Number | Name | Date | Kind |
---|---|---|---|
5012471 | Powell et al. | Apr 1991 | |
5132974 | Rosales | Jul 1992 | |
5291495 | Udell | Mar 1994 | |
5396435 | Geinetti | Mar 1995 | |
5414716 | Bershteyn | May 1995 | |
5524082 | Horstmann et al. | Jun 1996 |
Entry |
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International Test Conference 1991, Paper 14-2, Hierarchical Test Program Development For Scan Testable Circuits, pp. 375-384. |