Number | Name | Date | Kind |
---|---|---|---|
4622656 | Kamiya et al. | Nov 1986 | |
4794565 | Wu et al. | Dec 1988 | |
5029130 | Yeh | Jul 1991 | |
5042009 | Kazerounian et al. | Aug 1991 | |
5043940 | Harari | Aug 1991 | |
5119330 | Tanagawa | Jun 1992 | |
5198380 | Harari | Mar 1993 | |
5218571 | Norris | Jun 1993 | |
5220531 | Blyth et al. | Jun 1993 | |
5258949 | Chang et al. | Nov 1993 | |
5293560 | Harari | Mar 1994 | |
5297096 | Terada et al. | Mar 1994 | |
5313421 | Guterman et al. | May 1994 | |
5357476 | Kuo et al. | Oct 1994 | |
5371031 | Gill et al. | Dec 1994 | |
5422842 | Cernea et al. | Jun 1995 | |
5440505 | Fazio et al. | Aug 1995 | |
5475634 | Wang et al. | Dec 1995 | |
5477499 | Van Buskirk et al. | Dec 1995 | |
5487033 | Keeney et al. | Jan 1996 | |
5539690 | Talreja et al. | Jul 1996 | |
5566111 | Choi | Oct 1996 | |
5566125 | Fazio et al. | Oct 1996 | |
5590076 | Haddad et al. | Dec 1996 | |
5592415 | Kato et al. | Jan 1997 | |
5629890 | Engh | May 1997 | |
5633822 | Campardo et al. | May 1997 | |
5687114 | Khan | Nov 1997 | |
5694356 | Wong et al. | Dec 1997 | |
5712815 | Bill et al. | Jan 1998 |
Entry |
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Eitan et al., "Hot-Electron Injection into the Oxide in n-Channel MOS Devices," IEEE Transactions on Electron Devices (1981) ED-28:328-340. |
Kamiya et al., "EPROM Cell with High Gate Injection Efficiency," IEDM 82 (1982) pp. 741-744. |
Tam et al., "Lucky-Electron Model of Channel Hot-Electron Injection in MOSFET's," IEEE Transactions on Electron Devices (1984) ED-31:1116-1125. |
Van Houdt et al., "An Analytical Model for the Optimization of Source-Side Injection Flash EEPROM Devices," IEEE Transactions on Electron Devices (1995) 42:1314-1320. |