Preset integrating sphere or cavity

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G01J2001/0481

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2001/0481Preset integrating sphere or cavity

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Self-clocked low noise photoreceiver (SCLNP)
- Patent number 11,054,306
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Jason S. Orcutt
- G02 - OPTICS
Information Patent Grant
Non-tracking solar energy collector
- Patent number 10,917,043
- Issue date Feb 9, 2021
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Avi Niv
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for measuring light
- Patent number 10,816,394
- Issue date Oct 27, 2020
- BlueLight Analytics, Inc.
- Daniel Labrie
- G02 - OPTICS
Information Patent Grant
Optoelectronic devices based on thin single-crystalline semiconduct...
- Patent number 10,777,700
- Issue date Sep 15, 2020
- Wisconsin Alumni Research Foundation
- Zhenqiang Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and device for evaluating the intensity profile of a...
- Patent number 10,690,543
- Issue date Jun 23, 2020
- DHPC TECHNOLOGIES, INC.
- Yei Wo
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device
- Patent number 10,533,939
- Issue date Jan 14, 2020
- Radiant Innovation Inc.
- Tseng-Lung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Random wavelength meter
- Patent number 10,429,245
- Issue date Oct 1, 2019
- University Court of the University of St. Andrews
- Kishan Dholakia
- G01 - MEASURING TESTING
Information Patent Grant
Void-arranged structure and measurement method using the same
- Patent number 10,408,750
- Issue date Sep 10, 2019
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Reference light source device used for calibration of spectral lumi...
- Patent number 10,330,530
- Issue date Jun 25, 2019
- Otsuka Electronics Co., Ltd.
- Hisashi Shiraiwa
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for measuring light
- Patent number 10,113,906
- Issue date Oct 30, 2018
- BlueLight Analytics, Inc.
- Daniel Labrie
- G01 - MEASURING TESTING
Information Patent Grant
Random wavelength meter
- Patent number 10,006,811
- Issue date Jun 26, 2018
- University Court of the University of St. Andrews
- Kishan Dholakia
- G01 - MEASURING TESTING
Information Patent Grant
Lighting domes with reflective gradient and broad spectrum light so...
- Patent number 9,933,372
- Issue date Apr 3, 2018
- Graftek Imaging, Inc.
- Romik Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Fiber coupled integrating sphere based-laser energy meter and calib...
- Patent number 9,874,482
- Issue date Jan 23, 2018
- TUBITAK (TURKIYE BILIMSEL VE TEKNOLOJIK ARASTIRMA KURUMU)
- Oguz Celikel
- G01 - MEASURING TESTING
Information Patent Grant
Light measuring system
- Patent number 9,702,757
- Issue date Jul 11, 2017
- Samsung Electronics Co., Ltd.
- Joon Sub Lee
- G01 - MEASURING TESTING
Information Patent Grant
LED testing process and correction methods therefor
- Patent number 9,671,280
- Issue date Jun 6, 2017
- ASM Technology Singapore Pte. Ltd.
- Ka Yee Mak
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
LED light scattering and analysing
- Patent number 9,534,950
- Issue date Jan 3, 2017
- Feasa Enterprises Limited
- Eamonn O'Toole
- G02 - OPTICS
Information Patent Grant
Light measurement apparatus
- Patent number 9,442,010
- Issue date Sep 13, 2016
- Pioneer Corporation
- Naoharu Yanagawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring the optoelectronic characteristics of light...
- Patent number 9,404,962
- Issue date Aug 2, 2016
- Epistar Corporation
- Ming-Hong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Light collection optics for measuring flux and spectrum from light-...
- Patent number 9,347,824
- Issue date May 24, 2016
- KLA-Tencor Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and mirror...
- Patent number 9,239,259
- Issue date Jan 19, 2016
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- F21 - LIGHTING
Information Patent Grant
Lighting domes with pin hole lens
- Patent number 9,157,867
- Issue date Oct 13, 2015
- GRAFTEK IMAGING INC.
- Romik Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring system and optical measuring device thereof
- Patent number 9,127,979
- Issue date Sep 8, 2015
- Industrial Technology Research Institute
- Chen-Chin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Optical source assembly suitable for use as a solar simulator and a...
- Patent number 9,063,006
- Issue date Jun 23, 2015
- The Boeing Company
- Douglas R. Jungwirth
- F21 - LIGHTING
Information Patent Grant
Systems and methods for measuring high-intensity light beams
- Patent number 8,988,674
- Issue date Mar 24, 2015
- Ultratech, Inc.
- Serguei Anikitchev
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 8,970,835
- Issue date Mar 3, 2015
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneous optical testing of a plurality...
- Patent number 8,823,406
- Issue date Sep 2, 2014
- Cascade Micotech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing light-emitting device
- Patent number 8,749,773
- Issue date Jun 10, 2014
- Epistar Corporation
- Tang-Chung Chao
- G01 - MEASURING TESTING
Information Patent Grant
Integrating sphere photometer and measuring method of the same
- Patent number 8,625,088
- Issue date Jan 7, 2014
- Korean Research Institute of Standards and Science
- Seongchong Park
- G01 - MEASURING TESTING
Information Patent Grant
Corrected optical spectral responses for photoelectric devices
- Patent number 8,436,630
- Issue date May 7, 2013
- Gooch and Housego PLC
- Alexandre Y. Fong
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus including hemispherical optical integ...
- Patent number 8,422,018
- Issue date Apr 16, 2013
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...
- Publication number 20240385073
- Publication date Nov 21, 2024
- LYNRED
- Lilian Martineau
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INSPECTING OPTICAL POWER MEASUREMENT OF LIGHT...
- Publication number 20240035883
- Publication date Feb 1, 2024
- GRAMM INC.
- Jisoo LEE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INTEGRATING SPHERE PHOTOMETER SPECTRAL RESPONSE MEASUREMENT METHOD...
- Publication number 20230408330
- Publication date Dec 21, 2023
- HANGZHOU EVERFINE PHOTO-E-INFO CO., LTD.
- Jiangen PAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL MEASUREMENT ON A TRANSPARENT SHEET
- Publication number 20180364160
- Publication date Dec 20, 2018
- DSM IP Assets B. V.
- Gerardus ABEN
- G01 - MEASURING TESTING
Information Patent Application
RANDOM WAVELENGTH METER
- Publication number 20180266890
- Publication date Sep 20, 2018
- University Court of The University of St Andrews
- Kishan DHOLAKIA
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE LIGHT SOURCE DEVICE USED FOR CALIBRATION OF SPECTRAL LUMI...
- Publication number 20180058927
- Publication date Mar 1, 2018
- Otsuka Electronics Co., Ltd.
- Hisashi SHIRAIWA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING SPHERE COVER AND INTEGRATING SPHERE MODULE
- Publication number 20170191867
- Publication date Jul 6, 2017
- MPI Corporation
- Duen-Tsai Liau
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR MEASURING LIGHT
- Publication number 20170067777
- Publication date Mar 9, 2017
- BlueLight Analytics, Inc.
- Daniel LABRIE
- G01 - MEASURING TESTING
Information Patent Application
FIBER COUPLED INTEGRATING SPHERE BASED-LASER ENERGY METER AND CALIB...
- Publication number 20160334285
- Publication date Nov 17, 2016
- TUBITAK (TURKIYE BILIMSEL VE TEKNOLOJIK ARASTIRMA KURUMU)
- Oguz CELIKEL
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASURING SYSTEM
- Publication number 20160178431
- Publication date Jun 23, 2016
- Samsung Electronics Co., Ltd.
- Joon Sub LEE
- G01 - MEASURING TESTING
Information Patent Application
Light Collection Optics for Measuring Flux and Spectrum from Light-...
- Publication number 20150124253
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING HIGH-INTENSITY LIGHT BEAMS
- Publication number 20150029497
- Publication date Jan 29, 2015
- Ultratech, Inc.
- Sergeui Anikitchev
- G01 - MEASURING TESTING
Information Patent Application
Lighting Domes
- Publication number 20140263981
- Publication date Sep 18, 2014
- Romik Chatterjee
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP
- Publication number 20140159733
- Publication date Jun 12, 2014
- GENESIS PHOTONICS INC.
- TAI-CHENG TSAI
- G01 - MEASURING TESTING
Information Patent Application
LED LIGHT SCATTERING AND ANALYSING
- Publication number 20140132958
- Publication date May 15, 2014
- FEASA ENTERPRISES LIMITED
- Eamonn O'Toole
- G02 - OPTICS
Information Patent Application
APPARATUS FOR MEASURING THE OPTOELECTRONIC CHARACTERISTICS OF LIGHT...
- Publication number 20140084188
- Publication date Mar 27, 2014
- EPISTAR CORPORATION
- Ming-Hong HUANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR MEASURING LIGHT
- Publication number 20140078507
- Publication date Mar 20, 2014
- BlueLight Analytics, Inc.
- Daniel LABRIE
- G02 - OPTICS
Information Patent Application
Optical Measuring System and Optical Measuring Device Thereof
- Publication number 20140078496
- Publication date Mar 20, 2014
- Industrial Technology Research Institute
- Chen-Chin CHENG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140021338
- Publication date Jan 23, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G02 - OPTICS
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140021340
- Publication date Jan 23, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND MIRROR...
- Publication number 20130327929
- Publication date Dec 12, 2013
- Labsphere, Inc.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING LIGHT-EMITTING DEVICE
- Publication number 20130201321
- Publication date Aug 8, 2013
- Epistar Corporation
- Tang-Chung Chao
- G01 - MEASURING TESTING
Information Patent Application
LUMINANCE TEST SYSTEM AND METHOD FOR LIGHT EMITTING DIODES
- Publication number 20130162692
- Publication date Jun 27, 2013
- HON HAI Precision Industry CO., LTD.
- KANG-BIN WANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING SPHERE PHOTOMETER AND MEASURING METHOD OF THE SAME
- Publication number 20120229801
- Publication date Sep 13, 2012
- Korea Research Institute of Standards and Science
- Seongchong Park
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...
- Publication number 20120098559
- Publication date Apr 26, 2012
- Cascade Microtech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...
- Publication number 20110226961
- Publication date Sep 22, 2011
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEG...
- Publication number 20110205541
- Publication date Aug 25, 2011
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTED OPTICAL SPECTRAL RESPONSES FOR PHOTOELECTRIC DEVICES
- Publication number 20110084717
- Publication date Apr 14, 2011
- GOOCH AND HOUSEGO PLC
- Alexandre Y. Fong
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM DOT BASED RADIATION SOURCE AND RADIOMETRIC CALIBRATOR USING...
- Publication number 20110024612
- Publication date Feb 3, 2011
- Raytheon Company
- Nathan M. MINTZ
- G01 - MEASURING TESTING
Information Patent Application
LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURIN...
- Publication number 20110007320
- Publication date Jan 13, 2011
- VON ARDENNE Anlagentechnik GmbH
- Jochen Krauss
- G01 - MEASURING TESTING

Preset integrating sphere or cavity

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-clocked low noise photoreceiver (SCLNP)

Non-tracking solar energy collector

Devices and methods for measuring light

Optoelectronic devices based on thin single-crystalline semiconduct...

System, method and device for evaluating the intensity profile of a...

Gas detection device

Random wavelength meter

Void-arranged structure and measurement method using the same

Reference light source device used for calibration of spectral lumi...

Devices and methods for measuring light

Random wavelength meter

Lighting domes with reflective gradient and broad spectrum light so...

Fiber coupled integrating sphere based-laser energy meter and calib...

Light measuring system

LED testing process and correction methods therefor

LED light scattering and analysing

Light measurement apparatus

Apparatus for measuring the optoelectronic characteristics of light...

Light collection optics for measuring flux and spectrum from light-...

Optical measurement system, optical measurement method, and mirror...

Lighting domes with pin hole lens

Optical measuring system and optical measuring device thereof

Optical source assembly suitable for use as a solar simulator and a...

Systems and methods for measuring high-intensity light beams

Optical characteristic measuring apparatus

Systems and methods for simultaneous optical testing of a plurality...

Method and apparatus for testing light-emitting device

Integrating sphere photometer and measuring method of the same

Corrected optical spectral responses for photoelectric devices

Optical measurement apparatus including hemispherical optical integ...

Patents Applicationslast 30 patents

DEVICE FOR MEASURING THE PERFORMANCE OF AN OPTICAL DETECTOR, AND AS...

DEVICE AND METHOD FOR INSPECTING OPTICAL POWER MEASUREMENT OF LIGHT...

INTEGRATING SPHERE PHOTOMETER SPECTRAL RESPONSE MEASUREMENT METHOD...

SYSTEM AND METHOD FOR OPTICAL MEASUREMENT ON A TRANSPARENT SHEET

RANDOM WAVELENGTH METER

REFERENCE LIGHT SOURCE DEVICE USED FOR CALIBRATION OF SPECTRAL LUMI...

INTEGRATING SPHERE COVER AND INTEGRATING SPHERE MODULE

DEVICES AND METHODS FOR MEASURING LIGHT

FIBER COUPLED INTEGRATING SPHERE BASED-LASER ENERGY METER AND CALIB...

LIGHT MEASURING SYSTEM

Light Collection Optics for Measuring Flux and Spectrum from Light-...

SYSTEMS AND METHODS FOR MEASURING HIGH-INTENSITY LIGHT BEAMS

Lighting Domes

DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP

LED LIGHT SCATTERING AND ANALYSING

APPARATUS FOR MEASURING THE OPTOELECTRONIC CHARACTERISTICS OF LIGHT...

DEVICES AND METHODS FOR MEASURING LIGHT

Optical Measuring System and Optical Measuring Device Thereof

OPTICAL CHARACTERISTIC MEASURING APPARATUS

OPTICAL CHARACTERISTIC MEASURING APPARATUS

OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND MIRROR...

METHOD AND APPARATUS FOR TESTING LIGHT-EMITTING DEVICE

LUMINANCE TEST SYSTEM AND METHOD FOR LIGHT EMITTING DIODES

INTEGRATING SPHERE PHOTOMETER AND MEASURING METHOD OF THE SAME

SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...

QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...

OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEG...

CORRECTED OPTICAL SPECTRAL RESPONSES FOR PHOTOELECTRIC DEVICES

QUANTUM DOT BASED RADIATION SOURCE AND RADIOMETRIC CALIBRATOR USING...

LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURIN...