for testing field effect transistors

Industry

CPC
G01R31/2621

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2621for testing field effect transistors

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining gate capacitance
- Patent number 12,313,663
- Issue date May 27, 2025
- Microsoft Technology Licensing, LLC
- Jonne Verneri Koski
- G01 - MEASURING TESTING
Information Patent Grant
Gate charge and leakage measurement test sequence for solid state d...
- Patent number 12,306,240
- Issue date May 20, 2025
- Infineon Technologies Austria AG
- Leo Aichriedler
- G01 - MEASURING TESTING
Information Patent Grant
GaN HEMT device for irradiation damage detection and detection and...
- Patent number 12,287,360
- Issue date Apr 29, 2025
- Nanjing University
- Feng Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level semiconductor high-voltage reliability test fixture
- Patent number 12,228,603
- Issue date Feb 18, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,218,658
- Issue date Feb 4, 2025
- Leoni-Bordnetz Systeme GmbH
- Matthias Ebert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,203,988
- Issue date Jan 21, 2025
- Leoni-Bordnetz Systeme GmbH
- Wolfgang Koch
- G01 - MEASURING TESTING
Information Patent Grant
Onboard circuits and methods to predict the health of critical elem...
- Patent number 12,174,237
- Issue date Dec 24, 2024
- University of Houston System
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
GaN reliability built-in self test (BIST) apparatus and method for...
- Patent number 12,163,995
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ann Lai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device and method for monitoring a turn-off capability
- Patent number 12,153,081
- Issue date Nov 26, 2024
- Turck Holding GmbH
- Johannes Vom Stein
- G01 - MEASURING TESTING
Information Patent Grant
TFT panel and test method
- Patent number 12,146,906
- Issue date Nov 19, 2024
- IRAY TECHNOLOGY COMPANY LIMITED
- Chongyu Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deterioration checking apparatus and deterioration checking
- Patent number 12,072,368
- Issue date Aug 27, 2024
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor
- Patent number 12,068,408
- Issue date Aug 20, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Herbert De Vleeschouwer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagnosis circuit of parallel-structure MOSFETs including MUX and d...
- Patent number 12,061,224
- Issue date Aug 13, 2024
- LG ENERGY SOLUTION, LTD.
- Lyang Wook Jo
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 12,038,468
- Issue date Jul 16, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method for tolerance against the hot carrier effect
- Patent number 11,953,542
- Issue date Apr 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yifei Pan
- G11 - INFORMATION STORAGE
Information Patent Grant
System for determining leakage current of a field effect transistor...
- Patent number 11,940,479
- Issue date Mar 26, 2024
- Texas Instruments Incorporated
- Robert Allan Neidorff
- G01 - MEASURING TESTING
Information Patent Grant
Testing switches in a power converter
- Patent number 11,921,149
- Issue date Mar 5, 2024
- pSemi Corporation
- Gregory Szczeszynski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Ultra-low leakage test verification circuit
- Patent number 11,885,837
- Issue date Jan 30, 2024
- Automatic Timing & Controls, Inc.
- Roger Clarke
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for automatically testing a switching member
- Patent number 11,879,929
- Issue date Jan 23, 2024
- Siemens Aktiengesellschaft
- Hubert Schierling
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and testing method
- Patent number 11,879,930
- Issue date Jan 23, 2024
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for checking a semiconductor switch for a fault
- Patent number 11,881,848
- Issue date Jan 23, 2024
- Webasto SE
- Philipp Eck
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analysis method for semiconductor device
- Patent number 11,829,893
- Issue date Nov 28, 2023
- SHANGHAI HUALI INTEGRATED CIRCUIT MFG. CO., LTD.
- Ping-Hsun Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply control apparatus and semiconductor failure detection...
- Patent number 11,821,934
- Issue date Nov 21, 2023
- Yazaki Corporation
- Hiromichi Hanaoka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and semiconductor device
- Patent number 11,789,061
- Issue date Oct 17, 2023
- Fuji Electric Co., Ltd.
- Isao Saito
- G01 - MEASURING TESTING
Information Patent Grant
Real-time, in-situ reliability monitoring in an integrated circuit
- Patent number 11,774,490
- Issue date Oct 3, 2023
- MARVELL ASIA PTE. LTD.
- Runzi Chang
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring high electron mobility transistor
- Patent number 11,747,389
- Issue date Sep 5, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Yulin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring dynamic on-resistance of GaN-bas...
- Patent number 11,747,390
- Issue date Sep 5, 2023
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Rong Yang
- G01 - MEASURING TESTING
Information Patent Grant
Switch system
- Patent number 11,736,104
- Issue date Aug 22, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yusuke Kinoshita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test method and device for contact resistor
- Patent number 11,719,730
- Issue date Aug 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Haiyang Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for analysis of interface state of MIS-HEMT de...
- Patent number 11,703,537
- Issue date Jul 18, 2023
- Peking University Shenzhen Graduate School
- Xinnan Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20250180627
- Publication date Jun 5, 2025
- ROHM CO., LTD.
- Satoru KOMINAMI
- G01 - MEASURING TESTING
Information Patent Application
SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTI...
- Publication number 20250174976
- Publication date May 29, 2025
- Monolithic Power Systems, Inc.
- Di Han
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE
- Publication number 20250164545
- Publication date May 22, 2025
- Mitsubishi Electric Corporation
- JULIO BRANDELERO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
- Publication number 20250155483
- Publication date May 15, 2025
- RENESAS ELECTRONICS CORPORATION
- Takehiro UEDA
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE O...
- Publication number 20250130270
- Publication date Apr 24, 2025
- INFINEON TECHNOLOGIES AG
- Guang Zeng
- G01 - MEASURING TESTING
Information Patent Application
POWER TRANSISTOR AGE DETECTION
- Publication number 20250130269
- Publication date Apr 24, 2025
- Infineon Technologies Canada Inc.
- Lucas Andrew MILNER
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION DEVICE
- Publication number 20250123318
- Publication date Apr 17, 2025
- YAZAKI CORPORATION
- Atsushi Takahashi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING RDSon, RDSoff AND CURRENT COLLAPSE...
- Publication number 20250102557
- Publication date Mar 27, 2025
- Microtesters, LLC
- Andre Claude Olivier
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Calibrating a Wireless Harness Automated Me...
- Publication number 20250093388
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING
Information Patent Application
GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR...
- Publication number 20250060404
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Ann LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET
- Publication number 20250052805
- Publication date Feb 13, 2025
- Continental Automotive Technologies GmbH
- Erwin Kessler
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES
- Publication number 20250044342
- Publication date Feb 6, 2025
- SK HYNIX INC.
- Ki Hyuk SUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING TURN-OFF NEGATIVE VOLTAGE OF S...
- Publication number 20250030357
- Publication date Jan 23, 2025
- ANHUI WELLING AUTO PARTS CORPORATION LIMITED
- Hongkang SHI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE
- Publication number 20250030335
- Publication date Jan 23, 2025
- Infineon Technologies Austria AG
- Diego RAFFO
- G01 - MEASURING TESTING
Information Patent Application
STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE
- Publication number 20250027985
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Emanuele Moretti
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING TOTAL DOSE EFFECT OF SIC MOSFET DEVICE
- Publication number 20250012846
- Publication date Jan 9, 2025
- CHINA ACADEMY OF SPACE TECHNOLOGY
- Qingkui YU
- G01 - MEASURING TESTING
Information Patent Application
RESISTIVE-NETWORK CELL REGION, BUILT-IN SELF-TESTER INCLUDING SAME,...
- Publication number 20250012844
- Publication date Jan 9, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE
- Publication number 20250012845
- Publication date Jan 9, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CIRCUIT AND CORRESPONDING METHOD
- Publication number 20250004020
- Publication date Jan 2, 2025
- STMicroelectronics International N.V.
- Romeo LETOR
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURIN...
- Publication number 20250004035
- Publication date Jan 2, 2025
- Intel Corporation
- Krzysztof DOMANSKI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS
- Publication number 20240426895
- Publication date Dec 26, 2024
- International Business Machines Corporation
- Huimei Zhou
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SENSING CURRENT THROUGH A PASS FET
- Publication number 20240418766
- Publication date Dec 19, 2024
- NEXPERIA B.V.
- Patrick Zeelen
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD
- Publication number 20240385235
- Publication date Nov 21, 2024
- Fuji Electric Co., Ltd.
- Kenichi ISHII
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...
- Publication number 20240353470
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Niranjan R. Hegde
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC
- Publication number 20240329111
- Publication date Oct 3, 2024
- Rohm Co., Ltd.
- Tatsuya YANAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEGRADATIONS DETECTION FOR MOS-TRANSISTORS AND GATE-DRIVERS
- Publication number 20240313764
- Publication date Sep 19, 2024
- INFINEON TECHNOLOGIES AG
- Albino Pidutti
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20240288487
- Publication date Aug 29, 2024
- MEDIATEK SINGAPORE PTE LTD
- Jubao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Methods, Systems, and Devices for Wireless Power Modules
- Publication number 20240288507
- Publication date Aug 29, 2024
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Faisal Habib KHAN
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT DEVICE
- Publication number 20240280628
- Publication date Aug 22, 2024
- Kabushiki Kaisha Toshiba
- Takuma HARA
- G01 - MEASURING TESTING

for testing field effect transistors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for determining gate capacitance

Gate charge and leakage measurement test sequence for solid state d...

GaN HEMT device for irradiation damage detection and detection and...

Wafer-level semiconductor high-voltage reliability test fixture

System and method for identifying non-switching semiconductor switches

System and method for identifying non-switching semiconductor switches

Onboard circuits and methods to predict the health of critical elem...

GaN reliability built-in self test (BIST) apparatus and method for...

Device and method for monitoring a turn-off capability

TFT panel and test method

Deterioration checking apparatus and deterioration checking

High electron mobility transistor

Diagnosis circuit of parallel-structure MOSFETs including MUX and d...

Method for measuring current-voltage characteristic

Test method for tolerance against the hot carrier effect

System for determining leakage current of a field effect transistor...

Testing switches in a power converter

Ultra-low leakage test verification circuit

Method and device for automatically testing a switching member

Test circuit and testing method

Method for checking a semiconductor switch for a fault

Analysis method for semiconductor device

Power supply control apparatus and semiconductor failure detection...

Integrated circuit and semiconductor device

Real-time, in-situ reliability monitoring in an integrated circuit

Device and method for measuring high electron mobility transistor

Apparatus and method for measuring dynamic on-resistance of GaN-bas...

Switch system

Test method and device for contact resistor

Method and apparatus for analysis of interface state of MIS-HEMT de...

Patents Applicationslast 30 patents

SEMICONDUCTOR TEST APPARATUS

SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTI...

MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE

SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD

TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE O...

POWER TRANSISTOR AGE DETECTION

FAILURE DETECTION DEVICE

SYSTEM AND METHOD FOR MEASURING RDSon, RDSoff AND CURRENT COLLAPSE...

Systems and Methods for Calibrating a Wireless Harness Automated Me...

GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR...

METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET

ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES

METHOD AND APPARATUS FOR DETERMINING TURN-OFF NEGATIVE VOLTAGE OF S...

PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE

STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

METHOD FOR TESTING TOTAL DOSE EFFECT OF SIC MOSFET DEVICE

RESISTIVE-NETWORK CELL REGION, BUILT-IN SELF-TESTER INCLUDING SAME,...

WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE

MONITORING CIRCUIT AND CORRESPONDING METHOD

ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURIN...

CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS

SYSTEM FOR SENSING CURRENT THROUGH A PASS FET

TEST METHOD

SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...

METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC

DEGRADATIONS DETECTION FOR MOS-TRANSISTORS AND GATE-DRIVERS

SEMICONDUCTOR STRUCTURE

Methods, Systems, and Devices for Wireless Power Modules

MEASUREMENT METHOD AND MEASUREMENT DEVICE