Tatenuma, K. et al. Quick Acquisition of Clean Ultrahigh Vacuum by Chemical Process Technology. Journal Of Vacuum Science And Technology. part A, vol. 11, No. 4, pp. 1719-1724. Jul. 1993. |
"Analysis Of Trace Moisture In HCI By Gas-Phase FTIR", Keiji Miyazaki et al, Bull. Chem. Soc. Jpn. 66,969-971 (1993), Mar. 1993, vol. 66, No. 3, pp. 969-971. |
"Quick Acquisition Of Clean Ultrahigh Vacuum By Chemical Process Technology", K. Tatenuma et al, J. Vac. Sci. Technol. A 11(4), Jul./Aug. 1993, pp. 1719-1724. |
"Concepts In Competitive Microelectronics Manufacturing", Michael Liehr et al, J. Vac. Sci. Technol. B 12(4), Jul./Aug. 1994, pp. 2727-2740. |
"Determination Of Trace Impurities In Corrosive Gases By Gas-Phase FTIR", Keiji Miyazaki et al, Bull. Chem. Soc. Jpn. 66,3508-3510 (1993), Nov. 1993, vol. 66, No. 11, pp. 3508-3510. |
K. Tatenuma et al, Buneski 223, 393 (1994). |