Claims
- 1. An apparatus for measuring the output of light-emitting devices arranged in an array, said apparatus comprising:a light integrating sphere having a sample opening; drive means for sequentially aligning at least two of the digital devices and said sample opening, whereby at least two digital devices can be measured after each actuation of said drive means; power means for sequentially powering the at least two digital devices; and measurement means for measuring at least one characteristic of the light from each of the at least two digital devices entering said sphere through said opening.
- 2. An apparatus as defined in claim 1 wherein said drive means comprises a prober.
- 3. An apparatus as defined in claim 1 wherein said digital devices comprise diode lasers.
- 4. An apparatus as defined in claim 3 wherein said diode lasers comprise vertical cavity surface emitting lasers (VCSELs).
- 5. An apparatus as defined in claim 1 wherein said digital devices comprise light-emitting diodes (LEDs).
- 6. A method of measuring the output of light-emitting devices arranged in an array, said method comprising the steps of:sequentially aligning a light integrating sphere and at least two of the devices in the array, whereby at least two devices can be tested after each alignment; sequentially activating each of the at least two devices aligned with the sphere; and measuring the light radiated from each of the sequentially activated devices into the sphere.
- 7. A method as defined in claim 6 wherein the devices are integrally joined in a single substrate.
- 8. A method as defined in claim 6 wherein said aligning step is performed using a prober.
- 9. A method as defined in claim 6 wherein the devices comprise diode lasers.
- 10. A method as defined in claim 9 wherein the diode lasers comprise vertical cavity surface emitting lasers (VCSELs).
- 11. A method as defined in claim 6 wherein the devices comprise light-emitting diodes (LEDs).
BACKGROUND OF THE INVENTION
This nonprovisional application claims priority from provisional application No. 60/304,989 filed Jul. 12, 2001 and entitled “VCSEL/LED Wafer Probe System”.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
5498973 |
Cavaliere et al. |
Mar 1996 |
A |
6248604 |
Eng et al. |
Jun 2001 |
B1 |
6501260 |
Hu et al. |
Dec 2002 |
B1 |
Provisional Applications (1)
|
Number |
Date |
Country |
|
60/304989 |
Jul 2001 |
US |