Claims
- 1. A process for producing an optical recording medium comprising a resin substrate, an inorganic dielectric film formed on the resin substrate, the inorganic film being made of a reacted product of a material gas, and a recording layer containing at least one of a rare earth and a transition metal formed on the inorganic dielectric film, said process comprising steps of:
- i) depositing the inorganic dielectric film on the substrate by:
- a) providing a plasma processing device comprising a plasma chamber, a film forming chamber provided right beneath the plasma chamber, and microwave guide means provided with a microwave introducing portion and a ring waveguide which encircles the plasma chamber, wherein the waveguide has an inner wall and an outer wall between which an empty space is provided, the inner wall having a dividing block on the surface thereof so that microwaves introduced from the microwave introducing portion are divided, and the divided microwaves are propagated in two directions in the empty space to form interference waves in the empty space, and the inner wall having a plurality of slots each of which is provided so as to come in agreement with loops of the interference waves in the empty space;
- b) disposing the resin substrate in the film forming chamber;
- c) evacuating the plasma chamber and the film forming chamber, and then introducing a gas into the plasma chamber and introducing the material gas into the film forming chamber or the plasma chamber;
- d) introducing into the waveguide the microwaves from the microwave introducing portion, forming interference waves in the empty space and then guiding the interference waves into the plasma chamber through the slots and forming a plasma of the gas in the plasma chamber; and
- e) reacting the plasma with the material gas to deposit the inorganic dielectric film on the substrate, wherein a temperature of the substrate during the step e) is not higher than 65.degree. C., and the inorganic dielectric film is a material selected from a group consisting of Si.sub.3 N.sub.4, SiC, SiO, SiO.sub.2, a-Si, AlN, Al.sub.2 O.sub.3, TiO.sub.2, Ta.sub.2 O.sub.5 and ZnS, and
- ii) depositing the recording layer on the inorganic dielectric film.
- 2. The process for producing an optical recording medium according to claim 1, wherein the plurality of the slots are provided at intervals corresponding to 1/2 of a wavelength of the microwaves introduced into the waveguide.
- 3. The process for producing an optical recording medium according to claim 1, wherein the microwave introducing portion is provided such that the microwaves are introduced in a direction of a center of the waveguide.
- 4. The process for producing an optical recording medium according to claim 1, wherein said waveguide is provided with a magnetic field generating means in a vicinity of said slots provided along a periphery of the inner wall thereof.
- 5. The process for producing an optical recording medium according to claim 1, wherein the recording film comprises an amorphous magnetic film.
- 6. The process for producing an optical recording medium according to claim 1, wherein the plasma chamber has a cavity rectangular in cross section.
- 7. The process for producing an optical recording medium according to claim 1, wherein the plasma chamber is cylindrical.
- 8. The process for producing an optical recording medium according to claim 1, further comprising the step of using the plasma processing device to form a second protective film on the recording film.
- 9. A process for producing an optical recording medium comprising a resin substrate, an inorganic dielectric film formed on the resin substrate, the inorganic film being made of a reacted product of a material gas, and a recording layer containing at least one of a rare earth and a transition metal formed on the inorganic dielectric film, said process comprising steps of:
- i) depositing the inorganic dielectric film on the substrate by:
- a) providing a plasma processing device comprising a plasma chamber, a film forming chamber provided right beneath the plasma chamber, and microwave guide means provided with a microwave introducing portion and a ring waveguide which encircles the plasma chamber, wherein the waveguide has an inner wall and an outer wall between which an empty space is provided, the inner wall having a dividing block on the surface thereof so that microwaves introduced from the microwave introducing portion are divided, and the divided microwaves are propagated in two directions in the empty space to form interference waves in the empty space, and the inner wall having a plurality of slots each of which is provided so as to come in agreement with loops of the interference waves in the empty space;
- b) disposing the resin substrate in the film forming chamber;
- c) evacuating the plasma chamber and the film forming chamber, and then introducing a gas into the plasma chamber and introducing the material gas into the film forming chamber or the plasma chamber;
- d) introducing into the waveguide the microwaves from the microwave introducing portion, forming interference waves in the empty space and then guiding the interference waves into the plasma chamber through the slots and forming a plasma of the gas in the plasma chamber; and
- e) reacting the plasma with the material gas to deposit the inorganic dielectric film on the substrate, and
- ii) depositing the recording layer on the inorganic dielectric film.
- 10. A process for producing an optical recording medium comprising a resin substrate, an inorganic dielectric film made of a-Si or SiC formed on the substrate, and a recording layer containing at least one of a rare earth and a transition metal formed on the inorganic dielectric film, comprising steps of:
- i) depositing the inorganic dielectric film on the substrate by:
- a) providing a plasma processing device comprising a plasma chamber and microwave guide means provided with a microwave introducing portion and a ring waveguide which encircles the plasma chamber, wherein the waveguide has an inner wall and an outer wall between which an empty space is provided, the inner wall having a dividing block on the surface thereof so that microwaves introduced from the microwave introducing portion are divided, and the divided microwaves are propagated in two directions of the empty space to form interference waves in the empty space, and the inner wall having a plurality of slots each of which is provided so as to come in agreement with loops of the interference wave in the empty space;
- b) disposing the resin substrate in a film forming chamber;
- c) evacuating the plasma chamber, and then introducing a starting material gas containing a Si atom into the plasma chamber; and
- d) introducing into the waveguide the microwaves from the microwave introducing portion, forming interference waves in the empty space and then guiding the interference waves into the plasma chamber through the slots and forming a plasma of the gas in the plasma chamber, and
- ii) depositing the recording layer on the inorganic dielectric film.
- 11. The process according to claim 10, wherein a temperature of the substrate during the step i) e) is not higher than 65.degree. C.
- 12. The process according to claim 10, wherein the material gas is selected from a group consisting of inorganic silane and organic silane.
- 13. The process according to claim 12, wherein the material gas is the inorganic silane, and the inorganic silane is selected from a group consisting of SiH.sub.4 and SiH.sub.6.
- 14. The process according to claim 12, wherein the material gas is the organic silane, and the organic silane is selected from a group consisting of tetraethylsilane, tetramethylsilane, and dimethylsilane.
- 15. The process according to claim 12, wherein the inorganic silane is halosilane selected from a group consisting of SiF.sub.4, Si.sub.2 F.sub.6, SiHF.sub.3, SiH.sub.2 F.sub.2, SiCl.sub.4, Si.sub.2 Cl.sub.6, SiHCl.sub.3, SiH.sub.2 Cl.sub.2, SiH.sub.3 Cl, and SiCl.sub.2 F.sub.2.
- 16. The process according to claim 10, wherein the inorganic dielectric film is made of a-Si or SiC.
- 17. The process according to claim 1 or 9, wherein the inorganic dielectric film is a reacted product between the material gas and the gas introduced into the plasma chamber.
- 18. The process according to claim 17, wherein the material gas is selected from a group consisting of an inorganic silane and an organic silane, and the gas introduced into the plasma chamber is selected from a group consisting of NH.sub.3, N.sub.2 H.sub.4, hexamethyldisilazane, O.sub.2, O.sub.3, H.sub.2 O, NO, N.sub.2 O and NO.sub.2.
- 19. The process according to claim 17, wherein the material gas is selected from a group consisting of trimethylaluminum, triethylaluminum, triisobutylaluminum, dimethylaluminum hydride, AlCl.sub.3, TiCl.sub.3 and TaCl.sub.5, and the gas introduced into the plasma chamber is selected from a group consisting of NH.sub.3, N.sub.2 H.sub.4, hexamethyldisilazane, O.sub.2, O.sub.3, H.sub.2 O, NO, N.sub.2 O , N.sub.2 and NO.sub.2.
Priority Claims (1)
Number |
Date |
Country |
Kind |
5-126275 |
May 1993 |
JPX |
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Parent Case Info
This application is a continuation of application Ser. No. 08/250,681, filed May 26, 1994, now abandoned.
US Referenced Citations (9)
Foreign Referenced Citations (10)
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Oct 1989 |
EPX |
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Jan 1988 |
JPX |
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Sep 1989 |
JPX |
401222056 |
Sep 1989 |
JPX |
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JPX |
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JPX |
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JPX |
Non-Patent Literature Citations (2)
Entry |
Patent Abtracts of Japan, vol. 15, No. 226 (P-1213) with respect to Japanese Patent Document No. 03-066043 (Jun. 10, 1991). |
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Continuations (1)
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Number |
Date |
Country |
Parent |
250681 |
May 1994 |
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