The present disclosure relates to an ESD or EOS protection of a gate driver on array (GOA) unit, and more particularly relates to a protection circuit of a GOA unit and an array substrate.
Electrical Static Discharge (ESD) is a top killer of existing electronic devices. In a field of display, for the reasons that a display screen of a thin film transistor liquid crystal display (TFT-LCD), for example, has a large area and that an electronic device including TFT-LCD is directly contacted with human bodies and so on, it is easy for TFT-LCD to be influenced by ESD, thereby resulting in display abnormality. Additionally, TFT-LCD is easily influenced by Electrical Over Stress (EOS).
In the field of display, the gate driver on array (GOA) unit is usually integrated at outside of a display panel, and is easier to be influenced by ESD or EOS. Especially, in various ultra-thin (Air) electronic devices, it is easier to cause the GOA unit to be broken down, thereby resulting in the display abnormality of the display panel.
Therefore, it needs to perform ESD or EOS protection for the GOA unit, so as to enhance reliability of the display panel and raise the quality of the electronic devices.
In order to solve the above technical problem, there is provided in the present disclosure a protection circuit of a gate driver on array (GOA) unit, which is connected to a gate line signal output terminal of the GOA unit, wherein the protection circuit comprises: a first voltage gating module, whose input terminal is connected to an output terminal of a first voltage source, configured to output an output voltage of an output terminal of the first voltage source at an output terminal of the first voltage gating module when the gate line signal output terminal should output a valid driving voltage of a gate driving signal; a first protection module, whose input terminal is connected to the output terminal of the first voltage gating module, and output terminal is connected to a gate line; wherein the first protection module outputs the output voltage of the output terminal of the first voltage source as an adjusted gate driving signal in the case that the output voltage of the output terminal of the first voltage source and a current output voltage of the gate line signal output terminal satisfies a first predetermined condition.
According to an embodiment of the present disclosure, the protection circuit further comprises: a second voltage gating module, whose input terminal is connected to an output terminal of a second voltage source, configured to output an output voltage of an output terminal of the second voltage source at an output terminal of the second voltage gating module when the gate line signal output terminal should output an inactive driving voltage of a gate driving signal; a second protection module, whose input terminal is connected to the output terminal of the second voltage gating module, and output terminal is connected to the gate line; wherein the second protection module outputs the output voltage of the output terminal of the second voltage source as an adjusted gate driving signal in the case that the output voltage of the output terminal of the second voltage source and the current output voltage of the gate line signal output terminal satisfies a second predetermined condition.
There is further provided in an embodiment of the present disclosure an array substrate, comprising a protection circuit of the gate driver on array GOA unit as described above.
Other characteristics and advantages of the present disclosure will be described in the subsequent specification, and a part of them are obvious from the specification, or are known through implementation of the present disclosure. Purposes and other advantages of the present disclosure can be implemented and obtained through structures specifically pointed out in the specification, Claims and figures.
Embodiments of the present disclosure will be described in detail by combining with figures. The above and other purposes, characteristics and advantages of the present disclosure would become more evident. Figures are used to provide further understanding of the embodiments of the present disclosure, and constitute a part of the specification, are used to explain the present disclosure together with the embodiments of the present disclosure, and do not form a limitation to the present disclosure. In the figures, same reference marks generally represent same means or steps.
In order to make purposes, technical solutions and advantages of embodiments of the present disclosure more evident, exemplary embodiments of the present disclosure will be described below in detail by referring to figures. Obviously, the exemplary embodiments described below are just a part of embodiments of the present disclosure, but not all the embodiments of the present disclosure. All the other embodiments obtained by those skilled in the art without paying any creative labor shall fall into the protection scope of the present disclosure.
Herein, it should be noted that in the figures, same reference numerals are given to components having the same or similar structures and functions basically, and repeated description relating thereto are omitted.
For example, the array substrate comprises M rows and N columns, the GOA unit has M gate lines, pixels located in a same row in the pixel array are connected to a same gate line, the data driving circuit has N data lines, and pixels in a same column in the pixel array are connected to a same data line. It shall be understood that connection manners of the pixel array, the data driving circuit and the GOA unit in the array substrate are not limited thereto, and the present disclosure is not limited to the connection manners of the pixel array, the data driving circuit and the GOA unit.
As seen from the left of
In the case of a TFT connected to a gate line in the pixel array is an N type TFT, when the gate driving signal is at the low voltage VGL, the TFT is in a turn-off state and would not deliver data signals on the data line to pixels, so that one row of pixels connected to the gate line would not display according to data signals output currently from the data lines; when the gate driving signal is at the high voltage VGH, the TFT is in a turn-on state, the data signals on the data lines can be delivered to the pixels, so that pixels of one row connected to the gate line would display according to the data signals output currently from the data lines.
However, due to influence of electrical static discharge ESD or electrical over stress EOS, it is possible to cause that distortion occurs to waveform of the gate driving signal. Such distortion is possible to not only cause display abnormality of images on a liquid crystal panel or even cause damage of TFT in the pixel circuit on the liquid crystal panel.
In order to avoid the phenomenon of display abnormality or damage of the pixel circuit caused by occurrence of distortion to the waveform of the gate driving signal due to influence of ESD or EOS, a concept of performing the high voltage protection and the low voltage protection of the gate driving signal output by the GOA unit respectively is put forward according to the embodiments of the present disclosure.
As shown in
An input terminal of the first voltage gating module 21 is connected to an output terminal of a first voltage source, and an output terminal thereof is connected to an input terminal of the first protection module 22. The output terminal of the first voltage gating module 21 outputs an output voltage of the output terminal of the first voltage source when the gate line signal output terminal should output a valid driving voltage of a gate driving signal.
Another input terminal of the first protection module 22 is connected to the gate line signal output terminal VG, and an output terminal VGG of the first protection module 22 is connected to a gate line.
The first protection module outputs the output voltage of the output terminal of the first voltage source as the gate driving signal in the case that the output voltage of the output terminal of the first voltage source and a current output voltage of the gate line signal output terminal satisfies a first predetermined condition.
According to a specific circuit design, the valid driving voltage of the gate driving signal may be a high voltage or a low voltage. The influence of the ESD or EOS on the output voltage of the gate line signal output terminal can be reflected as a voltage impact, which would be a positive impact or a negative impact. Description is given below by taking the valid driving voltage of the gate driving signal being the high voltage and an inactive driving voltage of the gate driving signal being the low voltage as an example. The valid driving voltage is capable of making a transistor connected to the gate line turned on, and the inactive driving voltage is incapable of making the transistor connected to the gate line turned on.
Due to influence of ESD or EOS, impact is possible to occur to the valid driving voltage of the gate driving signal. In the case that amplitude of such impact is very high, the TFT in the pixel circuit that receives the gate driving signal is possible to be broken down directly, and thus such impact needs to be suppressed.
According to the embodiment of the present disclosure, the output terminal of the first voltage source comprises a first output terminal, whose output voltage is a first power supply high voltage VDD1. The input terminal of the first voltage gating module comprises a first input terminal, and the output terminal thereof comprises a first output terminal. The input terminal of the first protection module comprises a first input terminal and a third input terminal, the first input terminal of the first protection module is connected to the first output terminal of the first voltage gating module, and the third input terminal of the first protection module is connected to the gate line signal output terminal.
Specifically, when the gate line signal output terminal should output the high voltage VGH of the gate driving signal, the first output terminal of the first voltage gating module 21 outputs the first power supply high voltage VDD1. In the case of normal operation, VDD1>VGH, and in the case that the current output voltage VG of the gate line signal output terminal is higher than the first power supply high voltage VDD1, the first protection module 22 pulls down the current output voltage VG of the gate line signal output terminal to the first power supply high voltage VDD1, and the output terminal of the first protection module 22 outputs the first power supply high voltage VDD1 as an adjusted gate driving signal VGG
It shall be understood that due to the influence of ESD or EOS, not only positive impact but also negative impact is possible to occur to a valid level (high level) of the gate driving signal. Therefore, it needs to suppress not only positive impact but also negative impact.
As shown in
Specifically, when the gate line signal output terminal should output the low voltage of the gate driving signal, the second output terminal of the first voltage gating module 21 outputs the first power supply low voltage VSS1, and in the case that the current output voltage of the gate line signal output terminal is lower than the first power supply low voltage VSS1, the first protection module 22 pulls up the current output voltage of the gate line signal output terminal to the first power supply low voltage VSS1, and the output terminal of the first protection module 22 outputs the first power supply low voltage VSS1 as an adjusted gate driving signal.
The first power supply high voltage VDD1, the normal high voltage VGH of the gate driving signal, and the first power supply low voltage VSS1 should satisfy the following relationship: VDD1>VGH>VSS1.
As shown in
The first protection element S1 can absorbs ESD or EOS energy or releases the ESD or EOS energy to other loops when ESD or EOS occurs. For example, the first protection element S1 may be a diode which is switched on or off rapidly, a voltage-sensitive resistor, or a high molecular polymer, or may be an ESD/EOS protection circuit composed of a variety of semiconductor elements or other elements.
When the high voltage VGH of the gate driving signal VG exceeds the high voltage VDD1 of the first voltage source due to the influence of ESD or EOS, the first protection element S1 is turned on to absorb ESD or EOS energy or release the ESD or EOS energy to the first voltage source; in particular, the ESD or EOS energy is released to the first output terminal of the first voltage source via the first voltage gating module 21, so that the output terminal of the first protection module 22 is made to output the high voltage VDD1 of the first output terminal of the first voltage source as the adjusted gate driving signal VGG, that is, making the high voltage VGH of the adjusted gate driving signal VGG as the high voltage VDD1 of the first output terminal of the first voltage source.
In addition, as shown in
When the high voltage VGH of the gate driving signal VG is lower than the low voltage VSS1 of the second output terminal of the first voltage source due to the influence of ESD or EOS, the second protection element S2 is turned on to absorb ESD or EOS energy or release the ESD or EOS energy to the first voltage source; in particular, the ESD or EOS energy is released to the second output terminal of the first voltage source via the first voltage gating module 21, so that the output terminal of the first protection module 22 is made to output the low voltage VSS1 of the second output terminal of the first voltage source as the adjusted gate driving signal VGG, that is, making the high voltage VGH of the adjusted gate driving signal VGG as the low voltage VSS1 of the first output terminal of the first voltage source. For example, the first power supply low voltage VSS1 can be for example a common ground voltage VGND.
In addition, according to the requirement, the first protection module 22 can further comprise a first capacitor C1, which is connected between the gate line signal output terminal and the second output terminal of the first voltage gating module 21.
As shown in
An anode and a cathode of the first diode D1 are connected to the output terminal of the first protection module 22 and the first output terminal V1 (i.e., VDD1) of the first voltage gating module 21 respectively, and an anode and a cathode of the second diode D2 are connected to the second output terminal V2 (i.e., VSS1) of the first voltage gating module 21 and the output terminal of the first protection module 22 respectively.
On one hand, when the high voltage VGH of the gate driving signal VG exceeds the high voltage VDD1 of the first voltage source due to the influence of ESD or EOS, the first diode D1 is turned on, and the ESD or EOS energy is released to the first output terminal of the first voltage source via the first voltage gating module 21, so that the output terminal of the first protection module 22 is made to output the high voltage VDD1 of the first output terminal of the first voltage source as the adjusted gate driving signal VGG, that is, making the high voltage VGH of the adjusted gate driving signal VGG as the first power supply high voltage VDD1.
On the other hand, when the high voltage VGH of the gate driving signal VG is lower than the low voltage VSS1 of the first voltage source due to the influence of ESD or EOS, the second diode D2 is turned on, and the ESD or EOS energy is released to the second output terminal of the first voltage source via the first voltage gating module 21, so that the output terminal of the first protection module 22 is made to output the low voltage VSS1 of the second output terminal of the first voltage source as the adjusted gate driving signal VGG, that is, making the high voltage VGH of the adjusted gate driving signal VGG as the first power supply low voltage VSS1.
Thus, the high voltage VGH of the gate driving signal VG can be clamped within a certain voltage range, in particular, within a range from VSS1 to VDD1 by means of the first voltage gating module 21 and the first protection module 22, so that damage caused by ESD or EOS on the TFT in the pixel circuit can be avoided. Further, by selecting amplitudes of VSS and VDD1 appropriately, for example, VDD1 is slightly higher than a normal VGH and VSS is slightly lower than the normal VGH, in particular, for example, VDD is 0.5V higher than the normal VGH and VSS is 0.5V lower than the normal VGH, it can be made that the high voltage VGH of the adjusted gate driving signal VGG is within a predetermined high voltage range, so that the pixel circuit is capable of reading the data signals on the data lines normally, so as to be capable of displaying normally, which avoids the display abnormality caused by distortion of the gate driving signal VG due to ESD or EOS.
As shown in
As described above, the input terminal of the first voltage gating module 21 is connected to the output terminal of the first voltage source, and the output terminal thereof is connected to the input terminal of the first protection module 22. When the gate line signal output terminal should output the valid driving voltage (for example, high voltage) of the gate driving signal, the output terminal of the first voltage gating module 21 outputs the output voltage of the output terminal of the first voltage source. Another input terminal of the first protection module 22 is connected to the gate line signal output terminal, and the output terminal of the first protection module 22 is connected to a gate line.
An input terminal of the second voltage gating module 23 is connected to an output terminal of a second voltage source, and an output terminal thereof is connected to an input terminal of the second protection module 24. When the gate line signal output terminal should output the inactive driving voltage (for example, low voltage) of the gate driving signal, the output terminal of the second voltage gating module 23 outputs an output voltage of the output terminal of the second voltage source. Another input terminal of the second protection module 24 is connected to the gate line signal output terminal.
The first protection module 22 and the second protection module 24 share a part of circuit. Another input terminal of the first protection module 22 and another input terminal of the second protection module 24 are the same input terminal, which is connected to the gate line signal output terminal. One terminal of the shared circuit is the same input terminal, and the other terminal thereof is connected to the gate line.
Specifically, the second protection module 24 outputs the output voltage of the output terminal of the second voltage source as the adjusted gate driving signal in the case that the output voltage of the output terminal of the second voltage source and the current output voltage of the gate line signal output terminal satisfy a second predetermined condition.
Due to the influence of ESD or EOS, impact is possible to occur to the inactive driving voltage (low voltage) of the gate driving signal. In the case that the amplitude of such impact is very high, the TFT in the pixel circuit that receives the gate driving signal is possible to be broken down directly, and thus such impact needs to be suppressed.
According to the embodiment of the present disclosure, the output terminal of the second voltage source comprises a first output terminal, whose output voltage is a second power supply high voltage. The input terminal of the second voltage gating module comprises a first input terminal, and the output terminal thereof comprises a first output terminal. The input terminal of the second protection module comprises a first input terminal and a third input terminal, the first input terminal of the second protection module is connected to the first output terminal of the second voltage gating module, and the third input terminal of the second protection module is connected to the gate line signal output terminal. Herein, the third input terminal of the first protection module and the third input terminal of the second protection module are a same shared input terminal.
Specifically, when the gate line signal output terminal should output the low voltage VGL of the gate driving signal, the first output terminal of the second voltage gating module 23 outputs the second power supply high voltage VDD2. In the case of normal operation, VDD2>VGL, and in the case that the current output voltage VG of the gate line signal output terminal is higher than the second power supply high voltage VDD2, the second protection module 24 pulls down the current output voltage VG of the gate line signal output terminal to the second power supply high voltage VDD2, and the output terminal of the second protection module 24 outputs the second power supply high voltage VDD2 as an adjusted gate driving signal VGG.
It shall be understood that due to the influence of ESD or EOS, not only positive impact but also negative impact is possible to occur to the inactive driving voltage (low voltage) of the gate driving signal. Therefore, it needs to suppress not only positive impact but also negative impact.
As shown in
The input terminal of the second voltage gating module 23 further comprises a second input terminal, which is connected to the second output terminal of the second voltage source. Except for the first output terminal V3, the output terminal of the second voltage gating module 23 further comprises a second output terminal V4, the input terminal of the second protection module 24 further comprises a second input terminal, which is connected to the second output terminal V4 of the second voltage gating module 23.
In particular, when the gate line signal output terminal should output the low level of the gate driving signal, the second output terminal V4 of the second voltage gating module 23 outputs the second power supply low voltage VSS2, and in the case that the current output voltage of the gate line signal output terminal is lower than the second power supply low voltage VSS2, the second protection module 24 pulls up the current output voltage of the gate line signal output terminal to the second power supply low voltage VSS2, and the output terminal of the second protection module 24 outputs the second power supply low voltage VSS2 as the adjusted gate driving signal.
The second power supply high voltage VDD2, the low voltage VGL of the gate driving signal, and the second power supply low voltage VSS2 shall satisfy the following relationship: VDD2>VGL>VSS2.
According to the requirement, the first power supply low voltage VSS1 can be higher than the second power supply high voltage VDD2, or the first power supply low voltage VSS1 can be the same as the second power supply high voltage VDD2. Therefore, the first power supply high voltage VDD1, the high voltage VGH of the gate driving signal, the first power supply low voltage VSS1, the second power supply high voltage VDD2, the low voltage VGL of the gate driving signal, and the second power supply low voltage VSS2 shall satisfy the following relationship: VDD1>VGH>VSS1≧VDD2>VGL>VSS2.
In the case of VGL being smaller than zero, optionally, VSS1 and VDD2 can be a common ground voltage GND.
As shown in
The first resistor R1 is connected between the gate line signal output terminal and the output terminal of the second protection module 24, and output terminals of the first protection module 22 and the second protection module 24 are a same output terminal. The third protection element S3 is connected between the output terminal of the second protection module 24 and the first output terminal of the second voltage gating module 23.
When the low voltage VGL of the gate driving signal VG exceeds the high voltage VDD2 of the second voltage source due to the influence of ESD or EOS, the third protection element S3 is turned on to absorb ESD or EOS energy or release the ESS or EOS energy to the second voltage source, in particular, the ESD or EOS energy is released to the first output terminal of the second voltage source via the second voltage gating module 23, so that the output terminal of the second protection module 24 is made to output the high voltage VDD2 of the first output terminal of the second voltage source as the adjusted gate driving signal VGG, that is, making the low voltage VGL of the adjusted gate driving signal VGG as the second power supply high voltage VDD2.
Additionally, as shown in
Additionally, as shown in
When the low voltage VGL of the gate driving signal VG is lower than the low voltage VSS2 of the second voltage source due to the influence of ESD or EOS, the fourth protection element S4 is turned on to absorb ESD or EOS energy or release the ESD or EOS energy to the first voltages source, in particular, the ESD or EOS energy is released to the second output terminal of the first voltage source via the second voltage gating module 23, so that the output terminal of the second protection module 24 outputs the low voltage VSS2 of the second output terminal of the second voltage source as the adjusted gate diving signal VGG, that is, making the low voltage VGL of the adjusted gate driving signal VGG as the second power supply low voltage VSS2.
The third protection element S3 and the fourth protection element S4 can absorb ESD or EOS energy when ESD or EOS occurs or release the ESD or EOS energy to other loops. For example, the third protection element S3 and the fourth protection element S4 may be a diode which is switched on or off rapidly, a voltage-sensitive resistor, or a high molecular polymer, or may be an ESD/EOS protection circuit composed of a variety of semiconductor elements or other elements.
As shown in
An anode and a cathode of the third diode D3 are connected to the output terminal of the second protection module 24 and the first output terminal of the second voltage gating module 23 respectively, and an anode and a cathode of the fourth diode D4 are connected to the second output terminal of the second voltage gating module 23 and the output terminal of the second protection module 24 respectively.
On one hand, when the low voltage VGL of the gate driving signal VG exceeds the high voltage VDD2 of the second voltage source due to the influence of ESD or EOS, the third diode D3 is turned on, and the ESD or EOS energy is releases to the first output terminal of the second voltage source via the second voltage gating module 23, so that the output terminal of the second protection module 24 is made to output the high voltage VDD2 of the first output terminal of the second voltage source as the adjusted gate driving signal VGG, that is, making the high voltage VGH of the adjusted gate driving signal VGG as the second power supply high voltage VDD2.
On the other hand, when the low voltage VGL of the gate driving signal VG is lower than the low voltage VSS2 of the second voltage source due to influence of ESD or EOS, the fourth diode D4 is turned on, and the ESD or EOS energy is released to the second output terminal of the second voltage source via the second voltage gating module 23, so that the output terminal of the second protection module 24 is made to output the low voltage VSS2 of the second output terminal of the second voltage source as the adjusted gate driving signal VGG, that is, making the low voltage VGL of the adjusted gate driving signal VGG as the second power supply low voltage VSS2.
Thus, the low voltage VGL of the gate driving signal VG can be clamped within a certain voltage range, in particular, within a range from VSS2 to VDD2, by the second voltage gating module 23 and the second protection module 24, so that damage caused by ESD or EOS on the TFT in the pixel circuit can be avoided. Further, by selecting the amplitudes of VSS2 and VDD2 appropriately, for example, VDD2 is slightly higher than VGL and VSS2 is slightly lower than VGL, in particular, for example, VDD2 is 0.5V higher than the VGL and VSS2 is 0.5V lower than the VGL, it can be made that the low voltage VGL of the adjusted gate driving signal VGG is within a predetermined high voltage range, so that the pixel circuit is capable of reading the data signals on the data lines normally, so as to be capable of displaying normally, which avoids the display abnormality caused by distortion of the gate driving signal VG due to influence of ESD or EOS.
When the gate line signal output terminal should output the high voltage VGH of the gate driving signal, the first voltage gating module 21 applies the first power supply high voltage VDD1 of the first voltage source to the input terminal V1 as shown in
*When the gate line signal output terminal should output the low voltage VGL of the gate driving signal terminal, the second voltage gating module 23 applies the second power supply high voltage VDD2 of the second voltage source to the input terminal V3 as shown in
As shown in
As shown in
The first switch SW1, the second switch SW2, the third switch SW3, and the fourth switch SW4 can be implemented by TFT, and all of them may be N type TFTs or may be P type TFTs.
In the case of the first switch SW1, the second switch SW2, the third switch SW3, and the fourth switch SW4 being N type TFTs or P type TFTs, signals of the first control terminal Con1 and the second control terminal Con2 have opposite phases. When the first control terminal Con1 is at high level, the second control terminal Con2 is at low level; and when the first control terminal Con1 is at low level, the second control terminal Con1 is at high level.
In the case of the first switch SW1 and the second switch SW2 being N type TFTs and the third switch SW3 and the fourth switch SW4 being P type TFTs, or in the case of the first switch SW1 and the second switch SW2 being P type TFTs and the third switch SW3 and the fourth switch SW4 being N type TFTs, the first control terminal Con1 and the second control terminal Con2 can be a same control terminal.
As shown in
The input module receives a gate driving signal output by a previous stage (i.e., (n−1)-th stage) of shift register, and the reset module receives a gate driving signal output by a next stage (i.e., (n+1)-th stage) of shift register. When the output control node of driving signal is a valid level (for example, high level), an output module of the shift register outputs a valid level (for example, high level) of the gate driving signal.
As an example, in the case of the first switch SW1, the second switch SW2, the third switch SW3, and the fourth switch SW4 being the same type of TFTs, the first control terminal Con1 can be connected to the output control node CON of driving signal, the output control node CON of driving signal can be connected to an input terminal of an inverter, the inverter inverts the signal input from the output control node CON of driving signal and output it, and the second control terminal Con2 is connected to the output terminal of the inverter.
Alternatively, the protection circuit according to the embodiment of the present disclosure can further comprise a control module.
The control module can comprise an input module, a reset module, and an inverter. The input module receives a gate driving signal output by a previous stage (i.e., (n−1)-th stage) of shift register, and the reset module receives a gate driving signal output by a next stage (i.e., (n+1)-th stage) of shift register. The input module and the reset module can be the same as the input module and the reset module as shown in
As an example, the output control node CON of driving signal is at a high level, the gate line signal output terminal outputs the high level of the gate driving signal, and the first control terminal Con1 is at the high level.
In particular, for example, the first switch SW1 and the second switch SW2 are N type TFTs, the third switch SW3 and the fourth switch SW4 are also N type TFTs, signals of the first control terminal Con1 and the second control terminal Con2 are opposite, the second control terminal Con2 is at a low level when the first control terminal Con1 is at the high level, the first switch SW1 and the second switch SW2 are turned on, and the third switch SW3 and the fourth switch SW4 are turned off.
In particular, for another example, the first switch SW1 and the second switch SW2 are N type TFTs, the third switch SW3 and the fourth switch SW4 are P type TFTs, and the first control terminal Con1 and the second control terminal Con2 are the same control terminal. In this circumstance, the inverter as shown in
The embodiment of the present disclosure is described by taking the high voltage of the gate driving signal being the valid driving voltage as an example. However, it shall be understood that the present disclosure is not limited thereto, and the valid driving voltage of the gate driving signal can be a low voltage.
According to the embodiment of the present disclosure, by performing the high voltage and the low voltage protection of the gate driving signal output by the GOA unit respectively, it can be made that the high level of the gate driving signal is within a predetermined high level range and that the low level of the gate driving signal is within a predetermined low level range, such that it not only can avoid from causing TFTs in the pixel circuit to be damaged due to voltage impact produced by EDS or EOS on the gate driving signal, but also can eliminate disadvantageous effect of display abnormality of the display panel caused by distortion of the gate driving signal due to EDS or EOS.
There is further provided in an embodiment of the present disclosure an array substrate, comprising a protection circuit of the gate driver on array GOA unit as described above.
Respective embodiments of the present disclosure are described in detail. However, those skilled in the art shall understand that various amendments, combinations or sub-combination can be made to these embodiments without departing from the principle and spirit of the present disclosure, and such amendments shall fall into the scope of the present disclosure.
The present application claims the priority of a Chinese patent application No. 201520692483.6 filed on Sep. 8, 2015, with disclosure title of “PROTECTION CIRCUIT FOR GATE DRIVER ON ARRAY UNIT, AND ARRAY SUBSTRATE”. Herein, the content disclosed by the Chinese patent application is incorporated in full by reference.
Number | Date | Country | Kind |
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201520692483.6 | Sep 2015 | CN | national |
Filing Document | Filing Date | Country | Kind |
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PCT/CN2016/075339 | 3/2/2016 | WO | 00 |