1. Technical Field
The present disclosure relates to a power measuring system.
2. Description of Related Art
To measure a turning-on power, a turning-off power, and a turned-on power of a field-effect transistor, a specific device may be used, but this is not cost effective. Therefore, there is room for improvement in the art.
Many aspects of the embodiments can be better understood with reference to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
The disclosure, including the accompanying drawings, is illustrated by way of examples and not by way of limitation. It should be noted that references to “an” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean at least one.
Referring to
The pulse driver 10 generates square-wave signals. The pulse driver 10 includes two pins D1 and D2. The pin D1 outputs square-wave signals to a gate of the FET Q1. The pin D2 outputs square-wave signals to a gate of the FET Q2. A drain of the FET Q1 is connected to a power supply VCC through the resistor R1 and the filtering circuit 40, in that order. A source of the FET Q1 and a drain of the FET Q2 are connected to each other and to the capacitor C1. A source of the FET Q2 is grounded through the resistor R2. The capacitor C1 is further grounded.
The processing unit 20 includes six pins P1.0-P1.5. The pin P1.0 is connected to the pin D1 of the pulse driver 10. The pin P1.1 is connected to the pin D2 of the pulse driver 10. The pin P1.2 is connected to a node M between the resistor R1 and the filtering circuit 40. The pin P1.3 is connected to a node N between the resistor R1 and the drain of the FET Q1. The pin P1.4 is connected to a node T between the drain of the FET Q2 and the source of the FET Q1. The pin P1.5 is connected to a node O between the source of the FET Q2 and the resistor R2. The processing unit 20 is further connected to the indication unit 30.
Referring to
The processing unit 20 samples voltages at the nodes M, N, T, and O at the time points E and F. The processing unit 20 further obtains the voltage drop Vr1 across the two terminals of the resistor R1, the voltage drop Vr2 between the two terminals of the resistor R2, the voltage drop Vq1 between the drain and the source of the FET Q1, and the voltage drop Vq2 between the drain and the source of the FET Q2. A current Ir1 is obtained from the voltage drop Vr1 divided by the resistance of the resistor R1. The current Ir1 is equal to a current flowing through the FET Q1 and a current flowing through the FET Q2. As a result, according to the formula P=VI, the first and second powers of the FETs Q1 and Q2 can be obtained. In the formula P=VI, P denotes power, V denotes the voltage, and I denotes the current. In addition, from information described above, the current flowing through the FET Q1 is equal to the current flowing through the FET Q2. As a result, the processing unit 20 just needs to obtain one of the voltage drop Vr1 and Vr2.
After the first and second powers of the FETs Q1 and Q2 are obtained, the processing unit 20 transmits the power values of the first and second powers to the indication unit 30. The indication unit 30 displays the first and second powers.
In other embodiments, the power measuring system can measure the first and second powers of one FET Q1 only. In this case, the source of the FET Q1 is grounded. The processing unit 20 samples voltages at the nodes M, N, and T at the time points E and F. In a similar manner as above, the first and second powers of a single FET Q1 can be obtained.
In this embodiment, the filtering circuit 40 and the capacitor C1 are used for stabilizing the current from the power supply VCC.
The foregoing description of the exemplary embodiments of the disclosure has been presented only for the purposes of illustration and description and is not intended to be exhaustive or to limit the disclosure to the precise forms disclosed. Many modifications and variations are possible in the light of everything above. The embodiments were chosen and described in order to explain the principles of the disclosure and their practical application so as to enable others of ordinary skill in the art to utilize the disclosure and various embodiments with various modifications as are suited to the particular use contemplated. Alternative embodiments will become apparent to those of ordinary skills in the art to which the present disclosure pertains without departing from its spirit and scope. Accordingly, the scope of the present disclosure is defined by the appended claims rather than the foregoing description and the exemplary embodiments described therein.
Number | Date | Country | Kind |
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201110245851.9 | Aug 2011 | CN | national |