Claims
- 1. Process for the preparation of ceramic parts including friction surfaces having reduced auto-adhesion under stress and during aging, said process including the steps of:
- (a) pressing ceramic material to form parts having said friction surfaces;
- (b) sintering the ceramic material from step (a);
- (c) polishing said friction surfaces of the sintered material from step (b) with the formation of solid gangue;
- (d) cleaning said friction surfaces to remove said solid gangue resulting from the polishing in step (c);
- (e) roasting the cleaned friction surfaces from step (d) in the presence of oxygen; and
- (f) doping the roasted surfaces of from step (e) with at least one metal oxide to provide said ceramic materials with increased dielectric susceptibility and homogeneity adjacent said friction surfaces.
- 2. Process for the preparation of ceramic parts according to claim 1, wherein the step of doping is carried out by a diffusion process.
- 3. Process for the preparation of ceramic parts according to claim 1 or 2, wherein said at least one metal oxide is selected from the group consisting of manganese oxide and titanium oxide.
- 4. Process for checking the manufacture of ceramic materials according to claim 1 wherein said ceramic material from step (f) has a permittivity .epsilon. defect distribution and dissipatable level of electrostatic power without deterioration thereof, and including the steps of determining the permittivity, defect distribution and dissipatable electrostatic power by measuring the electrostatic potential of the ceramic material using a scanning electron microscope.
- 5. Process for checking the manufacture of ceramic materials according to claim 4, including the steps of charging an area of the ceramic material from step (f) with a relatively high energy beam from said scanning electron microscope to form local electrical fields, applying a relatively low energy beam from said scanning electron microscope onto said charged area, and sensing the deflection of said low energy beam with said scanning electron microscope.
Priority Claims (1)
| Number |
Date |
Country |
Kind |
| 91 03454 |
Mar 1991 |
FRX |
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Parent Case Info
This is a division of application Ser. No. 08/119,139, filed Oct. 25, 1993, now U.S. Pat. No. 5,435,946, issued Jul. 25, 1995.
US Referenced Citations (12)
Foreign Referenced Citations (5)
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Date |
Country |
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Sep 1972 |
DEX |
| 2437821 |
Mar 1975 |
DEX |
| 2834146 |
Feb 1980 |
DEX |
| 61-14174 |
Jan 1986 |
JPX |
| WO8604548 |
Aug 1986 |
WOX |
Non-Patent Literature Citations (1)
| Entry |
| Journal of the American Ceramic Society, vol. 67, No. 21, Feb. 1984, C. J. of McHargue et al.: "Lattice Modification in Ion-Implanted Ceramics", pp. 117-123. |
Divisions (1)
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Number |
Date |
Country |
| Parent |
119139 |
Oct 1993 |
|