Functional tests

Industry

CPC
G01R31/2815

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2815Functional tests

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
- Patent number 12,123,912
- Issue date Oct 22, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods and devices for high-speed input/output margin tes...
- Patent number 11,940,483
- Issue date Mar 26, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board and method and device related to the same
- Patent number 11,899,055
- Issue date Feb 13, 2024
- Shanghai AVIC OPTO Electronics Co., Ltd.
- Pengfei Qiu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Differential aging monitor circuits and techniques for assessing ag...
- Patent number 11,821,935
- Issue date Nov 21, 2023
- Infineon Technologies AG
- Dirk Hammerschmidt
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 11,782,085
- Issue date Oct 10, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device architecture coupled to a system-on-chip
- Patent number 11,749,369
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and techniques for assessing aging effects in semiconducto...
- Patent number 11,733,288
- Issue date Aug 22, 2023
- Infineon Technologies AG
- Bernhard Gstoettenbauer
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for circuit failure protection
- Patent number 11,686,757
- Issue date Jun 27, 2023
- Hamilton Sundstrand Corporation
- Kamaraj Thangavelu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 11,675,002
- Issue date Jun 13, 2023
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 11,630,151
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method and computer program product for verifying mem...
- Patent number 11,506,703
- Issue date Nov 22, 2022
- Silicon Motion, Inc.
- Wei-Liang Sung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and/or system for testing devices in non-secured environment
- Patent number 11,480,613
- Issue date Oct 25, 2022
- ARM Limited
- Richard Andrew Paterson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Memory device architecture coupled to a System-on-Chip
- Patent number 11,443,821
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible test systems and methods
- Patent number 11,334,459
- Issue date May 17, 2022
- Advantest Corporation
- Michael Bautista
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and an arrangement for analyzing manufacturing defects of...
- Patent number 11,293,979
- Issue date Apr 5, 2022
- Peter Shun Shen Wang
- G01 - MEASURING TESTING
Information Patent Grant
Power-collapsible boundary scan
- Patent number 11,249,134
- Issue date Feb 15, 2022
- QUALCOMM Incorporated
- Varun Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test access port circuit capable of increasing transmission throughput
- Patent number 11,143,702
- Issue date Oct 12, 2021
- Realtek Semiconductor Corp.
- Yuefeng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Distributed control modules with built-in tests and control-preserv...
- Patent number 11,099,238
- Issue date Aug 24, 2021
- General Electric Company
- Manxue Lu
- G01 - MEASURING TESTING
Information Patent Grant
Electrically testing cleanliness of a panel having an electronic as...
- Patent number 11,102,921
- Issue date Aug 24, 2021
- IEC Electronics Corp.
- Mark Northrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switching FPI between FPI and RPI from received bit sequence
- Patent number 11,085,963
- Issue date Aug 10, 2021
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Electrical component monitoring circuit
- Patent number 11,022,641
- Issue date Jun 1, 2021
- Vulcan Inc.
- Keith John Perez
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for testing motherboard
- Patent number 10,942,213
- Issue date Mar 9, 2021
- DFI Inc.
- Chia-yi Chang
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 10,890,618
- Issue date Jan 12, 2021
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
System and device for automatic signal measurement
- Patent number 10,775,428
- Issue date Sep 15, 2020
- DFI Inc.
- Chia-yi Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for determining whether a circuit is operating...
- Patent number 10,670,648
- Issue date Jun 2, 2020
- Raytheon Company
- Christopher R. Eck
- G01 - MEASURING TESTING
Information Patent Grant
Limited pin test interface with analog test bus
- Patent number 10,571,518
- Issue date Feb 25, 2020
- NXP B.V.
- Tom Waayers
- G01 - MEASURING TESTING
Information Patent Grant
Counterfeit integrated circuit detection by comparing integrated ci...
- Patent number 10,460,326
- Issue date Oct 29, 2019
- Global Circuit Innovations, Inc.
- Erick Merle Spory
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shadow protocol circuit producing enable, address, and address cont...
- Patent number 10,459,028
- Issue date Oct 29, 2019
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan cell selection for partial scan designs
- Patent number 10,372,855
- Issue date Aug 6, 2019
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT BOARD AND MONITORING METHOD THEREFOR
- Publication number 20240310431
- Publication date Sep 19, 2024
- Wiwynn Corporation
- Gong-Bo SONG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20230393195
- Publication date Dec 7, 2023
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20230251309
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTO...
- Publication number 20230168293
- Publication date Jun 1, 2023
- INFINEON TECHNOLOGIES AG
- Bernhard Gstoettenbauer
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL AGING MONITOR CIRCUITS AND TECHNIQUES FOR ASSESSING AG...
- Publication number 20230168294
- Publication date Jun 1, 2023
- INFINEON TECHNOLOGIES AG
- Dirk Hammerschmidt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CIRCUIT FAILURE PROTECTION
- Publication number 20230083816
- Publication date Mar 16, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Kamaraj Thangavelu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP
- Publication number 20230005561
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT BOARD AND METHOD AND DEVICE RELATED TO THE SAME
- Publication number 20220214394
- Publication date Jul 7, 2022
- Shanghai Avic Opto Electronics Co., Ltd.
- Pengfei QIU
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20220011363
- Publication date Jan 13, 2022
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TES...
- Publication number 20210405108
- Publication date Dec 30, 2021
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
Design System For Test Adaptor Card And Method Thereof
- Publication number 20210389368
- Publication date Dec 16, 2021
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Lin Zhang
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20210333325
- Publication date Oct 28, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20210156904
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method for Pins and Vias of Differential Signal Lines
- Publication number 20210148965
- Publication date May 20, 2021
- Inventec (Pudong) Technology Corp.
- Chih-Yun Chang
- G01 - MEASURING TESTING
Information Patent Application
ONLINE TEST DATA RECORD AND OFFLINE DATA CONVERSION ANALYSIS SYSTEM...
- Publication number 20210072305
- Publication date Mar 11, 2021
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yong-Jun SHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed Control Modules with Built-In Tests and Control-Preserv...
- Publication number 20200309852
- Publication date Oct 1, 2020
- GENERAL ELECTRIC COMPANY
- Manxue Lu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY TESTING CLEANLINESS OF A PANEL HAVING AN ELECTRONIC AS...
- Publication number 20200267880
- Publication date Aug 20, 2020
- IEC Electronics Corp.
- Mark Northrup
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD AND COMPUTER PROGRAM PRODUCT FOR VERIFYING MEM...
- Publication number 20200256913
- Publication date Aug 13, 2020
- SILICON MOTION, INC.
- Wei-Liang Sung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART DECISION FEEDBACK DEVICE AND METHOD FOR INSPECTING CIRCUIT BOARD
- Publication number 20200225279
- Publication date Jul 16, 2020
- HONGFUJIN PRECISION ELECTRONICS (TIANJIN) CO.,LTD.
- QIAO-ZHONG ZHAO
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20190391205
- Publication date Dec 26, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING MOTHERBOARD
- Publication number 20190391201
- Publication date Dec 26, 2019
- DFI Inc.
- Chia-yi CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND DEVICE FOR AUTOMATIC SIGNAL MEASUREMENT
- Publication number 20190391202
- Publication date Dec 26, 2019
- DFI Inc.
- Chia-yi CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING WHETHER A CIRCUIT IS OPERATING...
- Publication number 20190154751
- Publication date May 23, 2019
- Raytheon Company
- Christopher R. Eck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING A SCALABILITY CHECK ON A HARDWA...
- Publication number 20190064269
- Publication date Feb 28, 2019
- ARM Limited
- Rakesh SHAJI LAL
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20180328989
- Publication date Nov 15, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20180238961
- Publication date Aug 23, 2018
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
Testing Circuit Board With Self-Detection Function And Self-Detecti...
- Publication number 20180164368
- Publication date Jun 14, 2018
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Ping Song
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD, AND SYSTEM FOR TESTING IC CHIP
- Publication number 20180106859
- Publication date Apr 19, 2018
- INNOTIO INC.
- Jaehoon SONG
- G01 - MEASURING TESTING
Information Patent Application
DUAL GATE ARRAY SUBSTRATE, TESTING METHOD, DISPLAY PANEL AND DISPLA...
- Publication number 20180061291
- Publication date Mar 1, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Xinfeng REN
- G01 - MEASURING TESTING

Functional tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Interface to full and reduced pin JTAG devices

Reconfigurable JTAG architecture for implementation of programmable...

Systems, methods and devices for high-speed input/output margin tes...

Circuit board and method and device related to the same

Differential aging monitor circuits and techniques for assessing ag...

Semiconductor test device and system and test method using the same

Memory device architecture coupled to a system-on-chip

Circuits and techniques for assessing aging effects in semiconducto...

Systems and methods for circuit failure protection

Terahertz plasmonics for testing very large-scale integrated circui...

Interface to full and reduced pin JTAG devices

Apparatus and method and computer program product for verifying mem...

Method and/or system for testing devices in non-secured environment

Memory device architecture coupled to a System-on-Chip

Flexible test systems and methods

Method of and an arrangement for analyzing manufacturing defects of...

Power-collapsible boundary scan

Test access port circuit capable of increasing transmission throughput

Distributed control modules with built-in tests and control-preserv...

Electrically testing cleanliness of a panel having an electronic as...

Switching FPI between FPI and RPI from received bit sequence

Electrical component monitoring circuit

Device and method for testing motherboard

Terahertz plasmonics for testing very large-scale integrated circui...

System and device for automatic signal measurement

Systems and methods for determining whether a circuit is operating...

Limited pin test interface with analog test bus

Counterfeit integrated circuit detection by comparing integrated ci...

Shadow protocol circuit producing enable, address, and address cont...

Scan cell selection for partial scan designs

Patents Applicationslast 30 patents

CIRCUIT BOARD AND MONITORING METHOD THEREFOR

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTO...

DIFFERENTIAL AGING MONITOR CIRCUITS AND TECHNIQUES FOR ASSESSING AG...

SYSTEMS AND METHODS FOR CIRCUIT FAILURE PROTECTION

MEMORY DEVICE ARCHITECTURE COUPLED TO A SYSTEM-ON-CHIP

CIRCUIT BOARD AND METHOD AND DEVICE RELATED TO THE SAME

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

SYSTEMS, METHODS AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TES...

Design System For Test Adaptor Card And Method Thereof

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

Inspection Method for Pins and Vias of Differential Signal Lines

ONLINE TEST DATA RECORD AND OFFLINE DATA CONVERSION ANALYSIS SYSTEM...

Distributed Control Modules with Built-In Tests and Control-Preserv...

ELECTRICALLY TESTING CLEANLINESS OF A PANEL HAVING AN ELECTRONIC AS...

APPARATUS AND METHOD AND COMPUTER PROGRAM PRODUCT FOR VERIFYING MEM...

SMART DECISION FEEDBACK DEVICE AND METHOD FOR INSPECTING CIRCUIT BOARD

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

DEVICE AND METHOD FOR TESTING MOTHERBOARD

SYSTEM AND DEVICE FOR AUTOMATIC SIGNAL MEASUREMENT

SYSTEMS AND METHODS FOR DETERMINING WHETHER A CIRCUIT IS OPERATING...

APPARATUS AND METHOD FOR PERFORMING A SCALABILITY CHECK ON A HARDWA...

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

Testing Circuit Board With Self-Detection Function And Self-Detecti...

APPARATUS, METHOD, AND SYSTEM FOR TESTING IC CHIP

DUAL GATE ARRAY SUBSTRATE, TESTING METHOD, DISPLAY PANEL AND DISPLA...