group and at least 40% of Z is a group represented by the following structural formula (IV):—X—R4—(COOH)m (IV) wherein X is a sulfonyl group; m is an integer of 0 to 3; and R4 is an aliphatic group not including alkenyl group or alkynyl group, an alicyclic group or an aromatic group.
- 6. A hydroxypolyamide for use in a positive resist according to claim 5, wherein the R1 and R3 in the formula (I) are the following group:
- 7. A method for forming a heat-resistant pattern, which comprises coating, on a semiconductor device, a varnish comprising a solvent and a positive resist composition containing a hydroxypolyamide represented by the following formula (I) and a photoactive component, then subjecting the coated material to prebaking, light exposure and development for patterning, and heat-curing the resulting coating film pattern: wherein R1 and R3 may be the same or different and are each a tetravalent aromatic group; R2 is a bivalent aromatic group; n is an integer of 2 to 150; and Z is a monovalent organic group and at least 40% of Z is a group represented by the following structural formula:—X—R4—(COOH)m (II) wherein X is a carbonyl group or a sulfonyl group; m is an integer of 0 to 3 with a proviso that m is not 0 when X is a carbonyl group; R4 is an aliphatic group not including alkenyl group or alkynyl group, an alicyclic group or an aromatic group; and, when X is a carbonyl group and R4 is an alicyclic group or an aromatic group, at least one of the carboxylic groups is at the ortho position.
Priority Claims (3)
Number |
Date |
Country |
Kind |
10-105098 |
Apr 1998 |
JP |
|
10-342090 |
Dec 1998 |
JP |
|
10-342091 |
Dec 1998 |
JP |
|
Parent Case Info
This application is the national phase under 35 U.S.C. §371 of PCT International Application No. PCT/JP99/02005 which has an International filing date of Apr. 15, 1999, which designated the United States of America.
PCT Information
Filing Document |
Filing Date |
Country |
Kind |
PCT/JP99/02002 |
|
WO |
00 |
Publishing Document |
Publishing Date |
Country |
Kind |
WO99/54787 |
10/28/1999 |
WO |
A |
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