a) is a scanning electron microscope (SEM) image of a conventional diamond coated wire.
b) is a scanning electron microscope (SEM) image of a conventional diamond coated wire after use.
a) is a scanning electron microscope (SEM) image of conventional diamond particles used in conventional diamond coated wires.
b) illustrates conventional diamond particles in a conventional diamond coated wire.
a) is a scanning electron microscope (SEM) image of surface modified diamond particles.
b) illustrates surface modified diamond particles in a coated wire application.
a) is a scanning electron microscope (SEM) image of a conventional diamond particle.
b) is a scanning electron microscope (SEM) image of a surface modified diamond particle.
a) is a scanning electron microscope (SEM) image of a wire containing conventional diamond particles made according to Example 1.
b) is a scanning electron microscope (SEM) image of a wire containing surface modified diamond particles made according to Example 1.
c) is a scanning electron microscope (SEM) image of a wire containing conventional diamond particles made according to Example 1 after use.
d) is a scanning electron microscope (SEM) image of a wire containing surface modified diamond particles made according to Example 1 after use.
In describing and claiming the present invention, the following terminology will be used in accordance with the definitions set forth below.
The term “abrasive”, as used herein, refers to any material used to wear away softer material.
The term “wire”, as used herein, refers to a cylindrical, elongated string of material. The material may be metal, composite materials, or a combination of metals and/or composite materials. Composite materials may include KEVLAR materials, carbon materials and combinations thereof. Wire may be a single strand or include multiple strands.
The term “exposure”, as used herein, refers to:
Relative Exposure=100(tc0−tb0)/tc0
Space between cutting point and bond surface=tc0−tb0
Where tc0 is the initial height of the abrasive particle from the wire surface to the outermost tip of the particle that would be in contact with the workpiece and tb0 is the initial average thickness of the bonding layer.
The term “chemical bond”, as used herein, refers to a surface to which metallic or organic molecular groups have been chemically adsorbed.
The term “bond” or “bond matrix”, as used herein, refers to the material that is used for attaching the abrasive particles to the wire. The attachment can be mechanical, chemical or a combination of both.
The term “coating”, as used herein, refers to a material that envelops the abrasive particles either partially or entirely. The coating may be metallic, polymeric, vitreous or combinations of these by layer or by mixture.
The term “conventional diamond” as used herein, refers to any diamond not subject to the process taught in U.S. Provisional Application Ser. No. 61/097,422 and/or U.S. Provisional Application Ser. No. 61/187,789.
The term “surface roughness”, as used herein, refers to the measurement of a two-dimensional image that quantifies the extent or degree of pits and spikes of an object's edges or boundaries as stated in the CLEMEX image analyzer, Clemex Vision User's Guide PE 3.5 ©2001. Surface roughness is determined by the ratio of the convex perimeter divided by the perimeter.
Note that as the degree of pits and spikes increases, the surface roughness factor decreases.
The term “sphericity”, as used herein, refers to the estimate of the enclosed area of a two dimensional image or object (4πA) divided by the square of perimeter (p2).
The term “surface area” as used herein, refers to the external surface of a particle. When used with a plurality of particles, i.e., powder, the term specific surface area is used and is reported as surface area per gram of powder.
It is important to note that although the terms defined above refer to measuring two-dimensional particle profiles using microscopic measuring techniques, it is understood that the features extend to the three-dimensional form. Automated image analysis of particle size and shape is recognized by one skilled in the art as a reliable, reproducible method of measuring particle characteristics. Although the CLEMEX image analyzer was used, similar devices are available that will reproduce the data.
There exists a need for a diamond particle that is resistant to pulling out of the bond matrix on a diamond coated wire. Further, there exists a need for diamond particles that will remain in the bond matrix for an extended time period compared to conventional diamond particles. Additionally, there exists a need to cut materials such as silicon ignot, more efficiently, at increased speeds. Comparative
When looking at conventional diamond coated wires, it is quite apparent that the conventional diamond particles are mechanically retained. In the case of an electroplated bond matrix as shown in comparative
Referring to comparative
In
The surface modified diamond particles 12 may be used in a fixed abrasive wire having abrasives fixed thereon for use in cutting, slicing, internal grinding, dicing and ingot-cutting of such rigid materials as silicon, quartz, ceramics and the like.
The larger exposure provided by the surface modified diamond particles will provide for a better free cutting ability than wire containing conventional diamond particles and results in reduced heat generation at the cutting points. It is also expected that the increased area between the abrasive cutting points and the bond surface will provide a larger channel for cuttings and swarf removal and will be less erosive than wire containing conventional diamond particles.
The overall effect of using surface modified diamond particles that have a higher material removal rate than conventional diamond particles is that a lower concentration of diamond particles could be used on the wire. This, coupled with the ability of using less bond material to affix the diamond particles, will significantly reduce the cost of producing the wire.
It is also expected that by using surface modified diamond particles, less particles will be required to achieve the same amount of cutting/material removal as opposed to using conventional diamond particles.
b) illustrates wire 24 having a surface 26 and surface modified diamond particles 28 bonded to surface 26 by bond matrix 30. Each surface modified diamond particle has a surface roughness of about 0.60 to about 0.80 and a sphericity of about 0.25 to about 0.50. As shown in
As the wire is used in a cutting application and swarf is generated, the bond layer will typically erode away at a rate faster than the diamond particles wear away. In the case of
Suitable wire materials include metals, alloys of metal, polymers (synthetic or natural), carbon, textiles, organic or inorganic fibers, silk and combinations thereof. In one embodiment, steel wire such as piano wire, may be used. Other alternatives include metal wires such as tungsten wire or molybdenum wire. In one embodiment, the wire includes a coating or bond matrix that is metal-plated, i.e., a nickel-plated bond matrix. Other alternative materials that may be used as a bond matrix include metallic materials, polymeric resins, hybrid systems (vitreous and polymer), electrolytic nickel coatings, electroless nickel coatings, braze-bond systems and resin-bond systems that may further include thermo-set resins and/or UV curable resins. Additionally, combinations of the above bond matrix materials may be used.
In addition to the bond matrix, in one embodiment, the wire may include additional coatings such as metals or resins. Such metals and resins and their combinations may be selected from those mentioned above.
The wire may have a length of between about 1 cm to about 1000 km or alternatively, about 200 km to about 600 km. In one embodiment the wire is in a continuous loop. The thickness of the wire may be between about 10 um to about 500 um or alternatively, about 50 um to about 200 um.
The superabrasives used in one embodiment of the present invention are the surface modified diamond particles taught in U.S. Provisional Application No. 61/097,422 and U.S. Provisional Application No. 61/187,789 both of which are hereby incorporated by reference in their entirety.
The abrasives used in/on the wire may be coated abrasives. Such coatings include, but are not limited to, metal coatings, metal alloy coatings and combinations thereof. Examples of such coatings include chromium, titanium, copper, molybdenum, nickel and tungsten,
Some embodiments of the invention include, but are not limited to, the following:
A wire including surface modified diamond particles incorporated, at least partially, into a wire.
A wire including surface modified diamond particles and conventional diamond particles incorporated, at least partially, into a wire.
A wire including a surface having surface modified diamond particles incorporated into a surface on the wire. The surface modified diamond particles are bonded to the surface of the wire surface by a bond matrix.
A wire including a surface having surface modified diamond particles and conventional diamond particles incorporated, at least partially, into a surface on the wire. The surface modified diamond particles are bonded, at least partially, to the surface of the wire by a bond matrix.
Any method may be used to affix the abrasive particles to the wire or push the diamond at least partially into a wire. The fixed abrasive wire may be made by methods such as electroplating, physically pushing the diamond into the wire, laser conditioning, brazing, affixing the particles using a resin, and impregnating the diamond into the wire.
In an embodiment, electrochemical deposition may be used to deposit the abrasive directly onto the wire substrate. Electrochemical deposition generally calls for placing an electrically charged wire in a bed of abrasive particles in an oppositely charged liquid solution of a metal compound. As metal precipitates on the wire, it captures abrasive particles within a thin metal layer and thereby binds the abrasive to the wire. For example, U.S. Pat. No. 5,438,973 to Schmid et al., discloses diamond abrasive particles fixed in nickel plating to a cutting surface of a tear-drop cross section stainless steel wire core.
In an embodiment, the abrasive particles may also be affixed to a wire by a brazed metal bond, wherein the grains are disposed upon the surface of the wire with a preselected surface distribution as taught in U.S. Pat. No. 6,102,024.
In an embodiment, the abrasive particles may be affixed to a wire by a resin bond. An example of a suitable resin bond is taught in U.S. Pat. No. 6,463,921.
In addition to the improved bond strength and abrasive exposure, the use of surface modified diamond particles also provides for substantially more cutting points per particle than conventional diamond particles. As shown in
As shown in
Since the extreme roughness of the surface modified diamond particles provide substantially more anchoring sites than conventional monocrystalline diamond particles, it is apparent that a lower level of bond matrix would be required to provide a superior bond of the surface modified diamond particles to the wire.
The fixed abrasive wire may be used to cut any materials. Common substrate materials include silicon, sapphire, silicon carbide, aluminum nitride, tellurium, silica, gallium arsenide, indium phosphide, cadmium sulfide, germanium, zinc sulfide, gray tin, selenium, boron, silver iodide, and indium antimonide, among other materials.
One embodiment includes a method for cutting a substrate, comprising the steps of: providing a wire saw that includes a cutting wire including surface modified diamond particles; applying a coolant or lubricant to the cutting wire; contacting a surface of the substrate with the cutting wire; and manipulating the relative positioning of the cutting wire and the surface consistent with a cutting action.
In one embodiment, a wire including the surface modified diamond particles and a coolant or lubricant fluid may be used. The coolant or lubricant fluid can be aqueous or nonaqueous. Suitable fluids include water and alkylene glycols. Alkylene glycols used in the context of the present invention include ethylene glycol (EG), polyethylene glycol (PEG), and polypropylene glycol (PPG).
In an embodiment, the bond matrix may additionally include additives selected from the group of abrasives, i.e., materials having a Mohs hardness of greater than seven or an absolute hardness of greater than about 100 and superabrasives having a hardness on the Knoop scale in excess of about 3,000 kg/mm2. A comparison of Knoop and Mohs hardness values for conversion purposes is available in standard handbooks.
Other additives to the bond matrix may include polymeric fibers, inorganic fibers, lubricants, curing agents, fillers, porosity agents, metals and combinations thereof may be used.
In an embodiment the wire may contain functionalized diamond particles such as those taught in U.S. Pat. No. 6,372,002 which is hereby incorporated by reference in its entirety. The functionalized diamond particles may be present on a wire with surface modified diamond particles. Optionally, the surface modified diamond particles may be subjected to the functionalizing process as taught by U.S. Pat. No. 6,372,002.
Steel wires were coated with nominal 20-30 micron mean size diamond particles using the following procedure.
Bath Preparation:
Wire Cleaning:
Coating Process:
Several lengths of wire were then coated using 20-30 um surface modified diamond following the same procedure as above.
Scanning electron microscope images were taken of sections of each wire.
b) also shows good coverage of the surface modified diamond particles over the wire surface and good protrusion of the surface modified diamond particles from the wire surface. The surface modified diamond particles are distinctly different from the conventional diamond particles of
A simple sawing test was performed using a) a wire containing the conventional 20-30 um diamond particles; and b) a wire containing surface modified 20-30 um diamond particles. Each wire was secured into a hand saw and used to cut a polysilicon block.
The test included the following steps:
As can be seen from scanning electron photographs of the tested of the wires in
Although the invention has been described in connection with certain exemplary embodiments, it will be evident to those of ordinary skill in the art that many alternatives, modifications, and variations may be made to the disclosed invention in a manner consistent with the detailed description provided above. Also, it will be apparent to those of ordinary skill in the art that certain aspects of the various disclosed example embodiments could be used in combination with aspects of any of the other disclosed embodiments or their alternatives to produce additional, but not herein explicitly described, embodiments incorporating the claimed invention but more closely adapted for an intended use or performance requirements. Accordingly, it is intended that all such alternatives, modifications and variations that fall within the spirit of the invention are encompassed within the scope of the appended claims.
The instant application claims the benefit of U.S. Provisional Application Ser. No. 61/097,422 filed on Sep. 16, 2008 and U.S. Provisional Application Ser. No. 61/187,789 filed on Jun. 17, 2009 which are herein incorporated by reference in their entirety.
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/US2010/044148 | 8/2/2010 | WO | 00 | 12/3/2013 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2011/014884 | 2/3/2011 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
3762882 | Grutza | Oct 1973 | A |
3919717 | Cullen et al. | Nov 1975 | A |
3936577 | Christini et al. | Feb 1976 | A |
3955324 | Lindstrom | May 1976 | A |
4036937 | Roy et al. | Jul 1977 | A |
4122636 | Roy et al. | Oct 1978 | A |
4328266 | Feldstein | May 1982 | A |
4358923 | Feldstein | Nov 1982 | A |
4547407 | Spencer, Jr. | Oct 1985 | A |
4681817 | Shinada | Jul 1987 | A |
4805586 | Borse | Feb 1989 | A |
4919974 | McCune et al. | Apr 1990 | A |
4951953 | Kim | Aug 1990 | A |
4997686 | Feldstein et al. | Mar 1991 | A |
5035771 | Borse | Jul 1991 | A |
5096465 | Chen et al. | Mar 1992 | A |
5145517 | Feldstein et al. | Sep 1992 | A |
5472787 | Johnson et al. | Dec 1995 | A |
5482637 | Rao et al. | Jan 1996 | A |
5547716 | Thaler | Aug 1996 | A |
5597625 | Ong et al. | Jan 1997 | A |
5695387 | Moravec et al. | Dec 1997 | A |
5891523 | Feldstein | Apr 1999 | A |
6070570 | Ueoka et al. | Jun 2000 | A |
6102024 | Buljan et al. | Aug 2000 | A |
6138779 | Boyce | Oct 2000 | A |
6194068 | Ohashi et al. | Feb 2001 | B1 |
6254461 | Benning et al. | Jul 2001 | B1 |
6280489 | Horie et al. | Aug 2001 | B1 |
6306466 | Feldstein et al. | Oct 2001 | B1 |
6357433 | Whalin | Mar 2002 | B1 |
6372002 | D'Evelyn et al. | Apr 2002 | B1 |
6404207 | Bhushan | Jun 2002 | B1 |
6500488 | Chang et al. | Dec 2002 | B1 |
6503642 | Linde | Jan 2003 | B1 |
6515254 | Beck et al. | Feb 2003 | B2 |
6565618 | Ishizuka | May 2003 | B1 |
6915796 | Sung | Jul 2005 | B2 |
7134868 | Babin et al. | Nov 2006 | B2 |
7377477 | Lucek et al. | May 2008 | B2 |
7556558 | Palmgren | Jul 2009 | B2 |
7562858 | Dumm et al. | Jul 2009 | B2 |
8118898 | Wakamiya | Feb 2012 | B2 |
20010033804 | An | Oct 2001 | A1 |
20040112867 | Horie et al. | Jun 2004 | A1 |
20040162014 | John | Aug 2004 | A1 |
20060040126 | Richardson et al. | Feb 2006 | A1 |
20060246275 | Dumm et al. | Nov 2006 | A1 |
20090064983 | Sudarshan | Mar 2009 | A1 |
20090120422 | Taniguchi | May 2009 | A1 |
20100064593 | Dumm et al. | Mar 2010 | A1 |
20100068524 | Dumm et al. | Mar 2010 | A1 |
20120100366 | Dumm et al. | Apr 2012 | A1 |
Number | Date | Country |
---|---|---|
0212879 | Nov 1989 | EP |
2038214 | Jul 1980 | GB |
A-59059352 | Sep 1982 | JP |
S-62213965 | Sep 1987 | JP |
A-2118080 | Oct 1988 | JP |
2003175406 | Jun 2003 | JP |
2009-090441 | Apr 2009 | JP |
200831407 | Apr 2008 | TW |
9502078 | Jan 1995 | WO |
9706339 | Feb 1997 | WO |
9928084 | Oct 1999 | WO |
0060137 | Dec 2000 | WO |
02062530 | Aug 2002 | WO |
2005011914 | Feb 2005 | WO |
20020522 | Apr 2003 | ZA |
Entry |
---|
Sonin et al., The action of iron particles at catalyzed hydrogenation of {100} and {110} faces of synthetic diamond, Diamond and Related Materials, vol. 12 (2003) 1559-1562, Elsevier. |
Sonin, Interaction of Fine Fe Particles with Structural Defects on {111} Faces of Synthetic Diamond Crystals in a Hydrogen Atmosphere, Inorganic Materials, vol. 40, No. 1, 2004, pp. 20-22. |
Chepurov. The channeling action of iron particles in the catalyzed hydrogenation of synthetic diamond. Diamond and Related Materials, vol. 9, (2000), pp. 1435-1438. |
Evans, T. et al. Etching of Diamond Surfaces with Gases. Philosophical Magazine, vol. 6. 1961, pp. 429-440. |
Mennig, G. Wear in Plastics Processing, Chapter 2. Metals and Wear Resistant Hardfacings; p. 171, Hanser Publilshers, New York, NY, 1990. |
Apachitei, I, et al. Electroless Ni-P Composite Coatings: The Effect of Heat Treatment on the Microhardness of Substrate and Coating, Scripts Materials, vol. 38, No. 9, pp. 1347-1353, Elsevier Sciences,Ltd. 1958. |
Feldstein, et al. Composite Electroless Nickel Coating for the Gear Industry, Gear Technology, The Journal of Gear Manufacturing, 1997. |
Feldstein, Composite Electroless Plating, Chapter 11, Electroless Plating: Fundamentals and Applications, American Electroplaters and Surface Finishers Society, 1990. |
Palumbo et al. Electrodeposited Nanocrystalline Coatings for Hard-Facing Applications, AESF SUR/FIN (R) Proceedings, p. 686, 2002 Proceedings. |
Hamid et al. Development of electroless nickel-phosphorus composite deposits for wear resistance of 6061 aluminum alloy, Material Letters, 57, 2002, p. 720. |
Wang et al. Scuffing and wear behavior of aluminum piston skirt coatings against aluminum cylinder bore, Wear, 225, 1999. |
Bozzini et al. Relationships among crystallographic structure, mechanical properties and tribological behavior of electroless Ni-P (9%) B4C films, Wear, 1999 p. 225-229. |
Bunshah, Handbook of Hard Coatings, Noyes 2001, p. 452. |
IBM Technical Disclosure Bulletin, Low Porosity Plating Method for Sintered Powered Metals, vol. 38, No. 8, Aug. 1995, pp. 445-447. |
Number | Date | Country | |
---|---|---|---|
20140165804 A1 | Jun 2014 | US |
Number | Date | Country | |
---|---|---|---|
61230125 | Jul 2009 | US |